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136 Publications


2013 | Misc | LibreCat-ID: 13075
Cook, Alejandro, Laura Rodriguez Gomez, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. Adaptive Test and Diagnosis of Intermittent Faults. 14th Latin American Test Workshop, Cordoba, Argentina, 2013.
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2013 | Conference Paper | LibreCat-ID: 12979
Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.” In {14th IEEE Latin American Test Workshop - (LATW’13)}. Cordoba, Argentina: {IEEE}, 2013. https://doi.org/10.1109/latw.2013.6562662.
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2012 | Conference Paper | LibreCat-ID: 12980
Cook, Alejandro, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” In {13th IEEE Latin American Test Workshop (LATW’12)}, 1–4. Quito, Ecuador: {IEEE}, 2012. https://doi.org/10.1109/latw.2012.6261229.
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2012 | Conference Paper | LibreCat-ID: 12981
Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.” In {17th IEEE European Test Symposium (ETS’12)}, 1–6. Annecy, France: {IEEE}, 2012. https://doi.org/10.1109/ets.2012.6233025.
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2012 | Misc | LibreCat-ID: 13074
Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.
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2011 | Conference Paper | LibreCat-ID: 12984
Polian, Ilia, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, and Peter Maxwell. “Towards Variation-Aware Test Methods.” In {16th IEEE European Test Symposium Trondheim (ETS’11),(Embedded Tutorial)}. Trondheim, Norway: {IEEE}, 2011. https://doi.org/10.1109/ets.2011.51.
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2011 | Journal Article | LibreCat-ID: 13052
Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” {SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer} 54, no. 4 (2011): 1813–26.
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2011 | Conference Paper | LibreCat-ID: 13053
Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Robuster Selbsttest Mit Diagnose.” In {5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf”}, 48–53. Hamburg, Germany, 2011.
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2011 | Conference Paper | LibreCat-ID: 12982
Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Diagnostic Test of Robust Circuits.” In {20th IEEE Asian Test Symposium (ATS’11)}, 285–90. New Delhi, India: {IEEE}, 2011. https://doi.org/10.1109/ats.2011.55.
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2010 | Conference Paper | LibreCat-ID: 12983
Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” In {19th IEEE Asian Test Symposium (ATS’10)}, 87–93. Shanghai, China: {IEEE}, 2010. https://doi.org/10.1109/ats.2010.24.
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2010 | Conference Paper | LibreCat-ID: 12988
Froese, Viktor, Rüdiger Ibers, and Sybille Hellebrand. “Reusing NoC-Infrastructure for Test Data Compression.” In {28th IEEE VLSI Test Symposium (VTS’10)}, 227–31. Santa Cruz, CA, USA: {IEEE}, 2010. https://doi.org/10.1109/vts.2010.5469570.
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2010 | Conference Paper | LibreCat-ID: 13049
Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In {4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}. Chicago, IL, USA, 2010.
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2010 | Conference Paper | LibreCat-ID: 13051
Hunger, Marc, and Sybille Hellebrand. “Ausbeute Und Fehlertoleranz Bei Dreifach Modularer Redundanz.” In 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 81–88. Wildbad Kreuth, Germany, 2010.
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2010 | Conference Paper | LibreCat-ID: 12985
Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” In {28th IEEE International Conference on Computer Design (ICCD’10)}, 480–85. Amsterdam, The Netherlands: {IEEE}, 2010. https://doi.org/10.1109/iccd.2010.5647648.
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2010 | Conference Paper | LibreCat-ID: 12986
Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” In {25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)}, 101–8. Kyoto, Japan: {IEEE}, 2010. https://doi.org/10.1109/dft.2010.19.
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2010 | Misc | LibreCat-ID: 10670
Fröse, Viktor, Rüdiger Ibers, and Sybille Hellebrand. Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.
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2010 | Misc | LibreCat-ID: 13073
Hellebrand, Sybille. Nano-Electronic Systems. Editorial, it 4/2010, pp. 179-180, 2010.
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2010 | Conference Paper | LibreCat-ID: 12987
Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In {40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)}. Chicago, IL, USA: {IEEE}, 2010. https://doi.org/10.1109/dsnw.2010.5542612.
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2010 | Conference Paper | LibreCat-ID: 13050
Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Robuster Selbsttest Mit Extremer Kompaktierung.” In {4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf”}, 17–24. Wildbad Kreuth, Germany, 2010.
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2009 | Conference Paper | LibreCat-ID: 12990
Hellebrand, Sybille, and Marc Hunger. “Are Robust Circuits Really Robust?” In {24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk)}, 77. Chicago, IL, USA: {IEEE}, 2009. https://doi.org/10.1109/dft.2009.28.
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