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165 Publications


2019 | Conference Paper | LibreCat-ID: 12918
M. U. Maaz, A. Sprenger, and S. Hellebrand, “A Hybrid Space Compactor for Adaptive X-Handling,” in 50th IEEE International Test Conference (ITC), Washington, DC, USA, 2019, pp. 1–8.
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2018 | Misc | LibreCat-ID: 4576
A. Sprenger and S. Hellebrand, Stochastische Kompaktierung für den Hochgeschwindigkeitstest. Freiburg, Germany: 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), 2018.
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2018 | Journal Article | LibreCat-ID: 12974
S. Hellebrand, J. Henkel, A. Raghunathan, and H.-J. Wunderlich, “Guest Editors’ Introduction - Special Issue on Approximate Computing,” IEEE Embedded Systems Letters, vol. 10, no. 1, pp. 1–1, 2018.
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2018 | Journal Article | LibreCat-ID: 13057
M. Kampmann and S. Hellebrand, “Design For Small Delay Test - A Simulation Study,” Microelectronics Reliability, vol. 80, pp. 124–133, 2018.
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2018 | Misc | LibreCat-ID: 13072
M. Kampmann and S. Hellebrand, Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test. 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China, 2018.
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2018 | Conference Paper | LibreCat-ID: 29460
R. Rezaeizadeh Rookerd, S. Sadeghi-Kohan, and Z. Navabi, “Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture,” 2018, doi: 10.1145/3194554.3194599.
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2018 | Conference Paper | LibreCat-ID: 4575
A. Sprenger and S. Hellebrand, “Tuning Stochastic Space Compaction to Faster-than-at-Speed Test,” 2018, doi: 10.1109/ddecs.2018.00020.
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2018 | Conference Paper | LibreCat-ID: 10575
C. Liu, E. Schneider, M. Kampmann, S. Hellebrand, and H.-J. Wunderlich, “Extending Aging Monitors for Early Life and Wear-Out Failure Prevention,” 2018, doi: 10.1109/ats.2018.00028.
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2018 | Conference Paper | LibreCat-ID: 29459
S. Sadeghi-Kohan, A. Vafaei, and Z. Navabi, “Near-Optimal Node Selection Procedure for Aging Monitor Placement,” 2018, doi: 10.1109/iolts.2018.8474120.
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2017 | Conference Paper | LibreCat-ID: 12973
J. Deshmukh, W. Kunz, H.-J. Wunderlich, and S. Hellebrand, “Special Session on Early Life Failures,” in 35th IEEE VLSI Test Symposium (VTS’17), 2017.
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2017 | Misc | LibreCat-ID: 13078
M. Kampmann and S. Hellebrand, X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz. 29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.
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2017 | Conference Paper | LibreCat-ID: 10576
M. Kampmann and S. Hellebrand, “Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test,” 2017, doi: 10.1109/ddecs.2017.7934564.
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2017 | Journal Article | LibreCat-ID: 29462
S. Sadeghi-Kohan, M. Kamal, and Z. Navabi, “Self-Adjusting Monitor for Measuring Aging Rate and Advancement,” IEEE Transactions on Emerging Topics in Computing, vol. 8, no. 3, pp. 627–641, 2017, doi: 10.1109/tetc.2017.2771441.
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2017 | Conference Paper | LibreCat-ID: 29463
M. Jenihhin, A. Kamkin, Z. Navabi, and S. Sadeghi-Kohan, “Universal mitigation of NBTI-induced aging by design randomization,” 2017, doi: 10.1109/ewdts.2016.7807635.
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2016 | Conference Paper | LibreCat-ID: 12975
M. Kampmann and S. Hellebrand, “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test,” in 25th IEEE Asian Test Symposium (ATS’16), 2016, pp. 1–6.
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2015 | Conference Paper | LibreCat-ID: 12976
M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, and H.-J. Wunderlich, “Optimized Selection of Frequencies for Faster-Than-at-Speed Test,” in 24th IEEE Asian Test Symposium (ATS’15), 2015, pp. 109–114.
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2015 | Journal Article | LibreCat-ID: 13056
Z. Huang, H. Liang, and S. Hellebrand, “A High Performance SEU Tolerant Latch,” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 31, no. 4, pp. 349–359, 2015.
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2015 | Misc | LibreCat-ID: 13077
S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, and H.-J. Wunderlich, Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.
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2015 | Conference Paper | LibreCat-ID: 29465
S. Sadeghi-Kohan, A. Kamran, F. Forooghifar, and Z. Navabi, “Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation,” 2015, doi: 10.1109/dtis.2015.7127373.
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2015 | Conference Paper | LibreCat-ID: 29466
S. Sadeghi-Kohan, M. Kamal, J. McNeil, P. Prinetto, and Z. Navabi, “Online self adjusting progressive age monitoring of timing variations,” 2015, doi: 10.1109/dtis.2015.7127368.
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