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188 Publications
2002 | Conference Paper | LibreCat-ID: 39892
Blum, F., Denisenko, A., Job, R., Borchert, D., Weber, W., Borany, J. V., Hilleringmann, U., & Fahrner, W. R. (2002). Nuclear radiation detectors on various type diamonds. IECON ’98. Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.98CH36200). https://doi.org/10.1109/iecon.1998.724097
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| DOI
2002 | Journal Article | LibreCat-ID: 39920
Soennecken, A., Hilleringmann, U., & Goser, K. (2002). Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica. Microelectronic Engineering, 15(1–4), 633–636. https://doi.org/10.1016/0167-9317(91)90299-s
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| DOI
2002 | Journal Article | LibreCat-ID: 39915
Hilleringmann, U., & Goser, K. (2002). Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering, 19(1–4), 211–214. https://doi.org/10.1016/0167-9317(92)90425-q
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| DOI
2002 | Journal Article | LibreCat-ID: 39916
Adams, S., Hilleringmann, U., & Goser, K. (2002). CMOS compatible micromachining by dry silicon-etching techniques. Microelectronic Engineering, 19(1–4), 191–194. https://doi.org/10.1016/0167-9317(92)90420-v
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39348
Horstmann, J. T., Hilleringmann, U., & Goser, K. F. (2002). Matching analysis of deposition defined 50-nm MOSFET’s. IEEE Transactions on Electron Devices, 45(1), 299–306. https://doi.org/10.1109/16.658845
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| DOI
2002 | Conference Paper | LibreCat-ID: 39923
Goser, K., Hilleringmann, U., & Rueckert, U. (2002). Applications and implementations of neural networks in microelectronics-overview and status. [1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications. https://doi.org/10.1109/cmpeur.1991.257442
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| DOI
2002 | Journal Article | LibreCat-ID: 39889
Mankowski, V., Hilleringmann, U., & Schumacher, K. (2002). 12 kV low current cascaded light triggered switch on one silicon chip. Microelectronic Engineering, 46(1–4), 413–417. https://doi.org/10.1016/s0167-9317(99)00122-7
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39891
Horstmann, J. T., Hilleringmann, U., & Goser, K. F. (2002). Matching analysis of deposition defined 50-nm MOSFET’s. IEEE Transactions on Electron Devices, 45(1), 299–306. https://doi.org/10.1109/16.658845
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39886
Wirth, G., Hilleringmann, U., Horstmann, J. T., & Goser, K. (2002). Mesoscopic transport phenomena in ultrashort channel MOSFETs. Solid-State Electronics, 43(7), 1245–1250. https://doi.org/10.1016/s0038-1101(99)00060-x
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| DOI
2002 | Journal Article | LibreCat-ID: 39876
Otterbach, R., Hilleringmann, U., Horstmann, T. J., & Goser, K. (2002). Structures with a minimum feature size of less than 100 nm in CVD-diamond for sensor applications. Diamond and Related Materials, 10(3–7), 511–514. https://doi.org/10.1016/s0925-9635(01)00373-9
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39877
Hilleringmann, U., Vieregge, T., & Horstmann, J. T. (2002). A structure definition technique for 25 nm lines of silicon and related materials. Microelectronic Engineering, 53(1–4), 569–572. https://doi.org/10.1016/s0167-9317(00)00380-4
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| DOI
2002 | Journal Article | LibreCat-ID: 39874
Otterbach, R., & Hilleringmann, U. (2002). Reactive ion etching of CVD-diamond for piezoresistive pressure sensors. Diamond and Related Materials, 11(3–6), 841–844. https://doi.org/10.1016/s0925-9635(01)00703-8
LibreCat
| DOI
2002 | Book Chapter | LibreCat-ID: 39875
Hilleringmann, U. (2002). Metallisierung und Kontakte. In Silizium-Halbleitertechnologie (pp. 131–151). Vieweg+Teubner Verlag. https://doi.org/10.1007/978-3-322-94119-0_8
LibreCat
| DOI
2000 | Conference Paper | LibreCat-ID: 39884
Hilleringmann, U., Vieregge, T., & Horstmann, J. (2000). Nanometer Scale Lateral Structures of MOS Type Layers. Proceedings Micro. Tec, 49–53.
LibreCat
1999 | Conference Paper | LibreCat-ID: 39890
Otterbach, R., & Hilleringmann, U. (1999). High rate CVD-diamond etching for high temperature pressure sensor applications. 29th European Solid-State Device Research Conference, 1, 320–323.
LibreCat
1998 | Conference Paper | LibreCat-ID: 39893
Horstmann, J. T., Hilleringmann, U., & Goser, K. (1998). Correlation Analysis of the Statistical Electrical Parameter Fluctuations in 50 nm MOS-Transistors. 28th European Solid-State Device Research Conference, 512–515.
LibreCat
1997 | Journal Article | LibreCat-ID: 39896
Heinrich, L. M. H., Muller, J., Hilleringmann, U., Goser, K. F., Holmes, A., Hwang, D.-H., & Stern, R. (1997). CMOS-compatible organic light-emitting diodes. IEEE Transactions on Electron Devices, 44(8), 1249–1252. https://doi.org/10.1109/16.605463
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| DOI
1996 | Conference Paper | LibreCat-ID: 39902
Muller, J., Wirth, G., Hilleringmann, U., & Goser, K. (1996). Analyses of Sub 1/4-Micron MOS-Transistors by Visible Light Emission. ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 947–950.
LibreCat
1996 | Conference Paper | LibreCat-ID: 39900
Horstmann, J. T., Hilleringmann, U., & Goser, K. (1996). Characterization and Matching Analysis of 50 nm-NMOS-Transistors. ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 253–256.
LibreCat
1996 | Conference Paper | LibreCat-ID: 39903
Horstmann, J., Hilleringmann, U., & Goser, K. (1996). ESSDERC’96, Bologna, Italy. Conf. Dig, 253.
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