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165 Publications
2007 | Misc | LibreCat-ID: 13042
Oehler P, Hellebrand S, Wunderlich H-J. An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany; 2007.
LibreCat
2007 | Misc | LibreCat-ID: 13043
Hellebrand S. Qualitätssicherung Für Nanochips - Wie IT-Produkte Zuverlässig Werden. ForschungsForum Paderborn, 10. Ausgabe, Paderborn, Germany; 2007.
LibreCat
2007 | Conference Paper | LibreCat-ID: 12995
Hellebrand S, G. Zoellin C, Wunderlich H-J, Ludwig S, Coym T, Straube B. A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction. In: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07). IEEE; 2007:50-58. doi:10.1109/dft.2007.43
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| DOI
2007 | Conference Paper | LibreCat-ID: 12996
Oehler P, Hellebrand S, Wunderlich H-J. Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair. In: 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07). IEEE; 2007:185-190. doi:10.1109/ddecs.2007.4295278
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| DOI
2007 | Conference Paper | LibreCat-ID: 12997
Oehler P, Hellebrand S, Wunderlich H-J. An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. In: 12th IEEE European Test Symposium (ETS’07). IEEE; 2007:91-96. doi:10.1109/ets.2007.10
LibreCat
| DOI
2007 | Conference Paper | LibreCat-ID: 13037
Hellebrand S, G. Zoellin C, Wunderlich H-J, Ludwig S, Coym T, Straube B. Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance. In: 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper). ; 2007.
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2007 | Journal Article | LibreCat-ID: 13036
Hellebrand S, G. Zoellin C, Wunderlich H-J, Ludwig S, Coym T, Straube B. Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance. Informacije MIDEM, Ljubljana (Invited Paper). 2007;37(4 (124)):212-219.
LibreCat
2007 | Journal Article | LibreCat-ID: 13044
Ali M, Hessler S, Welzl M, Hellebrand S. An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip. International Journal on High Performance Systems Architecture. 2007;1(2):113-123.
LibreCat
2007 | Conference Paper | LibreCat-ID: 13040
Ali M, Welzl M, Hessler S, Hellebrand S. A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip. In: 4th International Conference on Information Technology: New Generations (ITNG’07). ; 2007:1027-1032.
LibreCat
2007 | Conference Paper | LibreCat-ID: 13041
Becker B, Polian I, Hellebrand S, Straube B, Wunderlich H-J. Test und Zuverlässigkeit nanoelektronischer Systeme. In: 1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” ; 2007.
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