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165 Publications
2007 | Misc | LibreCat-ID: 13042
P. Oehler, S. Hellebrand, and H.-J. Wunderlich, An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, 2007.
LibreCat
2007 | Misc | LibreCat-ID: 13043
S. Hellebrand, Qualitätssicherung für Nanochips - Wie IT-Produkte zuverlässig werden. ForschungsForum Paderborn, 10. Ausgabe, Paderborn, Germany, 2007.
LibreCat
2007 | Conference Paper | LibreCat-ID: 12995
S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, and B. Straube, “A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction,” in 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07), 2007, pp. 50–58, doi: 10.1109/dft.2007.43.
LibreCat
| DOI
2007 | Conference Paper | LibreCat-ID: 12996
P. Oehler, S. Hellebrand, and H.-J. Wunderlich, “Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair,” in 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07), 2007, pp. 185–190, doi: 10.1109/ddecs.2007.4295278.
LibreCat
| DOI
2007 | Conference Paper | LibreCat-ID: 12997
P. Oehler, S. Hellebrand, and H.-J. Wunderlich, “An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy,” in 12th IEEE European Test Symposium (ETS’07), 2007, pp. 91–96, doi: 10.1109/ets.2007.10.
LibreCat
| DOI
2007 | Conference Paper | LibreCat-ID: 13037
S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, and B. Straube, “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance,” 2007.
LibreCat
2007 | Journal Article | LibreCat-ID: 13036
S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, and B. Straube, “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance,” Informacije MIDEM, Ljubljana (Invited Paper), vol. 37, no. 4 (124), pp. 212–219, 2007.
LibreCat
2007 | Journal Article | LibreCat-ID: 13044
M. Ali, S. Hessler, M. Welzl, and S. Hellebrand, “An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip,” International Journal on High Performance Systems Architecture, vol. 1, no. 2, pp. 113–123, 2007.
LibreCat
2007 | Conference Paper | LibreCat-ID: 13040
M. Ali, M. Welzl, S. Hessler, and S. Hellebrand, “A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip,” in 4th International Conference on Information Technology: New Generations (ITNG’07), 2007, pp. 1027–1032.
LibreCat
2007 | Conference Paper | LibreCat-ID: 13041
B. Becker, I. Polian, S. Hellebrand, B. Straube, and H.-J. Wunderlich, “Test und Zuverlässigkeit nanoelektronischer Systeme,” 2007.
LibreCat