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165 Publications
2019 | Conference Paper | LibreCat-ID: 12918
Maaz, M. U., Sprenger, A., & Hellebrand, S. (2019). A Hybrid Space Compactor for Adaptive X-Handling. 50th IEEE International Test Conference (ITC), 1–8.
LibreCat
2018 | Misc | LibreCat-ID: 4576
Sprenger, A., & Hellebrand, S. (2018). Stochastische Kompaktierung für den Hochgeschwindigkeitstest. Freiburg, Germany: 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18).
LibreCat
2018 | Journal Article | LibreCat-ID: 12974
Hellebrand, S., Henkel, J., Raghunathan, A., & Wunderlich, H.-J. (2018). Guest Editors’ Introduction - Special Issue on Approximate Computing. IEEE Embedded Systems Letters, 10(1), 1–1. https://doi.org/10.1109/les.2018.2789942
LibreCat
| DOI
2018 | Journal Article | LibreCat-ID: 13057
Kampmann, M., & Hellebrand, S. (2018). Design For Small Delay Test - A Simulation Study. Microelectronics Reliability, 80, 124–133.
LibreCat
2018 | Misc | LibreCat-ID: 13072
Kampmann, M., & Hellebrand, S. (2018). Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test. 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China.
LibreCat
2018 | Conference Paper | LibreCat-ID: 29460
Rezaeizadeh Rookerd, R., Sadeghi-Kohan, S., & Navabi, Z. (2018). Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture. Proceedings of the 2018 on Great Lakes Symposium on VLSI. https://doi.org/10.1145/3194554.3194599
LibreCat
| DOI
2018 | Conference Paper | LibreCat-ID: 4575
Sprenger, A., & Hellebrand, S. (2018). Tuning Stochastic Space Compaction to Faster-than-at-Speed Test. 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS). https://doi.org/10.1109/ddecs.2018.00020
LibreCat
| DOI
2018 | Conference Paper | LibreCat-ID: 10575
Liu, C., Schneider, E., Kampmann, M., Hellebrand, S., & Wunderlich, H.-J. (2018). Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. 27th IEEE Asian Test Symposium (ATS’18). https://doi.org/10.1109/ats.2018.00028
LibreCat
| DOI
2018 | Conference Paper | LibreCat-ID: 29459
Sadeghi-Kohan, S., Vafaei, A., & Navabi, Z. (2018). Near-Optimal Node Selection Procedure for Aging Monitor Placement. 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS). https://doi.org/10.1109/iolts.2018.8474120
LibreCat
| DOI
2017 | Conference Paper | LibreCat-ID: 12973
Deshmukh, J., Kunz, W., Wunderlich, H.-J., & Hellebrand, S. (2017). Special Session on Early Life Failures. In 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE. https://doi.org/10.1109/vts.2017.7928933
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