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136 Publications


2013 | Misc | LibreCat-ID: 13075
Cook, A., Rodriguez Gomez, L., Hellebrand, S., Indlekofer, T., & Wunderlich, H.-J. (2013). Adaptive Test and Diagnosis of Intermittent Faults. 14th Latin American Test Workshop, Cordoba, Argentina.
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2013 | Conference Paper | LibreCat-ID: 12979
Hellebrand, S. (2013). Analyzing and Quantifying Fault Tolerance Properties. In {14th IEEE Latin American Test Workshop - (LATW’13)}. Cordoba, Argentina: {IEEE}. https://doi.org/10.1109/latw.2013.6562662
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2012 | Conference Paper | LibreCat-ID: 12980
Cook, A., Hellebrand, S., E. Imhof, M., Mumtaz, A., & Wunderlich, H.-J. (2012). Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test. In {13th IEEE Latin American Test Workshop (LATW’12)} (pp. 1–4). Quito, Ecuador: {IEEE}. https://doi.org/10.1109/latw.2012.6261229
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2012 | Conference Paper | LibreCat-ID: 12981
Cook, A., Hellebrand, S., & Wunderlich, H.-J. (2012). Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test. In {17th IEEE European Test Symposium (ETS’12)} (pp. 1–6). Annecy, France: {IEEE}. https://doi.org/10.1109/ets.2012.6233025
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2012 | Misc | LibreCat-ID: 13074
Cook, A., Hellebrand, S., & Wunderlich, H.-J. (2012). Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany.
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2011 | Conference Paper | LibreCat-ID: 12984
Polian, I., Becker, B., Hellebrand, S., Wunderlich, H.-J., & Maxwell, P. (2011). Towards Variation-Aware Test Methods. In {16th IEEE European Test Symposium Trondheim (ETS’11),(Embedded Tutorial)}. Trondheim, Norway: {IEEE}. https://doi.org/10.1109/ets.2011.51
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2011 | Journal Article | LibreCat-ID: 13052
Hopsch, F., Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., & Wunderlich, H.-J. (2011). Variation-Aware Fault Modeling. {SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer}, 54(4), 1813–1826.
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2011 | Conference Paper | LibreCat-ID: 13053
Cook, A., Hellebrand, S., Indlekofer, T., & Wunderlich, H.-J. (2011). Robuster Selbsttest mit Diagnose. In {5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf”} (pp. 48–53). Hamburg, Germany.
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2011 | Conference Paper | LibreCat-ID: 12982
Cook, A., Hellebrand, S., Indlekofer, T., & Wunderlich, H.-J. (2011). Diagnostic Test of Robust Circuits. In {20th IEEE Asian Test Symposium (ATS’11)} (pp. 285–290). New Delhi, India: {IEEE}. https://doi.org/10.1109/ats.2011.55
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2010 | Conference Paper | LibreCat-ID: 12983
Hopsch, F., Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., & Wunderlich, H.-J. (2010). Variation-Aware Fault Modeling. In {19th IEEE Asian Test Symposium (ATS’10)} (pp. 87–93). Shanghai, China: {IEEE}. https://doi.org/10.1109/ats.2010.24
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2010 | Conference Paper | LibreCat-ID: 12988
Froese, V., Ibers, R., & Hellebrand, S. (2010). Reusing NoC-Infrastructure for Test Data Compression. In {28th IEEE VLSI Test Symposium (VTS’10)} (pp. 227–231). Santa Cruz, CA, USA: {IEEE}. https://doi.org/10.1109/vts.2010.5469570
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2010 | Conference Paper | LibreCat-ID: 13049
Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., & Wunderlich, H.-J. (2010). Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. In {4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}. Chicago, IL, USA.
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2010 | Conference Paper | LibreCat-ID: 13051
Hunger, M., & Hellebrand, S. (2010). Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz. In 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf” (pp. 81–88). Wildbad Kreuth, Germany.
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2010 | Conference Paper | LibreCat-ID: 12985
Indlekofer, T., Schnittger, M., & Hellebrand, S. (2010). Efficient Test Response Compaction for Robust BIST Using Parity Sequences. In {28th IEEE International Conference on Computer Design (ICCD’10)} (pp. 480–485). Amsterdam, The Netherlands: {IEEE}. https://doi.org/10.1109/iccd.2010.5647648
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2010 | Conference Paper | LibreCat-ID: 12986
Hunger, M., & Hellebrand, S. (2010). The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems. In {25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)} (pp. 101–108). Kyoto, Japan: {IEEE}. https://doi.org/10.1109/dft.2010.19
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2010 | Misc | LibreCat-ID: 10670
Fröse, V., Ibers, R., & Hellebrand, S. (2010). Testdatenkompression mit Hilfe der Netzwerkinfrastruktur. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany.
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2010 | Misc | LibreCat-ID: 13073
Hellebrand, S. (2010). Nano-Electronic Systems. Editorial, it 4/2010, pp. 179-180.
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2010 | Conference Paper | LibreCat-ID: 12987
Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., & Wunderlich, H.-J. (2010). Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. In {40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)}. Chicago, IL, USA: {IEEE}. https://doi.org/10.1109/dsnw.2010.5542612
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2010 | Conference Paper | LibreCat-ID: 13050
Indlekofer, T., Schnittger, M., & Hellebrand, S. (2010). Robuster Selbsttest mit extremer Kompaktierung. In {4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”} (pp. 17–24). Wildbad Kreuth, Germany.
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2009 | Conference Paper | LibreCat-ID: 12990
Hellebrand, S., & Hunger, M. (2009). Are Robust Circuits Really Robust? In {24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk)} (p. 77). Chicago, IL, USA: {IEEE}. https://doi.org/10.1109/dft.2009.28
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