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165 Publications
2023 | Conference Paper | LibreCat-ID: 45830
H. Jafarzadeh et al., “Robust Pattern Generation for Small Delay Faults under Process Variations,” presented at the IEEE International Test Conference (ITC’23), Anaheim, USA, 2023.
LibreCat
2022 | Journal Article | LibreCat-ID: 29351
S. Sadeghi-Kohan, S. Hellebrand, and H.-J. Wunderlich, “Stress-Aware Periodic Test of Interconnects,” Journal of Electronic Testing, 2022, doi: 10.1007/s10836-021-05979-5.
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2022 | Misc | LibreCat-ID: 29890
S. Sadeghi-Kohan, S. Hellebrand, and H.-J. Wunderlich, EM-Aware Interconnect BIST. Online: European Workshop on Silicon Lifecycle Management, March 18, 2022, 2022.
LibreCat
2020 | Conference Paper | LibreCat-ID: 19422
A. Sprenger, S. Sadeghi-Kohan, J. D. Reimer, and S. Hellebrand, “Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study,” 2020.
LibreCat
2020 | Misc | LibreCat-ID: 15419
S. Sadeghi-Kohan and S. Hellebrand, Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects. Ludwigsburg: 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, 2020.
LibreCat
2020 | Conference Paper | LibreCat-ID: 29200
S. Sadeghi-Kohan and S. Hellebrand, “Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects,” 2020, doi: 10.1109/vts48691.2020.9107591.
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2020 | Conference Paper | LibreCat-ID: 19421
S. Holst et al., “Logic Fault Diagnosis of Hidden Delay Defects,” 2020.
LibreCat
2019 | Misc | LibreCat-ID: 8112
M. U. Maaz, A. Sprenger, and S. Hellebrand, A Hybrid Space Compactor for Varying X-Rates. Prien am Chiemsee: 31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19), 2019.
LibreCat
2019 | Journal Article | LibreCat-ID: 13048
M. Kampmann, M. A. Kochte, C. Liu, E. Schneider, S. Hellebrand, and H.-J. Wunderlich, “Built-in Test for Hidden Delay Faults,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), vol. 38, no. 10, pp. 1956–1968, 2019.
LibreCat
2019 | Conference Paper | LibreCat-ID: 12918
M. U. Maaz, A. Sprenger, and S. Hellebrand, “A Hybrid Space Compactor for Adaptive X-Handling,” in 50th IEEE International Test Conference (ITC), Washington, DC, USA, 2019, pp. 1–8.
LibreCat
2018 | Misc | LibreCat-ID: 4576
A. Sprenger and S. Hellebrand, Stochastische Kompaktierung für den Hochgeschwindigkeitstest. Freiburg, Germany: 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), 2018.
LibreCat
2018 | Journal Article | LibreCat-ID: 13057
M. Kampmann and S. Hellebrand, “Design For Small Delay Test - A Simulation Study,” Microelectronics Reliability, vol. 80, pp. 124–133, 2018.
LibreCat
2018 | Misc | LibreCat-ID: 13072
M. Kampmann and S. Hellebrand, Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test. 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China, 2018.
LibreCat
2018 | Conference Paper | LibreCat-ID: 29460
R. Rezaeizadeh Rookerd, S. Sadeghi-Kohan, and Z. Navabi, “Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture,” 2018, doi: 10.1145/3194554.3194599.
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2018 | Conference Paper | LibreCat-ID: 4575
A. Sprenger and S. Hellebrand, “Tuning Stochastic Space Compaction to Faster-than-at-Speed Test,” 2018, doi: 10.1109/ddecs.2018.00020.
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2018 | Conference Paper | LibreCat-ID: 10575
C. Liu, E. Schneider, M. Kampmann, S. Hellebrand, and H.-J. Wunderlich, “Extending Aging Monitors for Early Life and Wear-Out Failure Prevention,” 2018, doi: 10.1109/ats.2018.00028.
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| DOI
2018 | Conference Paper | LibreCat-ID: 29459
S. Sadeghi-Kohan, A. Vafaei, and Z. Navabi, “Near-Optimal Node Selection Procedure for Aging Monitor Placement,” 2018, doi: 10.1109/iolts.2018.8474120.
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