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151 Publications
2018 | Conference Paper | LibreCat-ID: 4575
Sprenger A, Hellebrand S. Tuning Stochastic Space Compaction to Faster-than-at-Speed Test. In: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS). IEEE; 2018. doi:10.1109/ddecs.2018.00020
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2018 | Conference Paper | LibreCat-ID: 10575
Liu C, Schneider E, Kampmann M, Hellebrand S, Wunderlich H-J. Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. In: 27th IEEE Asian Test Symposium (ATS’18). ; 2018. doi:10.1109/ats.2018.00028
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2017 | Conference Paper | LibreCat-ID: 12973
Deshmukh J, Kunz W, Wunderlich H-J, Hellebrand S. Special Session on Early Life Failures. In: 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE; 2017. doi:10.1109/vts.2017.7928933
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2017 | Misc | LibreCat-ID: 13078
Kampmann M, Hellebrand S. X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz.; 2017.
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2017 | Conference Paper | LibreCat-ID: 10576
Kampmann M, Hellebrand S. Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test. In: 20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17). IEEE; 2017. doi:10.1109/ddecs.2017.7934564
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2016 | Conference Paper | LibreCat-ID: 12975
Kampmann M, Hellebrand S. X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. In: 25th IEEE Asian Test Symposium (ATS’16). Hiroshima, Japan: IEEE; 2016:1-6. doi:10.1109/ats.2016.20
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2015 | Conference Paper | LibreCat-ID: 12976
Kampmann M, A. Kochte M, Schneider E, Indlekofer T, Hellebrand S, Wunderlich H-J. Optimized Selection of Frequencies for Faster-Than-at-Speed Test. In: 24th IEEE Asian Test Symposium (ATS’15). Mumbai, India: IEEE; 2015:109-114. doi:10.1109/ats.2015.26
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2015 | Journal Article | LibreCat-ID: 13056
Huang Z, Liang H, Hellebrand S. A High Performance SEU Tolerant Latch. Journal of Electronic Testing - Theory and Applications (JETTA). 2015;31(4):349-359.
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2015 | Misc | LibreCat-ID: 13077
Hellebrand S, Indlekofer T, Kampmann M, Kochte M, Liu C, Wunderlich H-J. Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany; 2015.
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2014 | Conference Paper | LibreCat-ID: 12977
Hellebrand S, Indlekofer T, Kampmann M, A. Kochte M, Liu C, Wunderlich H-J. FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects. In: IEEE International Test Conference (ITC’14). Seattle, Washington, USA: IEEE; 2014. doi:10.1109/test.2014.7035360
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2014 | Journal Article | LibreCat-ID: 13054
Hellebrand S, Wunderlich H-J. SAT-Based ATPG beyond Stuck-at Fault Testing. DeGruyter Journal on Information Technology (it). 2014;56(4):165-172.
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2014 | Journal Article | LibreCat-ID: 13055
Rodriguez Gomez L, Cook A, Indlekofer T, Hellebrand S, Wunderlich H-J. Adaptive Bayesian Diagnosis of Intermittent Faults. Journal of Electronic Testing - Theory and Applications (JETTA). 2014;30(5):527-540.
LibreCat
2013 | Conference Paper | LibreCat-ID: 12979
Hellebrand S. Analyzing and Quantifying Fault Tolerance Properties. In: 14th IEEE Latin American Test Workshop - (LATW’13). Cordoba, Argentina: IEEE; 2013. doi:10.1109/latw.2013.6562662
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2013 | Misc | LibreCat-ID: 13075
Cook A, Rodriguez Gomez L, Hellebrand S, Indlekofer T, Wunderlich H-J. Adaptive Test and Diagnosis of Intermittent Faults. 14th Latin American Test Workshop, Cordoba, Argentina; 2013.
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2012 | Conference Paper | LibreCat-ID: 12980
Cook A, Hellebrand S, E. Imhof M, Mumtaz A, Wunderlich H-J. Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test. In: 13th IEEE Latin American Test Workshop (LATW’12). Quito, Ecuador: IEEE; 2012:1-4. doi:10.1109/latw.2012.6261229
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2012 | Conference Paper | LibreCat-ID: 12981
Cook A, Hellebrand S, Wunderlich H-J. Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test. In: 17th IEEE European Test Symposium (ETS’12). Annecy, France: IEEE; 2012:1-6. doi:10.1109/ets.2012.6233025
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2012 | Misc | LibreCat-ID: 13074
Cook A, Hellebrand S, Wunderlich H-J. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany; 2012.
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2011 | Conference Paper | LibreCat-ID: 12982
Cook A, Hellebrand S, Indlekofer T, Wunderlich H-J. Diagnostic Test of Robust Circuits. In: 20th IEEE Asian Test Symposium (ATS’11). New Delhi, India: IEEE; 2011:285-290. doi:10.1109/ats.2011.55
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2011 | Conference Paper | LibreCat-ID: 12984
Polian I, Becker B, Hellebrand S, Wunderlich H-J, Maxwell P. Towards Variation-Aware Test Methods. In: 16th IEEE European Test Symposium Trondheim (ETS’11). Trondheim, Norway: IEEE; 2011. doi:10.1109/ets.2011.51
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2011 | Conference Paper | LibreCat-ID: 13053
Cook A, Hellebrand S, Indlekofer T, Wunderlich H-J. Robuster Selbsttest mit Diagnose. In: 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf.” Hamburg, Germany; 2011:48-53.
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