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18 Publications
2017 | Journal Article | LibreCat-ID: 7026
Zolatanosha, Viktoryia, and Dirk Reuter. “Robust Si 3 N 4 Masks for 100 Nm Selective Area Epitaxy of GaAs-Based Nanostructures.” Microelectronic Engineering 180 (2017): 35–39. https://doi.org/10.1016/j.mee.2017.05.053.
LibreCat
| DOI
2016 | Journal Article | LibreCat-ID: 3956
Meyers, Thorsten, Fábio F. Vidor, Katharina Brassat, Jörg Lindner, and Ulrich Hilleringmann. “Low-Voltage DNTT-Based Thin-Film Transistors and Inverters for Flexible Electronics.” Microelectronic Engineering 174 (2016): 35–39. https://doi.org/10.1016/j.mee.2016.12.018.
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| DOI
2016 | Journal Article | LibreCat-ID: 39447
Meyers, Thorsten, Fábio F. Vidor, Katharina Brassat, Jörg K.N. Lindner, and Ulrich Hilleringmann. “Low-Voltage DNTT-Based Thin-Film Transistors and Inverters for Flexible Electronics.” Microelectronic Engineering 174 (2016): 35–39. https://doi.org/10.1016/j.mee.2016.12.018.
LibreCat
| DOI
2016 | Journal Article | LibreCat-ID: 39466
Vidor, Fábio F., Thorsten Meyers, Gilson I. Wirth, and Ulrich Hilleringmann. “ZnO Nanoparticle Thin-Film Transistors on Flexible Substrate Using Spray-Coating Technique.” Microelectronic Engineering 159 (2016): 155–58. https://doi.org/10.1016/j.mee.2016.02.059.
LibreCat
| DOI
2003 | Journal Article | LibreCat-ID: 8728
Zankovych, S., I. Maximov, I. Shorubalko, J. Seekamp, M. Beck, S. Romanov, Dirk Reuter, et al. “Nanoimprint-Induced Effects on Electrical and Optical Properties of Quantum Well Structures.” Microelectronic Engineering, 2003, 214–20. https://doi.org/10.1016/s0167-9317(03)00074-1.
LibreCat
| DOI
2003 | Journal Article | LibreCat-ID: 39851
Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “Nanometer Scale Organic Thin Film Transistors with Pentacene.” Microelectronic Engineering 67–68 (2003): 845–52. https://doi.org/10.1016/s0167-9317(03)00146-1.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 8733
Kähler, D., U. Kunze, Dirk Reuter, and A.D. Wieck. “Quantum Wire Fabrication from Compensating-Layer GaAs–AlGaAs Heterostructures.” Microelectronic Engineering, 2002, 619–23. https://doi.org/10.1016/s0167-9317(02)00474-4.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39912
Schönstein, I., J. Müller, Ulrich Hilleringmann, and K. Goser. “Characterization of Submicron NMOS Devices Due to Visible Light Emission.” Microelectronic Engineering 21, no. 1–4 (2002): 363–66. https://doi.org/10.1016/0167-9317(93)90092-j.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39914
Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.” Microelectronic Engineering 19, no. 1–4 (2002): 211–14. https://doi.org/10.1016/0167-9317(92)90425-q.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39899
Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Characterisation of Sub-100 Nm-MOS-Transistors Processed by Optical Lithography and a Sidewall-Etchback Technique.” Microelectronic Engineering 30, no. 1–4 (2002): 431–34. https://doi.org/10.1016/0167-9317(95)00280-4.
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| DOI