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138 Publications


2007 | Misc | LibreCat-ID: 13042
Oehler, Philipp, et al. An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy. 2007.
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2007 | Journal Article | LibreCat-ID: 13036
Hellebrand, Sybille, et al. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” {Informacije MIDEM, Ljubljana (Invited Paper)}, vol. 37, no. 4 (124), 2007, pp. 212–19.
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2007 | Misc | LibreCat-ID: 13043
Hellebrand, Sybille. Qualitätssicherung Für Nanochips - Wie IT-Produkte Zuverlässig Werden. 2007.
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2006 | Journal Article | LibreCat-ID: 13045
Becker, Bernd, et al. “DFG-Projekt RealTest - Test Und Zuverlässigkeit Nanoelektronischer Systeme.” {it -Information Technology}, vol. 48, no. 5, 2006, pp. 305–11.
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2005 | Misc | LibreCat-ID: 13102
Oehler, Philipp, and Sybille Hellebrand. Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study. 2005.
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2005 | Misc | LibreCat-ID: 13046
Oehler, Philipp, and Sybille Hellebrand. A Low Power Design for Embedded DRAMs with Online Consistency Checking. 2005.
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2005 | Conference Paper | LibreCat-ID: 12998
Ali, Muhammad, et al. “A Dynamic Routing Mechanism for Network on Chip.” {23rd IEEE NORCHIP Conference}, {IEEE}, 2005, pp. 70–73, doi:10.1109/norchp.2005.1596991.
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2005 | Conference Paper | LibreCat-ID: 12999
Ali, Muhammad, et al. “Considerations for Fault-Tolerant Networks on Chips.” {IEEE International Conference on Microelectronics (ICM’05)}, {IEEE}, 2005, doi:10.1109/icm.2005.1590063.
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2005 | Conference Paper | LibreCat-ID: 13000
Oehler, Philipp, and Sybille Hellebrand. “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities.” {10th IEEE European Test Symposium (ETS’05)}, {IEEE}, 2005, pp. 148–53, doi:10.1109/ets.2005.28.
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2005 | Misc | LibreCat-ID: 13101
Ali, Muhammad, et al. Dynamic Routing: A Prerequisite for Reliable NoCs. 2005.
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2004 | Conference Paper | LibreCat-ID: 13001
Wuertenberger, Armin, et al. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.” {IEEE International Test Conference (ITC’04)}, {IEEE}, 2004, pp. 926–35, doi:10.1109/test.2004.1387357.
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2004 | Misc | LibreCat-ID: 13099
Breu, Ruth, et al. Im Westen Viel Neues - Informatik an Der Universität Innsbruck. 2004.
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2004 | Conference Paper | LibreCat-ID: 13071
Liu Jing, Michelle, et al. “Sensor Networks with More Features Using Less Hardware.” {GOR/NGB Conference Tilburg 2004}, 2004.
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2004 | Misc | LibreCat-ID: 13100
Hellebrand, Sybille, et al. Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. 2004.
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2003 | Conference Paper | LibreCat-ID: 13002
Wuertenberger, Armin, et al. “A Hybrid Coding Strategy for Optimized Test Data Compression.” {IEEE International Test Conference (ITC’03)}, {IEEE}, 2003, pp. 451–59, doi:10.1109/test.2003.1270870.
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2003 | Misc | LibreCat-ID: 13098
Breu, Ruth, et al. Experiences from Teaching Software Development in a Java Environment. 2003.
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2002 | Journal Article | LibreCat-ID: 13070
Liang, Huaguo, et al. “A Mixed-Mode BIST Scheme Based on Folding Compression.” {Journal on Computer Science and Technology}, vol. 17, no. 2, 2002, pp. 203–12.
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2002 | Journal Article | LibreCat-ID: 13069
Hellebrand, Sybille, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” {Journal of Electronic Testing - Theory and Applications (JETTA)}, vol. 18, no. 2, 2002, pp. 157–68.
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2002 | Journal Article | LibreCat-ID: 13003
Hellebrand, Sybille, et al. “Efficient Online and Offline Testing of Embedded DRAMs.” {IEEE Transactions on Computers}, vol. 51, no. 7, Institute of Electrical and Electronics Engineers ({IEEE}), 2002, pp. 801–09, doi:10.1109/tc.2002.1017700.
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2002 | Misc | LibreCat-ID: 13097
Hellebrand, Sybille, and Armin Wuertenberger. Alternating Run-Length Coding: A Technique for Improved Test Data Compression. 2002.
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