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188 Publications
2002 | Conference Paper | LibreCat-ID: 39892
@inproceedings{Blum_Denisenko_Job_Borchert_Weber_Borany_Hilleringmann_Fahrner_2002, title={Nuclear radiation detectors on various type diamonds}, DOI={10.1109/iecon.1998.724097}, booktitle={IECON ’98. Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.98CH36200)}, publisher={IEEE}, author={Blum, F. and Denisenko, A. and Job, R. and Borchert, D. and Weber, W. and Borany, J.V. and Hilleringmann, Ulrich and Fahrner, W.R.}, year={2002} }
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39920
@article{Soennecken_Hilleringmann_Goser_2002, title={Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica}, volume={15}, DOI={10.1016/0167-9317(91)90299-s}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Soennecken, A. and Hilleringmann, Ulrich and Goser, K.}, year={2002}, pages={633–636} }
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39915
@article{Hilleringmann_Goser_2002, title={Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon}, volume={19}, DOI={10.1016/0167-9317(92)90425-q}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Hilleringmann, Ulrich and Goser, K.}, year={2002}, pages={211–214} }
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39916
@article{Adams_Hilleringmann_Goser_2002, title={CMOS compatible micromachining by dry silicon-etching techniques}, volume={19}, DOI={10.1016/0167-9317(92)90420-v}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Adams, S. and Hilleringmann, Ulrich and Goser, K.}, year={2002}, pages={191–194} }
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39348
@article{Horstmann_Hilleringmann_Goser_2002, title={Matching analysis of deposition defined 50-nm MOSFET’s}, volume={45}, DOI={10.1109/16.658845}, number={1}, journal={IEEE Transactions on Electron Devices}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.F.}, year={2002}, pages={299–306} }
LibreCat
| DOI
2002 | Conference Paper | LibreCat-ID: 39923
@inproceedings{Goser_Hilleringmann_Rueckert_2002, title={Applications and implementations of neural networks in microelectronics-overview and status}, DOI={10.1109/cmpeur.1991.257442}, booktitle={[1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications}, publisher={IEEE Comput. Soc. Press}, author={Goser, K. and Hilleringmann, Ulrich and Rueckert, U.}, year={2002} }
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39889
@article{Mankowski_Hilleringmann_Schumacher_2002, title={12 kV low current cascaded light triggered switch on one silicon chip}, volume={46}, DOI={10.1016/s0167-9317(99)00122-7}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Mankowski, V. and Hilleringmann, Ulrich and Schumacher, K.}, year={2002}, pages={413–417} }
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39891
@article{Horstmann_Hilleringmann_Goser_2002, title={Matching analysis of deposition defined 50-nm MOSFET’s}, volume={45}, DOI={10.1109/16.658845}, number={1}, journal={IEEE Transactions on Electron Devices}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.F.}, year={2002}, pages={299–306} }
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39886
@article{Wirth_Hilleringmann_Horstmann_Goser_2002, title={Mesoscopic transport phenomena in ultrashort channel MOSFETs}, volume={43}, DOI={10.1016/s0038-1101(99)00060-x}, number={7}, journal={Solid-State Electronics}, publisher={Elsevier BV}, author={Wirth, G and Hilleringmann, Ulrich and Horstmann, J.T and Goser, K}, year={2002}, pages={1245–1250} }
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39876
@article{Otterbach_Hilleringmann_Horstmann_Goser_2002, title={Structures with a minimum feature size of less than 100 nm in CVD-diamond for sensor applications}, volume={10}, DOI={10.1016/s0925-9635(01)00373-9}, number={3–7}, journal={Diamond and Related Materials}, publisher={Elsevier BV}, author={Otterbach, R. and Hilleringmann, Ulrich and Horstmann, T.J. and Goser, K.}, year={2002}, pages={511–514} }
