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165 Publications
2019 | Conference Paper | LibreCat-ID: 12918
Maaz, Mohammad Urf, Alexander Sprenger, and Sybille Hellebrand. “A Hybrid Space Compactor for Adaptive X-Handling.” In 50th IEEE International Test Conference (ITC), 1–8. Washington, DC, USA: IEEE, 2019.
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2018 | Misc | LibreCat-ID: 4576
Sprenger, Alexander, and Sybille Hellebrand. Stochastische Kompaktierung für den Hochgeschwindigkeitstest. Freiburg, Germany: 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), 2018.
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2018 | Journal Article | LibreCat-ID: 12974
Hellebrand, Sybille, Joerg Henkel, Anand Raghunathan, and Hans-Joachim Wunderlich. “Guest Editors’ Introduction - Special Issue on Approximate Computing.” IEEE Embedded Systems Letters 10, no. 1 (2018): 1–1. https://doi.org/10.1109/les.2018.2789942.
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2018 | Journal Article | LibreCat-ID: 13057
Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test - A Simulation Study.” Microelectronics Reliability 80 (2018): 124–33.
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2018 | Misc | LibreCat-ID: 13072
Kampmann, Matthias, and Sybille Hellebrand. Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test. 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China, 2018.
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2018 | Conference Paper | LibreCat-ID: 29460
Rezaeizadeh Rookerd, Ramin, Somayeh Sadeghi-Kohan, and Zainalabedin Navabi. “Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture.” In Proceedings of the 2018 on Great Lakes Symposium on VLSI. ACM, 2018. https://doi.org/10.1145/3194554.3194599.
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2018 | Conference Paper | LibreCat-ID: 4575
Sprenger, Alexander, and Sybille Hellebrand. “Tuning Stochastic Space Compaction to Faster-than-at-Speed Test.” In 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS). Budapest, Hungary: IEEE, 2018. https://doi.org/10.1109/ddecs.2018.00020.
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2018 | Conference Paper | LibreCat-ID: 10575
Liu, Chang, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.” In 27th IEEE Asian Test Symposium (ATS’18), 2018. https://doi.org/10.1109/ats.2018.00028.
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2018 | Conference Paper | LibreCat-ID: 29459
Sadeghi-Kohan, Somayeh, Arash Vafaei, and Zainalabedin Navabi. “Near-Optimal Node Selection Procedure for Aging Monitor Placement.” In 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS). IEEE, 2018. https://doi.org/10.1109/iolts.2018.8474120.
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2017 | Conference Paper | LibreCat-ID: 12973
Deshmukh, Jyotirmoy, Wolfgang Kunz, Hans-Joachim Wunderlich, and Sybille Hellebrand. “Special Session on Early Life Failures.” In 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE, 2017. https://doi.org/10.1109/vts.2017.7928933.
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2017 | Misc | LibreCat-ID: 13078
Kampmann, Matthias, and Sybille Hellebrand. X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz. 29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.
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2017 | Conference Paper | LibreCat-ID: 10576
Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting X-Tolerant Compaction during Faster-than-at-Speed Test.” In 20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17). IEEE, 2017. https://doi.org/10.1109/ddecs.2017.7934564.
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2017 | Journal Article | LibreCat-ID: 29462
Sadeghi-Kohan, Somayeh, Mehdi Kamal, and Zainalabedin Navabi. “Self-Adjusting Monitor for Measuring Aging Rate and Advancement.” IEEE Transactions on Emerging Topics in Computing 8, no. 3 (2017): 627–41. https://doi.org/10.1109/tetc.2017.2771441.
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2017 | Conference Paper | LibreCat-ID: 29463
Jenihhin, Maksim, Alexander Kamkin, Zainalabedin Navabi, and Somayeh Sadeghi-Kohan. “Universal Mitigation of NBTI-Induced Aging by Design Randomization.” In 2016 IEEE East-West Design & Test Symposium (EWDTS). IEEE, 2017. https://doi.org/10.1109/ewdts.2016.7807635.
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2016 | Conference Paper | LibreCat-ID: 12975
Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test.” In 25th IEEE Asian Test Symposium (ATS’16), 1–6. Hiroshima, Japan: IEEE, 2016. https://doi.org/10.1109/ats.2016.20.
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2015 | Conference Paper | LibreCat-ID: 12976
Kampmann, Matthias, Michael A. Kochte, Eric Schneider, Thomas Indlekofer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Optimized Selection of Frequencies for Faster-Than-at-Speed Test.” In 24th IEEE Asian Test Symposium (ATS’15), 109–14. Mumbai, India: IEEE, 2015. https://doi.org/10.1109/ats.2015.26.
