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1546 Publications
2002 | Journal Article | LibreCat-ID: 39919
A silicon based technology for monolithic integration of waveguides and VLSI CMOS circuits
U. Hilleringmann, K. Knospe, C. Heite, K. Schumacher, K. Goser, Microelectronic Engineering 15 (2002) 289–292.
LibreCat
| DOI
U. Hilleringmann, K. Knospe, C. Heite, K. Schumacher, K. Goser, Microelectronic Engineering 15 (2002) 289–292.
2002 | Journal Article | LibreCat-ID: 39926
VLSI technologies for artificial neural networks
K. Goser, U. Hilleringmann, U. Rueckert, K. Schumacher, IEEE Micro 9 (2002) 28–44.
LibreCat
| DOI
K. Goser, U. Hilleringmann, U. Rueckert, K. Schumacher, IEEE Micro 9 (2002) 28–44.
2002 | Journal Article | LibreCat-ID: 39920
Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica
A. Soennecken, U. Hilleringmann, K. Goser, Microelectronic Engineering 15 (2002) 633–636.
LibreCat
| DOI
A. Soennecken, U. Hilleringmann, K. Goser, Microelectronic Engineering 15 (2002) 633–636.
2002 | Journal Article | LibreCat-ID: 39915
Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon
U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 211–214.
LibreCat
| DOI
U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 211–214.
2002 | Journal Article | LibreCat-ID: 39916
CMOS compatible micromachining by dry silicon-etching techniques
S. Adams, U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 191–194.
LibreCat
| DOI
S. Adams, U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 191–194.
2002 | Journal Article | LibreCat-ID: 39348
Matching analysis of deposition defined 50-nm MOSFET's
J.T. Horstmann, U. Hilleringmann, K.F. Goser, IEEE Transactions on Electron Devices 45 (2002) 299–306.
LibreCat
| DOI
J.T. Horstmann, U. Hilleringmann, K.F. Goser, IEEE Transactions on Electron Devices 45 (2002) 299–306.
2002 | Journal Article | LibreCat-ID: 39889
12 kV low current cascaded light triggered switch on one silicon chip
V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering 46 (2002) 413–417.
LibreCat
| DOI
V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering 46 (2002) 413–417.
2002 | Journal Article | LibreCat-ID: 39891
Matching analysis of deposition defined 50-nm MOSFET's
J.T. Horstmann, U. Hilleringmann, K.F. Goser, IEEE Transactions on Electron Devices 45 (2002) 299–306.
LibreCat
| DOI
J.T. Horstmann, U. Hilleringmann, K.F. Goser, IEEE Transactions on Electron Devices 45 (2002) 299–306.
2002 | Journal Article | LibreCat-ID: 39886
Mesoscopic transport phenomena in ultrashort channel MOSFETs
G. Wirth, U. Hilleringmann, J.T. Horstmann, K. Goser, Solid-State Electronics 43 (2002) 1245–1250.
LibreCat
| DOI
G. Wirth, U. Hilleringmann, J.T. Horstmann, K. Goser, Solid-State Electronics 43 (2002) 1245–1250.
2002 | Journal Article | LibreCat-ID: 39876
Structures with a minimum feature size of less than 100 nm in CVD-diamond for sensor applications
R. Otterbach, U. Hilleringmann, T.J. Horstmann, K. Goser, Diamond and Related Materials 10 (2002) 511–514.
LibreCat
| DOI
R. Otterbach, U. Hilleringmann, T.J. Horstmann, K. Goser, Diamond and Related Materials 10 (2002) 511–514.
2002 | Journal Article | LibreCat-ID: 39877
A structure definition technique for 25 nm lines of silicon and related materials
U. Hilleringmann, T. Vieregge, J.T. Horstmann, Microelectronic Engineering 53 (2002) 569–572.
LibreCat
| DOI
U. Hilleringmann, T. Vieregge, J.T. Horstmann, Microelectronic Engineering 53 (2002) 569–572.
2002 | Journal Article | LibreCat-ID: 39874
Reactive ion etching of CVD-diamond for piezoresistive pressure sensors
R. Otterbach, U. Hilleringmann, Diamond and Related Materials 11 (2002) 841–844.
LibreCat
| DOI
R. Otterbach, U. Hilleringmann, Diamond and Related Materials 11 (2002) 841–844.
2002 | Journal Article | LibreCat-ID: 45307
Strength difference in compression and tension and pressure dependence of yielding in elasto-plasticity
R. Mahnken, Computer Methods in Applied Mechanics and Engineering 190 (2002) 5057–5080.
LibreCat
| DOI
R. Mahnken, Computer Methods in Applied Mechanics and Engineering 190 (2002) 5057–5080.
2002 | Journal Article | LibreCat-ID: 45413
A finite element algorithm for parameter identification of material models for fluid saturated porous media
R. Mahnken, P. Steinmann, International Journal for Numerical and Analytical Methods in Geomechanics 25 (2002) 415–434.
LibreCat
| DOI
R. Mahnken, P. Steinmann, International Journal for Numerical and Analytical Methods in Geomechanics 25 (2002) 415–434.
2002 | Journal Article | LibreCat-ID: 45412
Finite element simulation for rock salt with dilatancy boundary coupled to fluid permeation
R. Mahnken, M. Kohlmeier, Computer Methods in Applied Mechanics and Engineering 190 (2002) 4259–4278.
LibreCat
| DOI
R. Mahnken, M. Kohlmeier, Computer Methods in Applied Mechanics and Engineering 190 (2002) 4259–4278.
2002 | Journal Article | LibreCat-ID: 45418
Implicit integration scheme and its consistent linearization for an elastoplastic-damage model with application to concrete
R. Mahnken, D. Tikhomirov, E. Stein, Computers & Structures 75 (2002) 135–143.
LibreCat
| DOI
R. Mahnken, D. Tikhomirov, E. Stein, Computers & Structures 75 (2002) 135–143.
2002 | Journal Article | LibreCat-ID: 45423
Improved implementation of an algorithm for non-linear isotropic/kinematic hardening in elastoplasticity
R. Mahnken, Communications in Numerical Methods in Engineering 15 (2002) 745–754.
LibreCat
| DOI
R. Mahnken, Communications in Numerical Methods in Engineering 15 (2002) 745–754.
2002 | Journal Article | LibreCat-ID: 45417
Numerical simulation of interface debonding with a combined damage/friction constitutive model
C. Döbert, R. Mahnken, E. Stein, Computational Mechanics 25 (2002) 456–467.
LibreCat
| DOI
C. Döbert, R. Mahnken, E. Stein, Computational Mechanics 25 (2002) 456–467.
2002 | Journal Article | LibreCat-ID: 45422
A comprehensive study of a multiplicative elastoplasticity model coupled to damage including parameter identification
R. Mahnken, Computers & Structures 74 (2002) 179–200.
LibreCat
| DOI
R. Mahnken, Computers & Structures 74 (2002) 179–200.
2002 | Journal Article | LibreCat-ID: 45424
Parameter identification of gradient enhanced damage models with the finite element method
R. Mahnken, E. Kuhl, European Journal of Mechanics - A/Solids 18 (2002) 819–835.
LibreCat
| DOI
R. Mahnken, E. Kuhl, European Journal of Mechanics - A/Solids 18 (2002) 819–835.