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165 Publications
2012 | Conference Paper | LibreCat-ID: 12980
Cook, Alejandro, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” In 13th IEEE Latin American Test Workshop (LATW’12), 1–4. Quito, Ecuador: IEEE, 2012. https://doi.org/10.1109/latw.2012.6261229.
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2012 | Conference Paper | LibreCat-ID: 12981
Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.” In 17th IEEE European Test Symposium (ETS’12), 1–6. Annecy, France: IEEE, 2012. https://doi.org/10.1109/ets.2012.6233025.
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2012 | Misc | LibreCat-ID: 13074
Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.
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2011 | Conference Paper | LibreCat-ID: 12982
Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Diagnostic Test of Robust Circuits.” In 20th IEEE Asian Test Symposium (ATS’11), 285–90. New Delhi, India: IEEE, 2011. https://doi.org/10.1109/ats.2011.55.
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2011 | Conference Paper | LibreCat-ID: 12984
Polian, Ilia, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, and Peter Maxwell. “Towards Variation-Aware Test Methods.” In 16th IEEE European Test Symposium Trondheim (ETS’11). Trondheim, Norway: IEEE, 2011. https://doi.org/10.1109/ets.2011.51.
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2011 | Conference Paper | LibreCat-ID: 13053
Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Robuster Selbsttest Mit Diagnose.” In 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,” 48–53. Hamburg, Germany, 2011.
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2011 | Journal Article | LibreCat-ID: 13052
Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer 54, no. 4 (2011): 1813–26.
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2011 | Conference Paper | LibreCat-ID: 46272
Kamran, Arezoo, Nastaran Nemati, Somayeh Sadeghi-Kohan, and Zainalabedin Navabi. “Virtual Tester Development Using HDL/PLI.” In 2010 East-West Design & Test Symposium (EWDTS). IEEE, 2011. https://doi.org/10.1109/ewdts.2010.5742156.
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2010 | Misc | LibreCat-ID: 10670
Fröse, Viktor, Rüdiger Ibers, and Sybille Hellebrand. Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.
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2010 | Conference Paper | LibreCat-ID: 12987
Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10). Chicago, IL, USA: IEEE, 2010. https://doi.org/10.1109/dsnw.2010.5542612.
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2010 | Conference Paper | LibreCat-ID: 13051
Hunger, Marc, and Sybille Hellebrand. “Ausbeute Und Fehlertoleranz Bei Dreifach Modularer Redundanz.” In 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 81–88. Wildbad Kreuth, Germany, 2010.
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2010 | Misc | LibreCat-ID: 13073
Hellebrand, Sybille. Nano-Electronic Systems. Editorial, it 4/2010, pp. 179-180, 2010.
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2010 | Conference Paper | LibreCat-ID: 12983
Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” In 19th IEEE Asian Test Symposium (ATS’10), 87–93. Shanghai, China: IEEE, 2010. https://doi.org/10.1109/ats.2010.24.
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2010 | Conference Paper | LibreCat-ID: 12985
Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” In 28th IEEE International Conference on Computer Design (ICCD’10), 480–85. Amsterdam, The Netherlands: IEEE, 2010. https://doi.org/10.1109/iccd.2010.5647648.
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2010 | Conference Paper | LibreCat-ID: 12986
Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), 101–8. Kyoto, Japan: IEEE, 2010. https://doi.org/10.1109/dft.2010.19.
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2010 | Conference Paper | LibreCat-ID: 12988
Froese, Viktor, Rüdiger Ibers, and Sybille Hellebrand. “Reusing NoC-Infrastructure for Test Data Compression.” In 28th IEEE VLSI Test Symposium (VTS’10), 227–31. Santa Cruz, CA, USA: IEEE, 2010. https://doi.org/10.1109/vts.2010.5469570.
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2010 | Conference Paper | LibreCat-ID: 13049
Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper). Chicago, IL, USA, 2010.
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2010 | Conference Paper | LibreCat-ID: 13050
Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Robuster Selbsttest Mit Extremer Kompaktierung.” In 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 17–24. Wildbad Kreuth, Germany, 2010.
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2009 | Conference Paper | LibreCat-ID: 12991
Hunger, Marc, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, and Bernd Becker. “ATPG-Based Grading of Strong Fault-Secureness.” In 15th IEEE International On-Line Testing Symposium (IOLTS’09. Sesimbra-Lisbon, Portugal: IEEE, 2009. https://doi.org/10.1109/iolts.2009.5196027.
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2009 | Conference Paper | LibreCat-ID: 12990
Hellebrand, Sybille, and Marc Hunger. “Are Robust Circuits Really Robust?” In 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), 77. Chicago, IL, USA: IEEE, 2009. https://doi.org/10.1109/dft.2009.28.
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