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2015 | Journal Article | LibreCat-ID: 13056
Huang, Zhengfeng, Huaguo Liang, and Sybille Hellebrand. “A High Performance SEU Tolerant Latch.” Journal of Electronic Testing - Theory and Applications (JETTA) 31, no. 4 (2015): 349–59.
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2015 | Misc | LibreCat-ID: 13077
Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael Kochte, Chang Liu, and Hans-Joachim Wunderlich. Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.
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2015 | Conference Paper | LibreCat-ID: 29465
Sadeghi-Kohan, Somayeh, Arezoo Kamran, Farnaz Forooghifar, and Zainalabedin Navabi. “Aging in Digital Circuits and Age Monitoring: Object-Oriented Modeling and Evaluation.” In 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE, 2015. https://doi.org/10.1109/dtis.2015.7127373.
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2015 | Conference Paper | LibreCat-ID: 29466
Sadeghi-Kohan, Somayeh, Mehdi Kamal, John McNeil, Paolo Prinetto, and Zain Navabi. “Online Self Adjusting Progressive Age Monitoring of Timing Variations.” In 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE, 2015. https://doi.org/10.1109/dtis.2015.7127368.
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2014 | Conference Paper | LibreCat-ID: 12977
Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, and Hans-Joachim Wunderlich. “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects.” In IEEE International Test Conference (ITC’14). Seattle, Washington, USA: IEEE, 2014. https://doi.org/10.1109/test.2014.7035360.
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2014 | Journal Article | LibreCat-ID: 13054
Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond Stuck-at Fault Testing.” DeGruyter Journal on Information Technology (It) 56, no. 4 (2014): 165–72.
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2014 | Journal Article | LibreCat-ID: 13055
Rodriguez Gomez, Laura, Alejandro Cook, Thomas Indlekofer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Adaptive Bayesian Diagnosis of Intermittent Faults.” Journal of Electronic Testing - Theory and Applications (JETTA) 30, no. 5 (2014): 527–40.
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2014 | Journal Article | LibreCat-ID: 46266
Alizadeh, Bijan, Payman Behnam, and Somayeh Sadeghi-Kohan. “A Scalable Formal Debugging Approach with Auto-Correction Capability Based on Static Slicing and Dynamic Ranking for RTL Datapath Designs.” IEEE Transactions on Computers, 2014, 1–1. https://doi.org/10.1109/tc.2014.2329687.
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2014 | Conference Paper | LibreCat-ID: 46268
Mohammadi, Marzieh, Somayeh Sadeghi-Kohan, Nasser Masoumi, and Zainalabedin Navabi. “An Off-Line MDSI Interconnect BIST Incorporated in BS 1149.1.” In 2014 19th IEEE European Test Symposium (ETS). IEEE, 2014. https://doi.org/10.1109/ets.2014.6847847.
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2014 | Conference Paper | LibreCat-ID: 46267
Sadeghi-Kohan, Somayeh, Payman Behnam, Bijan Alizadeh, Masahiro Fujita, and Zainalabedin Navabi. “Improving Polynomial Datapath Debugging with HEDs.” In 2014 19th IEEE European Test Symposium (ETS). IEEE, 2014. https://doi.org/10.1109/ets.2014.6847797.
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2013 | Conference Paper | LibreCat-ID: 12979
Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.” In 14th IEEE Latin American Test Workshop - (LATW’13). Cordoba, Argentina: IEEE, 2013. https://doi.org/10.1109/latw.2013.6562662.
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2013 | Misc | LibreCat-ID: 13075
Cook, Alejandro, Laura Rodriguez Gomez, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. Adaptive Test and Diagnosis of Intermittent Faults. 14th Latin American Test Workshop, Cordoba, Argentina, 2013.
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2013 | Conference Paper | LibreCat-ID: 46271
Sadeghi-Kohan, Somayeh, Majid Namaki-Shoushtari, Fatemeh Javaheri, and Zainalabedin Navabi. “BS 1149.1 Extensions for an Online Interconnect Fault Detection and Recovery.” In 2012 IEEE International Test Conference. IEEE, 2013. https://doi.org/10.1109/test.2012.6401583.
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2013 | Conference Paper | LibreCat-ID: 46270
Sadeghi-Kohan, Somayeh, Shahrzad Keshavarz, Farzaneh Zokaee, Farimah Farahmandi, and Zainalabedin Navabi. “A New Structure for Interconnect Offline Testing.” In East-West Design & Test Symposium (EWDTS 2013). IEEE, 2013. https://doi.org/10.1109/ewdts.2013.6673207.
