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165 Publications
2007 | Misc | LibreCat-ID: 13042
Oehler, Philipp, et al. An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy. 2007.
LibreCat
2007 | Misc | LibreCat-ID: 13043
Hellebrand, Sybille. Qualitätssicherung Für Nanochips - Wie IT-Produkte Zuverlässig Werden. 2007.
LibreCat
2007 | Conference Paper | LibreCat-ID: 12995
Hellebrand, Sybille, et al. “A Refined Electrical Model for Particle Strikes and Its Impact on SEU Prediction.” 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07), IEEE, 2007, pp. 50–58, doi:10.1109/dft.2007.43.
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| DOI
2007 | Conference Paper | LibreCat-ID: 12996
Oehler, Philipp, et al. “Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair.” 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07), IEEE, 2007, pp. 185–90, doi:10.1109/ddecs.2007.4295278.
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| DOI
2007 | Conference Paper | LibreCat-ID: 12997
Oehler, Philipp, et al. “An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy.” 12th IEEE European Test Symposium (ETS’07), IEEE, 2007, pp. 91–96, doi:10.1109/ets.2007.10.
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| DOI
2007 | Conference Paper | LibreCat-ID: 13037
Hellebrand, Sybille, et al. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper), 2007.
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2007 | Journal Article | LibreCat-ID: 13036
Hellebrand, Sybille, et al. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” Informacije MIDEM, Ljubljana (Invited Paper), vol. 37, no. 4 (124), 2007, pp. 212–19.
LibreCat
2007 | Journal Article | LibreCat-ID: 13044
Ali, Muhammad, et al. “An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip.” International Journal on High Performance Systems Architecture, vol. 1, no. 2, 2007, pp. 113–23.
LibreCat
2007 | Conference Paper | LibreCat-ID: 13040
Ali, Muhammad, et al. “A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip.” 4th International Conference on Information Technology: New Generations (ITNG’07), 2007, pp. 1027–32.
LibreCat
2007 | Conference Paper | LibreCat-ID: 13041
Becker, Bernd, et al. “Test Und Zuverlässigkeit Nanoelektronischer Systeme.” 1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2007.
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