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1547 Publications
2002 | Journal Article | LibreCat-ID: 39879
Horstmann, J. T., Hilleringmann, U., & Goser, K. (2002). 1/f-Noise of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique. Microelectronic Engineering, 53(1–4), 213–216. https://doi.org/10.1016/s0167-9317(00)00299-9
LibreCat
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2002 | Journal Article | LibreCat-ID: 39919
Hilleringmann, U., Knospe, K., Heite, C., Schumacher, K., & Goser, K. (2002). A silicon based technology for monolithic integration of waveguides and VLSI CMOS circuits. Microelectronic Engineering, 15(1–4), 289–292. https://doi.org/10.1016/0167-9317(91)90231-2
LibreCat
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2002 | Journal Article | LibreCat-ID: 39926
Goser, K., Hilleringmann, U., Rueckert, U., & Schumacher, K. (2002). VLSI technologies for artificial neural networks. IEEE Micro, 9(6), 28–44. https://doi.org/10.1109/40.42985
LibreCat
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2002 | Journal Article | LibreCat-ID: 39920
Soennecken, A., Hilleringmann, U., & Goser, K. (2002). Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica. Microelectronic Engineering, 15(1–4), 633–636. https://doi.org/10.1016/0167-9317(91)90299-s
LibreCat
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2002 | Journal Article | LibreCat-ID: 39915
Hilleringmann, U., & Goser, K. (2002). Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering, 19(1–4), 211–214. https://doi.org/10.1016/0167-9317(92)90425-q
LibreCat
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2002 | Journal Article | LibreCat-ID: 39916
Adams, S., Hilleringmann, U., & Goser, K. (2002). CMOS compatible micromachining by dry silicon-etching techniques. Microelectronic Engineering, 19(1–4), 191–194. https://doi.org/10.1016/0167-9317(92)90420-v
LibreCat
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2002 | Journal Article | LibreCat-ID: 39348
Horstmann, J. T., Hilleringmann, U., & Goser, K. F. (2002). Matching analysis of deposition defined 50-nm MOSFET’s. IEEE Transactions on Electron Devices, 45(1), 299–306. https://doi.org/10.1109/16.658845
LibreCat
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2002 | Journal Article | LibreCat-ID: 39889
Mankowski, V., Hilleringmann, U., & Schumacher, K. (2002). 12 kV low current cascaded light triggered switch on one silicon chip. Microelectronic Engineering, 46(1–4), 413–417. https://doi.org/10.1016/s0167-9317(99)00122-7
LibreCat
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2002 | Journal Article | LibreCat-ID: 39891
Horstmann, J. T., Hilleringmann, U., & Goser, K. F. (2002). Matching analysis of deposition defined 50-nm MOSFET’s. IEEE Transactions on Electron Devices, 45(1), 299–306. https://doi.org/10.1109/16.658845
LibreCat
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2002 | Journal Article | LibreCat-ID: 39886
Wirth, G., Hilleringmann, U., Horstmann, J. T., & Goser, K. (2002). Mesoscopic transport phenomena in ultrashort channel MOSFETs. Solid-State Electronics, 43(7), 1245–1250. https://doi.org/10.1016/s0038-1101(99)00060-x
LibreCat
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2002 | Journal Article | LibreCat-ID: 39876
Otterbach, R., Hilleringmann, U., Horstmann, T. J., & Goser, K. (2002). Structures with a minimum feature size of less than 100 nm in CVD-diamond for sensor applications. Diamond and Related Materials, 10(3–7), 511–514. https://doi.org/10.1016/s0925-9635(01)00373-9
LibreCat
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2002 | Journal Article | LibreCat-ID: 39877
Hilleringmann, U., Vieregge, T., & Horstmann, J. T. (2002). A structure definition technique for 25 nm lines of silicon and related materials. Microelectronic Engineering, 53(1–4), 569–572. https://doi.org/10.1016/s0167-9317(00)00380-4
LibreCat
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2002 | Journal Article | LibreCat-ID: 39874
Otterbach, R., & Hilleringmann, U. (2002). Reactive ion etching of CVD-diamond for piezoresistive pressure sensors. Diamond and Related Materials, 11(3–6), 841–844. https://doi.org/10.1016/s0925-9635(01)00703-8
LibreCat
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2002 | Journal Article | LibreCat-ID: 45307
Mahnken, R. (2002). Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity. Computer Methods in Applied Mechanics and Engineering, 190(39), 5057–5080. https://doi.org/10.1016/s0045-7825(00)00364-9
LibreCat
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2002 | Journal Article | LibreCat-ID: 45413
Mahnken, R., & Steinmann, P. (2002). A finite element algorithm for parameter identification of material models for fluid saturated porous media. International Journal for Numerical and Analytical Methods in Geomechanics, 25(5), 415–434. https://doi.org/10.1002/nag.136
LibreCat
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2002 | Journal Article | LibreCat-ID: 45412
Mahnken, R., & Kohlmeier, M. (2002). Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation. Computer Methods in Applied Mechanics and Engineering, 190(32–33), 4259–4278. https://doi.org/10.1016/s0045-7825(00)00317-0
LibreCat
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2002 | Journal Article | LibreCat-ID: 45418
Mahnken, R., Tikhomirov, D., & Stein, E. (2002). Implicit integration scheme and its consistent linearization for an elastoplastic-damage model with application to concrete. Computers & Structures, 75(2), 135–143. https://doi.org/10.1016/s0045-7949(99)00089-9
LibreCat
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2002 | Journal Article | LibreCat-ID: 45423
Mahnken, R. (2002). Improved implementation of an algorithm for non-linear isotropic/kinematic hardening in elastoplasticity. Communications in Numerical Methods in Engineering, 15(10), 745–754. https://doi.org/10.1002/(sici)1099-0887(199910)15:10<745::aid-cnm288>3.0.co;2-r
LibreCat
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2002 | Journal Article | LibreCat-ID: 45417
Döbert, C., Mahnken, R., & Stein, E. (2002). Numerical simulation of interface debonding with a combined damage/friction constitutive model. Computational Mechanics, 25(5), 456–467. https://doi.org/10.1007/s004660050493
LibreCat
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2002 | Journal Article | LibreCat-ID: 45422
Mahnken, R. (2002). A comprehensive study of a multiplicative elastoplasticity model coupled to damage including parameter identification. Computers & Structures, 74(2), 179–200. https://doi.org/10.1016/s0045-7949(98)00296-x
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