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165 Publications
2014 | Conference Paper | LibreCat-ID: 12977
Hellebrand, Sybille, et al. “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects.” IEEE International Test Conference (ITC’14), IEEE, 2014, doi:10.1109/test.2014.7035360.
LibreCat
| DOI
2014 | Journal Article | LibreCat-ID: 13054
Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond Stuck-at Fault Testing.” DeGruyter Journal on Information Technology (It), vol. 56, no. 4, DeGruyter, 2014, pp. 165–72.
LibreCat
2014 | Journal Article | LibreCat-ID: 13055
Rodriguez Gomez, Laura, et al. “Adaptive Bayesian Diagnosis of Intermittent Faults.” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 30, no. 5, Springer, 2014, pp. 527–40.
LibreCat
2014 | Journal Article | LibreCat-ID: 46266
Alizadeh, Bijan, et al. “A Scalable Formal Debugging Approach with Auto-Correction Capability Based on Static Slicing and Dynamic Ranking for RTL Datapath Designs.” IEEE Transactions on Computers, Institute of Electrical and Electronics Engineers (IEEE), 2014, pp. 1–1, doi:10.1109/tc.2014.2329687.
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| DOI
2014 | Conference Paper | LibreCat-ID: 46268
Mohammadi, Marzieh, et al. “An Off-Line MDSI Interconnect BIST Incorporated in BS 1149.1.” 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014, doi:10.1109/ets.2014.6847847.
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2014 | Conference Paper | LibreCat-ID: 46267
Sadeghi-Kohan, Somayeh, et al. “Improving Polynomial Datapath Debugging with HEDs.” 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014, doi:10.1109/ets.2014.6847797.
LibreCat
| DOI
2013 | Conference Paper | LibreCat-ID: 12979
Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.” 14th IEEE Latin American Test Workshop - (LATW’13), IEEE, 2013, doi:10.1109/latw.2013.6562662.
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| DOI
2013 | Misc | LibreCat-ID: 13075
Cook, Alejandro, et al. Adaptive Test and Diagnosis of Intermittent Faults. 2013.
LibreCat
2013 | Conference Paper | LibreCat-ID: 46271
Sadeghi-Kohan, Somayeh, et al. “BS 1149.1 Extensions for an Online Interconnect Fault Detection and Recovery.” 2012 IEEE International Test Conference, IEEE, 2013, doi:10.1109/test.2012.6401583.
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| DOI
2013 | Conference Paper | LibreCat-ID: 46270
Sadeghi-Kohan, Somayeh, et al. “A New Structure for Interconnect Offline Testing.” East-West Design & Test Symposium (EWDTS 2013), IEEE, 2013, doi:10.1109/ewdts.2013.6673207.
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| DOI
2012 | Conference Paper | LibreCat-ID: 12980
Cook, Alejandro, et al. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” 13th IEEE Latin American Test Workshop (LATW’12), IEEE, 2012, pp. 1–4, doi:10.1109/latw.2012.6261229.
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| DOI
2012 | Conference Paper | LibreCat-ID: 12981
Cook, Alejandro, et al. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.” 17th IEEE European Test Symposium (ETS’12), IEEE, 2012, pp. 1–6, doi:10.1109/ets.2012.6233025.
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| DOI
2012 | Misc | LibreCat-ID: 13074
Cook, Alejandro, et al. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 2012.
LibreCat
2011 | Conference Paper | LibreCat-ID: 12982
Cook, Alejandro, et al. “Diagnostic Test of Robust Circuits.” 20th IEEE Asian Test Symposium (ATS’11), IEEE, 2011, pp. 285–90, doi:10.1109/ats.2011.55.
LibreCat
| DOI
2011 | Conference Paper | LibreCat-ID: 12984
Polian, Ilia, et al. “Towards Variation-Aware Test Methods.” 16th IEEE European Test Symposium Trondheim (ETS’11), IEEE, 2011, doi:10.1109/ets.2011.51.
LibreCat
| DOI
2011 | Conference Paper | LibreCat-ID: 13053
Cook, Alejandro, et al. “Robuster Selbsttest Mit Diagnose.” 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,” 2011, pp. 48–53.
LibreCat
2011 | Journal Article | LibreCat-ID: 13052
Hopsch, Fabian, et al. “Variation-Aware Fault Modeling.” SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer, vol. 54, no. 4, 2011, pp. 1813–26.
LibreCat
2011 | Conference Paper | LibreCat-ID: 46272
Kamran, Arezoo, et al. “Virtual Tester Development Using HDL/PLI.” 2010 East-West Design & Test Symposium (EWDTS), IEEE, 2011, doi:10.1109/ewdts.2010.5742156.
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| DOI
2010 | Misc | LibreCat-ID: 10670
Fröse, Viktor, et al. Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur. 2010.
LibreCat
2010 | Conference Paper | LibreCat-ID: 12987
Becker, Bernd, et al. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10), IEEE, 2010, doi:10.1109/dsnw.2010.5542612.
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