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1547 Publications
2002 | Journal Article | LibreCat-ID: 39879
Horstmann JT, Hilleringmann U, Goser K. 1/f-Noise of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique. Microelectronic Engineering. 2002;53(1-4):213-216. doi:10.1016/s0167-9317(00)00299-9
LibreCat
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2002 | Journal Article | LibreCat-ID: 39919
Hilleringmann U, Knospe K, Heite C, Schumacher K, Goser K. A silicon based technology for monolithic integration of waveguides and VLSI CMOS circuits. Microelectronic Engineering. 2002;15(1-4):289-292. doi:10.1016/0167-9317(91)90231-2
LibreCat
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2002 | Journal Article | LibreCat-ID: 39926
Goser K, Hilleringmann U, Rueckert U, Schumacher K. VLSI technologies for artificial neural networks. IEEE Micro. 2002;9(6):28-44. doi:10.1109/40.42985
LibreCat
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2002 | Journal Article | LibreCat-ID: 39920
Soennecken A, Hilleringmann U, Goser K. Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica. Microelectronic Engineering. 2002;15(1-4):633-636. doi:10.1016/0167-9317(91)90299-s
LibreCat
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2002 | Journal Article | LibreCat-ID: 39915
Hilleringmann U, Goser K. Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering. 2002;19(1-4):211-214. doi:10.1016/0167-9317(92)90425-q
LibreCat
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2002 | Journal Article | LibreCat-ID: 39916
Adams S, Hilleringmann U, Goser K. CMOS compatible micromachining by dry silicon-etching techniques. Microelectronic Engineering. 2002;19(1-4):191-194. doi:10.1016/0167-9317(92)90420-v
LibreCat
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2002 | Journal Article | LibreCat-ID: 39348
Horstmann JT, Hilleringmann U, Goser KF. Matching analysis of deposition defined 50-nm MOSFET’s. IEEE Transactions on Electron Devices. 2002;45(1):299-306. doi:10.1109/16.658845
LibreCat
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2002 | Journal Article | LibreCat-ID: 39889
Mankowski V, Hilleringmann U, Schumacher K. 12 kV low current cascaded light triggered switch on one silicon chip. Microelectronic Engineering. 2002;46(1-4):413-417. doi:10.1016/s0167-9317(99)00122-7
LibreCat
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2002 | Journal Article | LibreCat-ID: 39891
Horstmann JT, Hilleringmann U, Goser KF. Matching analysis of deposition defined 50-nm MOSFET’s. IEEE Transactions on Electron Devices. 2002;45(1):299-306. doi:10.1109/16.658845
LibreCat
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2002 | Journal Article | LibreCat-ID: 39886
Wirth G, Hilleringmann U, Horstmann JT, Goser K. Mesoscopic transport phenomena in ultrashort channel MOSFETs. Solid-State Electronics. 2002;43(7):1245-1250. doi:10.1016/s0038-1101(99)00060-x
LibreCat
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2002 | Journal Article | LibreCat-ID: 39876
Otterbach R, Hilleringmann U, Horstmann TJ, Goser K. Structures with a minimum feature size of less than 100 nm in CVD-diamond for sensor applications. Diamond and Related Materials. 2002;10(3-7):511-514. doi:10.1016/s0925-9635(01)00373-9
LibreCat
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2002 | Journal Article | LibreCat-ID: 39877
Hilleringmann U, Vieregge T, Horstmann JT. A structure definition technique for 25 nm lines of silicon and related materials. Microelectronic Engineering. 2002;53(1-4):569-572. doi:10.1016/s0167-9317(00)00380-4
LibreCat
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2002 | Journal Article | LibreCat-ID: 39874
Otterbach R, Hilleringmann U. Reactive ion etching of CVD-diamond for piezoresistive pressure sensors. Diamond and Related Materials. 2002;11(3-6):841-844. doi:10.1016/s0925-9635(01)00703-8
LibreCat
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2002 | Journal Article | LibreCat-ID: 45307
Mahnken R. Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity. Computer Methods in Applied Mechanics and Engineering. 2002;190(39):5057-5080. doi:10.1016/s0045-7825(00)00364-9
LibreCat
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2002 | Journal Article | LibreCat-ID: 45413
Mahnken R, Steinmann P. A finite element algorithm for parameter identification of material models for fluid saturated porous media. International Journal for Numerical and Analytical Methods in Geomechanics. 2002;25(5):415-434. doi:10.1002/nag.136
LibreCat
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2002 | Journal Article | LibreCat-ID: 45412
Mahnken R, Kohlmeier M. Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation. Computer Methods in Applied Mechanics and Engineering. 2002;190(32-33):4259-4278. doi:10.1016/s0045-7825(00)00317-0
LibreCat
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2002 | Journal Article | LibreCat-ID: 45418
Mahnken R, Tikhomirov D, Stein E. Implicit integration scheme and its consistent linearization for an elastoplastic-damage model with application to concrete. Computers & Structures. 2002;75(2):135-143. doi:10.1016/s0045-7949(99)00089-9
LibreCat
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2002 | Journal Article | LibreCat-ID: 45423
Mahnken R. Improved implementation of an algorithm for non-linear isotropic/kinematic hardening in elastoplasticity. Communications in Numerical Methods in Engineering. 2002;15(10):745-754. doi:10.1002/(sici)1099-0887(199910)15:10<745::aid-cnm288>3.0.co;2-r
LibreCat
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2002 | Journal Article | LibreCat-ID: 45417
Döbert C, Mahnken R, Stein E. Numerical simulation of interface debonding with a combined damage/friction constitutive model. Computational Mechanics. 2002;25(5):456-467. doi:10.1007/s004660050493
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 45422
Mahnken R. A comprehensive study of a multiplicative elastoplasticity model coupled to damage including parameter identification. Computers & Structures. 2002;74(2):179-200. doi:10.1016/s0045-7949(98)00296-x
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