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151 Publications
1998 | Journal Article | LibreCat-ID: 13064
Hellebrand, S., Hertwig, A., & Wunderlich, H.-J. (1998). Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications. IEEE Design and Test, 15(4), 36–41.
LibreCat
1998 | Conference Paper | LibreCat-ID: 13007
Hertwig, A., Hellebrand, S., & Wunderlich, H.-J. (1998). Fast Self-Recovering Controllers. 16th IEEE VLSI Test Symposium (VTS’98), 296–302. https://doi.org/10.1109/vtest.1998.670883
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| DOI
1998 | Conference Paper | LibreCat-ID: 13008
Hellebrand, S., Wunderlich, H.-J., & N. Yarmolik, V. (1998). Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs. Design Automation and Test in Europe (DATE’98), 173–179. https://doi.org/10.1109/date.1998.655853
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| DOI
1998 | Conference Paper | LibreCat-ID: 13063
N. Yarmolik, V., V. Klimets, Y., Hellebrand, S., & Wunderlich, H.-J. (1998). New Transparent RAM BIST Based on Self-Adjusting Output Data Compression. Design & Diagnostics of Electronic Circuits & Systems (DDECS’98), 27–33.
LibreCat
1997 | Misc | LibreCat-ID: 13089
Tsai, K.-H., Hellebrand, S., Rajski, J., & Marek-Sadowska, M. (1997). STARBIST: Scan Autocorrelated Random Pattern Generation. 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA.
LibreCat
1997 | Misc | LibreCat-ID: 13090
Hertwig, A., Hellebrand, S., & Wunderlich, H.-J. (1997). Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications. 3rd IEEE International On-Line Testing Workshop, Crete, Greece.
LibreCat
1997 | Conference Paper | LibreCat-ID: 13009
Tsai, K.-H., Hellebrand, S., Marek-Sadowska, M., & Rajski, J. (1997). STARBIST: Scan Autocorrelated Random Pattern Generation. 34th ACM/IEEE Design Automation Conference (DAC’97). https://doi.org/10.1109/dac.1997.597194
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1996 | Misc | LibreCat-ID: 13087
Hellebrand, S., & Wunderlich, H.-J. (1996). Using Embedded Processors for BIST. 3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA.
LibreCat
1996 | Misc | LibreCat-ID: 13088
Hellebrand, S., Wunderlich, H.-J., & Hertwig, A. (1996). Mixed-Mode BIST Using Embedded Processors. 2nd IEEE International On-Line Testing Workshop. Biarritz, France.
LibreCat
1996 | Conference Paper | LibreCat-ID: 13010
Hellebrand, S., Wunderlich, H.-J., & Hertwig, A. (1996). Mixed-Mode BIST Using Embedded Processors. IEEE International Test Conference (ITC’96), 195–204. https://doi.org/10.1109/test.1996.556962
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| DOI
1995 | Report | LibreCat-ID: 13026
Hellebrand, S., & Wunderlich, H.-J. (1995). Synthesis Procedures for Self-Testable Controllers. University of Siegen, Germany.
LibreCat
1995 | Report | LibreCat-ID: 13027
Hellebrand, S., Wunderlich, H.-J., Goncalves, F., & Paulo Teixeira, J. (1995). Evaluation of Self-Testable Controller Architectures Based on Realistic Fault Analysis. University Siegen, Germany.
LibreCat
1995 | Report | LibreCat-ID: 13028
Hellebrand, S., Herzog, M., & Wunderlich, H.-J. (1995). Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing. University of Siegen, Germany.
LibreCat
1995 | Misc | LibreCat-ID: 13086
Hellebrand, S., Reeb, B., Tarnick, S., & Wunderlich, H.-J. (1995). Pattern Generation for a Deterministic BIST Scheme. 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA.
LibreCat
1995 | Journal Article | LibreCat-ID: 13011
Hellebrand, S., Rajski, J., Tarnick, S., Venkataraman, S., & Courtois, B. (1995). Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE Transactions on Computers, 44(2), 223–233. https://doi.org/10.1109/12.364534
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| DOI
1995 | Conference Paper | LibreCat-ID: 13012
Hellebrand, S., Reeb, B., Tarnick, S., & Wunderlich, H.-J. (1995). Pattern Generation for a Deterministic BIST Scheme. ACM/IEEE International Conference on Computer Aided Design (ICCAD’95), 88–94. https://doi.org/10.1109/iccad.1995.479997
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| DOI
1994 | Report | LibreCat-ID: 13024
Hellebrand, S., Juergensen, A., & Wunderlich, H.-J. (1994). Synthesis for Off-line Testability. University of Siegen, Germany.
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1994 | Report | LibreCat-ID: 13025
Hellebrand, S., Juergensen, A., Stroele, A., & Wunderlich, H.-J. (1994). Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time. University of Siegen, Germany.
LibreCat
1994 | Misc | LibreCat-ID: 13083
Venkataraman, S., Rajski, J., Hellebrand, S., & Tarnick, S. (1994). Effiziente Testsatzkodierung für Prüfpfad-basierte Selbsttestarchitekturen. 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands.
LibreCat
1994 | Misc | LibreCat-ID: 13084
Hellebrand, S., & Wunderlich, H.-J. (1994). Ein Verfahren zur testfreundlichen Steuerwerkssynthese. 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands.
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