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165 Publications
2007 | Misc | LibreCat-ID: 13042
Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, 2007.
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2007 | Misc | LibreCat-ID: 13043
Hellebrand, Sybille. Qualitätssicherung Für Nanochips - Wie IT-Produkte Zuverlässig Werden. ForschungsForum Paderborn, 10. Ausgabe, Paderborn, Germany, 2007.
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2007 | Conference Paper | LibreCat-ID: 12995
Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “A Refined Electrical Model for Particle Strikes and Its Impact on SEU Prediction.” In 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07), 50–58. Rome, Italy: IEEE, 2007. https://doi.org/10.1109/dft.2007.43.
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2007 | Conference Paper | LibreCat-ID: 12996
Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair.” In 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07), 185–90. Krakow, Poland: IEEE, 2007. https://doi.org/10.1109/ddecs.2007.4295278.
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2007 | Conference Paper | LibreCat-ID: 12997
Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. “An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy.” In 12th IEEE European Test Symposium (ETS’07), 91–96. Freiburg, Germany: IEEE, 2007. https://doi.org/10.1109/ets.2007.10.
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2007 | Conference Paper | LibreCat-ID: 13037
Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” In 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper). Bled, Slovenia, 2007.
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2007 | Journal Article | LibreCat-ID: 13036
Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” Informacije MIDEM, Ljubljana (Invited Paper) 37, no. 4 (124) (2007): 212–19.
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2007 | Journal Article | LibreCat-ID: 13044
Ali, Muhammad, Sven Hessler, Michael Welzl, and Sybille Hellebrand. “An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip.” International Journal on High Performance Systems Architecture 1, no. 2 (2007): 113–23.
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2007 | Conference Paper | LibreCat-ID: 13040
Ali, Muhammad, Michael Welzl, Sven Hessler, and Sybille Hellebrand. “A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip.” In 4th International Conference on Information Technology: New Generations (ITNG’07), 1027–32. Las Vegas, Nevada, USA, 2007.
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2007 | Conference Paper | LibreCat-ID: 13041
Becker, Bernd, Ilia Polian, Sybille Hellebrand, Bernd Straube, and Hans-Joachim Wunderlich. “Test Und Zuverlässigkeit Nanoelektronischer Systeme.” In 1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Munich, Germany, 2007.
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2006 | Journal Article | LibreCat-ID: 13045
Becker, Bernd, Ilia Polian, Sybille Hellebrand, Bernd Straube, and Hans-Joachim Wunderlich. “DFG-Projekt RealTest - Test Und Zuverlässigkeit Nanoelektronischer Systeme.” It - Information Technology 48, no. 5 (2006): 305–11.
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2005 | Misc | LibreCat-ID: 13046
Oehler, Philipp, and Sybille Hellebrand. A Low Power Design for Embedded DRAMs with Online Consistency Checking. Kleinheubachertagung 2005, Miltenberg, Germany, 2005.
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2005 | Misc | LibreCat-ID: 13101
Ali, Muhammad, Michael Welzl, and Sybille Hellebrand. Dynamic Routing: A Prerequisite for Reliable NoCs. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.
LibreCat
2005 | Misc | LibreCat-ID: 13102
Oehler, Philipp, and Sybille Hellebrand. Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.
LibreCat
2005 | Conference Paper | LibreCat-ID: 12999
Ali, Muhammad, Michael Welzl, Martin Zwicknagl, and Sybille Hellebrand. “Considerations for Fault-Tolerant Networks on Chips.” In IEEE International Conference on Microelectronics (ICM’05). Islamabad, Pakistan: IEEE, 2005. https://doi.org/10.1109/icm.2005.1590063.
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2005 | Conference Paper | LibreCat-ID: 13000
Oehler, Philipp, and Sybille Hellebrand. “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities.” In 10th IEEE European Test Symposium (ETS’05), 148–53. Tallinn, Estonia: IEEE, 2005. https://doi.org/10.1109/ets.2005.28.
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2005 | Conference Paper | LibreCat-ID: 12998
Ali, Muhammad, Michael Welzl, and Sybille Hellebrand. “A Dynamic Routing Mechanism for Network on Chip.” In 23rd IEEE NORCHIP Conference, 70–73. Oulu, Finland: IEEE, 2005. https://doi.org/10.1109/norchp.2005.1596991.
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2004 | Conference Paper | LibreCat-ID: 13071
Liu Jing, Michelle, Stefan Ruehrup, Christian Schindelhauer, Klaus Volbert, Martin Dierkes, Andreas Bellgardt, Rüdiger Ibers, and Ulrich Hilleringmann. “Sensor Networks with More Features Using Less Hardware.” In {GOR/NGB Conference Tilburg 2004}. Tilburg, Netherlands, 2004.
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2004 | Misc | LibreCat-ID: 13099
Breu, Ruth, Thomas Fahringer, Dieter Fensel, Sybille Hellebrand, Aart Middeldorp, and Otmar Scherzer. Im Westen Viel Neues - Informatik an Der Universität Innsbruck. OCG Journal, pp. 28-29, 2004.
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2004 | Misc | LibreCat-ID: 13100
Hellebrand, Sybille, Armin Wuertenberger, and Christofer S. Tautermann. Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. 9th IEEE European Test Symposium, Ajaccio, Corsica, France, 2004.
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