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167 Publications
2013 | Conference Paper | LibreCat-ID: 46271
Sadeghi-Kohan, Somayeh, et al. “BS 1149.1 Extensions for an Online Interconnect Fault Detection and Recovery.” 2012 IEEE International Test Conference, IEEE, 2013, doi:10.1109/test.2012.6401583.
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| DOI
2013 | Conference Paper | LibreCat-ID: 46270
Sadeghi-Kohan, Somayeh, et al. “A New Structure for Interconnect Offline Testing.” East-West Design & Test Symposium (EWDTS 2013), IEEE, 2013, doi:10.1109/ewdts.2013.6673207.
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| DOI
2012 | Conference Paper | LibreCat-ID: 12980
Cook, Alejandro, et al. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” 13th IEEE Latin American Test Workshop (LATW’12), IEEE, 2012, pp. 1–4, doi:10.1109/latw.2012.6261229.
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| DOI
2012 | Conference Paper | LibreCat-ID: 12981
Cook, Alejandro, et al. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.” 17th IEEE European Test Symposium (ETS’12), IEEE, 2012, pp. 1–6, doi:10.1109/ets.2012.6233025.
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| DOI
2012 | Misc | LibreCat-ID: 13074
Cook, Alejandro, et al. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 2012.
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2011 | Conference Paper | LibreCat-ID: 12982
Cook, Alejandro, et al. “Diagnostic Test of Robust Circuits.” 20th IEEE Asian Test Symposium (ATS’11), IEEE, 2011, pp. 285–90, doi:10.1109/ats.2011.55.
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| DOI
2011 | Conference Paper | LibreCat-ID: 12984
Polian, Ilia, et al. “Towards Variation-Aware Test Methods.” 16th IEEE European Test Symposium Trondheim (ETS’11), IEEE, 2011, doi:10.1109/ets.2011.51.
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| DOI
2011 | Conference Paper | LibreCat-ID: 13053
Cook, Alejandro, et al. “Robuster Selbsttest Mit Diagnose.” 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,” 2011, pp. 48–53.
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2011 | Journal Article | LibreCat-ID: 13052
Hopsch, Fabian, et al. “Variation-Aware Fault Modeling.” SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer, vol. 54, no. 4, 2011, pp. 1813–26.
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2011 | Conference Paper | LibreCat-ID: 46272
Kamran, Arezoo, et al. “Virtual Tester Development Using HDL/PLI.” 2010 East-West Design & Test Symposium (EWDTS), IEEE, 2011, doi:10.1109/ewdts.2010.5742156.
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| DOI
2010 | Misc | LibreCat-ID: 10670
Fröse, Viktor, et al. Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur. 2010.
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2010 | Conference Paper | LibreCat-ID: 12987
Becker, Bernd, et al. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10), IEEE, 2010, doi:10.1109/dsnw.2010.5542612.
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| DOI
2010 | Conference Paper | LibreCat-ID: 13051
Hunger, Marc, and Sybille Hellebrand. “Ausbeute Und Fehlertoleranz Bei Dreifach Modularer Redundanz.” 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2010, pp. 81–88.
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2010 | Conference Paper | LibreCat-ID: 12983
Hopsch, Fabian, et al. “Variation-Aware Fault Modeling.” 19th IEEE Asian Test Symposium (ATS’10), IEEE, 2010, pp. 87–93, doi:10.1109/ats.2010.24.
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| DOI
2010 | Conference Paper | LibreCat-ID: 12985
Indlekofer, Thomas, et al. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” 28th IEEE International Conference on Computer Design (ICCD’10), IEEE, 2010, pp. 480–85, doi:10.1109/iccd.2010.5647648.
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| DOI
2010 | Conference Paper | LibreCat-ID: 12986
Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), IEEE, 2010, pp. 101–08, doi:10.1109/dft.2010.19.
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| DOI
2010 | Conference Paper | LibreCat-ID: 12988
Froese, Viktor, et al. “Reusing NoC-Infrastructure for Test Data Compression.” 28th IEEE VLSI Test Symposium (VTS’10), IEEE, 2010, pp. 227–31, doi:10.1109/vts.2010.5469570.
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| DOI
2010 | Conference Paper | LibreCat-ID: 13049
Becker, Bernd, et al. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper), 2010.
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2010 | Conference Paper | LibreCat-ID: 13050
Indlekofer, Thomas, et al. “Robuster Selbsttest Mit Extremer Kompaktierung.” 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2010, pp. 17–24.
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