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165 Publications
2019 | Conference Paper | LibreCat-ID: 12918
Maaz, Mohammad Urf, Alexander Sprenger, and Sybille Hellebrand. “A Hybrid Space Compactor for Adaptive X-Handling.” In 50th IEEE International Test Conference (ITC), 1–8. Washington, DC, USA: IEEE, 2019.
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2018 | Misc | LibreCat-ID: 4576
Sprenger, Alexander, and Sybille Hellebrand. Stochastische Kompaktierung für den Hochgeschwindigkeitstest. Freiburg, Germany: 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), 2018.
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2018 | Journal Article | LibreCat-ID: 12974
Hellebrand, Sybille, Joerg Henkel, Anand Raghunathan, and Hans-Joachim Wunderlich. “Guest Editors’ Introduction - Special Issue on Approximate Computing.” IEEE Embedded Systems Letters 10, no. 1 (2018): 1–1. https://doi.org/10.1109/les.2018.2789942.
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2018 | Journal Article | LibreCat-ID: 13057
Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test - A Simulation Study.” Microelectronics Reliability 80 (2018): 124–33.
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2018 | Misc | LibreCat-ID: 13072
Kampmann, Matthias, and Sybille Hellebrand. Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test. 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China, 2018.
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2018 | Conference Paper | LibreCat-ID: 29460
Rezaeizadeh Rookerd, Ramin, Somayeh Sadeghi-Kohan, and Zainalabedin Navabi. “Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture.” In Proceedings of the 2018 on Great Lakes Symposium on VLSI. ACM, 2018. https://doi.org/10.1145/3194554.3194599.
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2018 | Conference Paper | LibreCat-ID: 4575
Sprenger, Alexander, and Sybille Hellebrand. “Tuning Stochastic Space Compaction to Faster-than-at-Speed Test.” In 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS). Budapest, Hungary: IEEE, 2018. https://doi.org/10.1109/ddecs.2018.00020.
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2018 | Conference Paper | LibreCat-ID: 10575
Liu, Chang, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.” In 27th IEEE Asian Test Symposium (ATS’18), 2018. https://doi.org/10.1109/ats.2018.00028.
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2018 | Conference Paper | LibreCat-ID: 29459
Sadeghi-Kohan, Somayeh, Arash Vafaei, and Zainalabedin Navabi. “Near-Optimal Node Selection Procedure for Aging Monitor Placement.” In 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS). IEEE, 2018. https://doi.org/10.1109/iolts.2018.8474120.
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2017 | Conference Paper | LibreCat-ID: 12973
Deshmukh, Jyotirmoy, Wolfgang Kunz, Hans-Joachim Wunderlich, and Sybille Hellebrand. “Special Session on Early Life Failures.” In 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE, 2017. https://doi.org/10.1109/vts.2017.7928933.
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2017 | Misc | LibreCat-ID: 13078
Kampmann, Matthias, and Sybille Hellebrand. X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz. 29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.
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2017 | Conference Paper | LibreCat-ID: 10576
Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting X-Tolerant Compaction during Faster-than-at-Speed Test.” In 20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17). IEEE, 2017. https://doi.org/10.1109/ddecs.2017.7934564.
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2017 | Journal Article | LibreCat-ID: 29462
Sadeghi-Kohan, Somayeh, Mehdi Kamal, and Zainalabedin Navabi. “Self-Adjusting Monitor for Measuring Aging Rate and Advancement.” IEEE Transactions on Emerging Topics in Computing 8, no. 3 (2017): 627–41. https://doi.org/10.1109/tetc.2017.2771441.
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2017 | Conference Paper | LibreCat-ID: 29463
Jenihhin, Maksim, Alexander Kamkin, Zainalabedin Navabi, and Somayeh Sadeghi-Kohan. “Universal Mitigation of NBTI-Induced Aging by Design Randomization.” In 2016 IEEE East-West Design & Test Symposium (EWDTS). IEEE, 2017. https://doi.org/10.1109/ewdts.2016.7807635.
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2016 | Conference Paper | LibreCat-ID: 12975
Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test.” In 25th IEEE Asian Test Symposium (ATS’16), 1–6. Hiroshima, Japan: IEEE, 2016. https://doi.org/10.1109/ats.2016.20.
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2015 | Conference Paper | LibreCat-ID: 12976
Kampmann, Matthias, Michael A. Kochte, Eric Schneider, Thomas Indlekofer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Optimized Selection of Frequencies for Faster-Than-at-Speed Test.” In 24th IEEE Asian Test Symposium (ATS’15), 109–14. Mumbai, India: IEEE, 2015. https://doi.org/10.1109/ats.2015.26.
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2015 | Journal Article | LibreCat-ID: 13056
Huang, Zhengfeng, Huaguo Liang, and Sybille Hellebrand. “A High Performance SEU Tolerant Latch.” Journal of Electronic Testing - Theory and Applications (JETTA) 31, no. 4 (2015): 349–59.
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2015 | Misc | LibreCat-ID: 13077
Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael Kochte, Chang Liu, and Hans-Joachim Wunderlich. Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.
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2015 | Conference Paper | LibreCat-ID: 29465
Sadeghi-Kohan, Somayeh, Arezoo Kamran, Farnaz Forooghifar, and Zainalabedin Navabi. “Aging in Digital Circuits and Age Monitoring: Object-Oriented Modeling and Evaluation.” In 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE, 2015. https://doi.org/10.1109/dtis.2015.7127373.