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39877
@article{Hilleringmann_Vieregge_Horstmann_2002, title={A structure definition technique for 25 nm lines of silicon and related materials}, volume={53}, DOI={10.1016/s0167-9317(00)00380-4}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Hilleringmann, Ulrich and Vieregge, T. and Horstmann, J.T.}, year={2002}, pages={569–572} }
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39874
@article{Otterbach_Hilleringmann_2002, title={Reactive ion etching of CVD-diamond for piezoresistive pressure sensors}, volume={11}, DOI={10.1016/s0925-9635(01)00703-8}, number={3–6}, journal={Diamond and Related Materials}, publisher={Elsevier BV}, author={Otterbach, R. and Hilleringmann, Ulrich}, year={2002}, pages={841–844} }
LibreCat
| DOI
2002 | Book Chapter | LibreCat-ID: 39875
@inbook{Hilleringmann_2002, place={Wiesbaden}, title={Metallisierung und Kontakte}, DOI={10.1007/978-3-322-94119-0_8}, booktitle={Silizium-Halbleitertechnologie}, publisher={Vieweg+Teubner Verlag}, author={Hilleringmann, Ulrich}, year={2002}, pages={131–151} }
LibreCat
| DOI
2000 | Conference Paper | LibreCat-ID: 39884
@inproceedings{Hilleringmann_Vieregge_Horstmann_2000, title={Nanometer Scale Lateral Structures of MOS Type Layers}, booktitle={Proceedings Micro. tec}, author={Hilleringmann, Ulrich and Vieregge, T and Horstmann, JT}, year={2000}, pages={49–53} }
LibreCat
1999 | Conference Paper | LibreCat-ID: 39890
@inproceedings{Otterbach_Hilleringmann_1999, title={High rate CVD-diamond etching for high temperature pressure sensor applications}, volume={1}, booktitle={29th European Solid-State Device Research Conference}, author={Otterbach, R. and Hilleringmann, Ulrich}, year={1999}, pages={320–323} }
LibreCat
1998 | Conference Paper | LibreCat-ID: 39893
@inproceedings{Horstmann_Hilleringmann_Goser_1998, title={Correlation Analysis of the Statistical Electrical Parameter Fluctuations in 50 nm MOS-Transistors}, booktitle={28th European Solid-State Device Research Conference}, author={Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.}, year={1998}, pages={512–515} }
LibreCat
1997 | Journal Article | LibreCat-ID: 39896
@article{Heinrich_Muller_Hilleringmann_Goser_Holmes_Hwang_Stern_1997, title={CMOS-compatible organic light-emitting diodes}, volume={44}, DOI={10.1109/16.605463}, number={8}, journal={IEEE Transactions on Electron Devices}, author={Heinrich, L.M.H. and Muller, J. and Hilleringmann, Ulrich and Goser, K.F. and Holmes, A. and Hwang, Do-Hoon and Stern, R.}, year={1997}, pages={1249–1252} }
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| DOI
1996 | Conference Paper | LibreCat-ID: 39902
@inproceedings{Muller_Wirth_Hilleringmann_Goser_1996, title={Analyses of Sub 1/4-Micron MOS-Transistors by Visible Light Emission}, booktitle={ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference}, author={Muller, J. and Wirth, G. and Hilleringmann, Ulrich and Goser, K.}, year={1996}, pages={947–950} }
LibreCat
1996 | Conference Paper | LibreCat-ID: 39900
@inproceedings{Horstmann_Hilleringmann_Goser_1996, title={Characterization and Matching Analysis of 50 nm-NMOS-Transistors}, booktitle={ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference}, author={Horstmann, J. T. and Hilleringmann, Ulrich and Goser, K.}, year={1996}, pages={253–256} }
LibreCat
1996 | Conference Paper | LibreCat-ID: 39903
@inproceedings{Horstmann_Hilleringmann_Goser_1996, title={ESSDERC’96, Bologna, Italy}, volume={253}, booktitle={Conf. Dig}, author={Horstmann, JT and Hilleringmann, Ulrich and Goser, K}, year={1996} }
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