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2012 | Conference Paper | LibreCat-ID: 12980
Cook, Alejandro, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” In 13th IEEE Latin American Test Workshop (LATW’12), 1–4. Quito, Ecuador: IEEE, 2012. https://doi.org/10.1109/latw.2012.6261229.
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2012 | Conference Paper | LibreCat-ID: 12981
Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.” In 17th IEEE European Test Symposium (ETS’12), 1–6. Annecy, France: IEEE, 2012. https://doi.org/10.1109/ets.2012.6233025.
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2012 | Misc | LibreCat-ID: 13074
Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.
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2011 | Conference Paper | LibreCat-ID: 12982
Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Diagnostic Test of Robust Circuits.” In 20th IEEE Asian Test Symposium (ATS’11), 285–90. New Delhi, India: IEEE, 2011. https://doi.org/10.1109/ats.2011.55.
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2011 | Conference Paper | LibreCat-ID: 12984
Polian, Ilia, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, and Peter Maxwell. “Towards Variation-Aware Test Methods.” In 16th IEEE European Test Symposium Trondheim (ETS’11). Trondheim, Norway: IEEE, 2011. https://doi.org/10.1109/ets.2011.51.
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2011 | Conference Paper | LibreCat-ID: 13053
Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Robuster Selbsttest Mit Diagnose.” In 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,” 48–53. Hamburg, Germany, 2011.
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2011 | Journal Article | LibreCat-ID: 13052
Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer 54, no. 4 (2011): 1813–26.
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2011 | Conference Paper | LibreCat-ID: 46272
Kamran, Arezoo, Nastaran Nemati, Somayeh Sadeghi-Kohan, and Zainalabedin Navabi. “Virtual Tester Development Using HDL/PLI.” In 2010 East-West Design & Test Symposium (EWDTS). IEEE, 2011. https://doi.org/10.1109/ewdts.2010.5742156.
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2010 | Misc | LibreCat-ID: 10670
Fröse, Viktor, Rüdiger Ibers, and Sybille Hellebrand. Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.
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2010 | Conference Paper | LibreCat-ID: 12987
Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10). Chicago, IL, USA: IEEE, 2010. https://doi.org/10.1109/dsnw.2010.5542612.
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2010 | Conference Paper | LibreCat-ID: 13051
Hunger, Marc, and Sybille Hellebrand. “Ausbeute Und Fehlertoleranz Bei Dreifach Modularer Redundanz.” In 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 81–88. Wildbad Kreuth, Germany, 2010.
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2010 | Misc | LibreCat-ID: 13073
Hellebrand, Sybille. Nano-Electronic Systems. Editorial, it 4/2010, pp. 179-180, 2010.
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2010 | Conference Paper | LibreCat-ID: 12983
Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” In 19th IEEE Asian Test Symposium (ATS’10), 87–93. Shanghai, China: IEEE, 2010. https://doi.org/10.1109/ats.2010.24.
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2010 | Conference Paper | LibreCat-ID: 12985
Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” In 28th IEEE International Conference on Computer Design (ICCD’10), 480–85. Amsterdam, The Netherlands: IEEE, 2010. https://doi.org/10.1109/iccd.2010.5647648.
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2010 | Conference Paper | LibreCat-ID: 12986
Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), 101–8. Kyoto, Japan: IEEE, 2010. https://doi.org/10.1109/dft.2010.19.
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2010 | Conference Paper | LibreCat-ID: 12988
Froese, Viktor, Rüdiger Ibers, and Sybille Hellebrand. “Reusing NoC-Infrastructure for Test Data Compression.” In 28th IEEE VLSI Test Symposium (VTS’10), 227–31. Santa Cruz, CA, USA: IEEE, 2010. https://doi.org/10.1109/vts.2010.5469570.
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2010 | Conference Paper | LibreCat-ID: 13049
Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper). Chicago, IL, USA, 2010.
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2010 | Conference Paper | LibreCat-ID: 13050
Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Robuster Selbsttest Mit Extremer Kompaktierung.” In 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 17–24. Wildbad Kreuth, Germany, 2010.
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2009 | Conference Paper | LibreCat-ID: 12991
Hunger, Marc, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, and Bernd Becker. “ATPG-Based Grading of Strong Fault-Secureness.” In 15th IEEE International On-Line Testing Symposium (IOLTS’09. Sesimbra-Lisbon, Portugal: IEEE, 2009. https://doi.org/10.1109/iolts.2009.5196027.
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2009 | Conference Paper | LibreCat-ID: 12990
Hellebrand, Sybille, and Marc Hunger. “Are Robust Circuits Really Robust?” In 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), 77. Chicago, IL, USA: IEEE, 2009. https://doi.org/10.1109/dft.2009.28.
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