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165 Publications


2019 | Conference Paper | LibreCat-ID: 12918
Maaz MU, Sprenger A, Hellebrand S. A Hybrid Space Compactor for Adaptive X-Handling. In: 50th IEEE International Test Conference (ITC). IEEE; 2019:1-8.
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2018 | Misc | LibreCat-ID: 4576
Sprenger A, Hellebrand S. Stochastische Kompaktierung für den Hochgeschwindigkeitstest. Freiburg, Germany: 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18); 2018.
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2018 | Journal Article | LibreCat-ID: 12974
Hellebrand S, Henkel J, Raghunathan A, Wunderlich H-J. Guest Editors’ Introduction - Special Issue on Approximate Computing. IEEE Embedded Systems Letters. 2018;10(1):1-1. doi:10.1109/les.2018.2789942
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2018 | Journal Article | LibreCat-ID: 13057
Kampmann M, Hellebrand S. Design For Small Delay Test - A Simulation Study. Microelectronics Reliability. 2018;80:124-133.
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2018 | Misc | LibreCat-ID: 13072
Kampmann M, Hellebrand S. Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test. 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China; 2018.
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2018 | Conference Paper | LibreCat-ID: 29460
Rezaeizadeh Rookerd R, Sadeghi-Kohan S, Navabi Z. Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture. In: Proceedings of the 2018 on Great Lakes Symposium on VLSI. ACM; 2018. doi:10.1145/3194554.3194599
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2018 | Conference Paper | LibreCat-ID: 4575
Sprenger A, Hellebrand S. Tuning Stochastic Space Compaction to Faster-than-at-Speed Test. In: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS). IEEE; 2018. doi:10.1109/ddecs.2018.00020
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2018 | Conference Paper | LibreCat-ID: 10575
Liu C, Schneider E, Kampmann M, Hellebrand S, Wunderlich H-J. Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. In: 27th IEEE Asian Test Symposium (ATS’18). ; 2018. doi:10.1109/ats.2018.00028
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2018 | Conference Paper | LibreCat-ID: 29459
Sadeghi-Kohan S, Vafaei A, Navabi Z. Near-Optimal Node Selection Procedure for Aging Monitor Placement. In: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS). IEEE; 2018. doi:10.1109/iolts.2018.8474120
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2017 | Conference Paper | LibreCat-ID: 12973
Deshmukh J, Kunz W, Wunderlich H-J, Hellebrand S. Special Session on Early Life Failures. In: 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE; 2017. doi:10.1109/vts.2017.7928933
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2017 | Misc | LibreCat-ID: 13078
Kampmann M, Hellebrand S. X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz.; 2017.
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2017 | Conference Paper | LibreCat-ID: 10576
Kampmann M, Hellebrand S. Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test. In: 20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17). IEEE; 2017. doi:10.1109/ddecs.2017.7934564
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2017 | Journal Article | LibreCat-ID: 29462
Sadeghi-Kohan S, Kamal M, Navabi Z. Self-Adjusting Monitor for Measuring Aging Rate and Advancement. IEEE Transactions on Emerging Topics in Computing. 2017;8(3):627-641. doi:10.1109/tetc.2017.2771441
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2017 | Conference Paper | LibreCat-ID: 29463
Jenihhin M, Kamkin A, Navabi Z, Sadeghi-Kohan S. Universal mitigation of NBTI-induced aging by design randomization. In: 2016 IEEE East-West Design & Test Symposium (EWDTS). IEEE; 2017. doi:10.1109/ewdts.2016.7807635
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2016 | Conference Paper | LibreCat-ID: 12975
Kampmann M, Hellebrand S. X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. In: 25th IEEE Asian Test Symposium (ATS’16). Hiroshima, Japan: IEEE; 2016:1-6. doi:10.1109/ats.2016.20
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2015 | Conference Paper | LibreCat-ID: 12976
Kampmann M, A. Kochte M, Schneider E, Indlekofer T, Hellebrand S, Wunderlich H-J. Optimized Selection of Frequencies for Faster-Than-at-Speed Test. In: 24th IEEE Asian Test Symposium (ATS’15). Mumbai, India: IEEE; 2015:109-114. doi:10.1109/ats.2015.26
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2015 | Journal Article | LibreCat-ID: 13056
Huang Z, Liang H, Hellebrand S. A High Performance SEU Tolerant Latch. Journal of Electronic Testing - Theory and Applications (JETTA). 2015;31(4):349-359.
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2015 | Misc | LibreCat-ID: 13077
Hellebrand S, Indlekofer T, Kampmann M, Kochte M, Liu C, Wunderlich H-J. Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany; 2015.
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2015 | Conference Paper | LibreCat-ID: 29465
Sadeghi-Kohan S, Kamran A, Forooghifar F, Navabi Z. Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation. In: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE; 2015. doi:10.1109/dtis.2015.7127373
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2015 | Conference Paper | LibreCat-ID: 29466
Sadeghi-Kohan S, Kamal M, McNeil J, Prinetto P, Navabi Z. Online self adjusting progressive age monitoring of timing variations. In: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE; 2015. doi:10.1109/dtis.2015.7127368
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