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2015 | Conference Paper | LibreCat-ID: 29466
Sadeghi-Kohan, Somayeh, Mehdi Kamal, John McNeil, Paolo Prinetto, and Zain Navabi. “Online Self Adjusting Progressive Age Monitoring of Timing Variations.” In 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). IEEE, 2015. https://doi.org/10.1109/dtis.2015.7127368.
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2014 | Conference Paper | LibreCat-ID: 12977
Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, and Hans-Joachim Wunderlich. “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects.” In IEEE International Test Conference (ITC’14). Seattle, Washington, USA: IEEE, 2014. https://doi.org/10.1109/test.2014.7035360.
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2014 | Journal Article | LibreCat-ID: 13054
Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond Stuck-at Fault Testing.” DeGruyter Journal on Information Technology (It) 56, no. 4 (2014): 165–72.
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2014 | Journal Article | LibreCat-ID: 13055
Rodriguez Gomez, Laura, Alejandro Cook, Thomas Indlekofer, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Adaptive Bayesian Diagnosis of Intermittent Faults.” Journal of Electronic Testing - Theory and Applications (JETTA) 30, no. 5 (2014): 527–40.
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2014 | Journal Article | LibreCat-ID: 46266
Alizadeh, Bijan, Payman Behnam, and Somayeh Sadeghi-Kohan. “A Scalable Formal Debugging Approach with Auto-Correction Capability Based on Static Slicing and Dynamic Ranking for RTL Datapath Designs.” IEEE Transactions on Computers, 2014, 1–1. https://doi.org/10.1109/tc.2014.2329687.
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2014 | Conference Paper | LibreCat-ID: 46268
Mohammadi, Marzieh, Somayeh Sadeghi-Kohan, Nasser Masoumi, and Zainalabedin Navabi. “An Off-Line MDSI Interconnect BIST Incorporated in BS 1149.1.” In 2014 19th IEEE European Test Symposium (ETS). IEEE, 2014. https://doi.org/10.1109/ets.2014.6847847.
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2014 | Conference Paper | LibreCat-ID: 46267
Sadeghi-Kohan, Somayeh, Payman Behnam, Bijan Alizadeh, Masahiro Fujita, and Zainalabedin Navabi. “Improving Polynomial Datapath Debugging with HEDs.” In 2014 19th IEEE European Test Symposium (ETS). IEEE, 2014. https://doi.org/10.1109/ets.2014.6847797.
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2013 | Conference Paper | LibreCat-ID: 12979
Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.” In 14th IEEE Latin American Test Workshop - (LATW’13). Cordoba, Argentina: IEEE, 2013. https://doi.org/10.1109/latw.2013.6562662.
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2013 | Misc | LibreCat-ID: 13075
Cook, Alejandro, Laura Rodriguez Gomez, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. Adaptive Test and Diagnosis of Intermittent Faults. 14th Latin American Test Workshop, Cordoba, Argentina, 2013.
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2013 | Conference Paper | LibreCat-ID: 46271
Sadeghi-Kohan, Somayeh, Majid Namaki-Shoushtari, Fatemeh Javaheri, and Zainalabedin Navabi. “BS 1149.1 Extensions for an Online Interconnect Fault Detection and Recovery.” In 2012 IEEE International Test Conference. IEEE, 2013. https://doi.org/10.1109/test.2012.6401583.
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2013 | Conference Paper | LibreCat-ID: 46270
Sadeghi-Kohan, Somayeh, Shahrzad Keshavarz, Farzaneh Zokaee, Farimah Farahmandi, and Zainalabedin Navabi. “A New Structure for Interconnect Offline Testing.” In East-West Design & Test Symposium (EWDTS 2013). IEEE, 2013. https://doi.org/10.1109/ewdts.2013.6673207.
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2012 | Conference Paper | LibreCat-ID: 12980
Cook, Alejandro, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” In 13th IEEE Latin American Test Workshop (LATW’12), 1–4. Quito, Ecuador: IEEE, 2012. https://doi.org/10.1109/latw.2012.6261229.
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2012 | Conference Paper | LibreCat-ID: 12981
Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.” In 17th IEEE European Test Symposium (ETS’12), 1–6. Annecy, France: IEEE, 2012. https://doi.org/10.1109/ets.2012.6233025.
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2012 | Misc | LibreCat-ID: 13074
Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.
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2011 | Conference Paper | LibreCat-ID: 12982
Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Diagnostic Test of Robust Circuits.” In 20th IEEE Asian Test Symposium (ATS’11), 285–90. New Delhi, India: IEEE, 2011. https://doi.org/10.1109/ats.2011.55.
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2011 | Conference Paper | LibreCat-ID: 12984
Polian, Ilia, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, and Peter Maxwell. “Towards Variation-Aware Test Methods.” In 16th IEEE European Test Symposium Trondheim (ETS’11). Trondheim, Norway: IEEE, 2011. https://doi.org/10.1109/ets.2011.51.
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2011 | Conference Paper | LibreCat-ID: 13053
Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Robuster Selbsttest Mit Diagnose.” In 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,” 48–53. Hamburg, Germany, 2011.
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2011 | Journal Article | LibreCat-ID: 13052
Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer 54, no. 4 (2011): 1813–26.
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2011 | Conference Paper | LibreCat-ID: 46272
Kamran, Arezoo, Nastaran Nemati, Somayeh Sadeghi-Kohan, and Zainalabedin Navabi. “Virtual Tester Development Using HDL/PLI.” In 2010 East-West Design & Test Symposium (EWDTS). IEEE, 2011. https://doi.org/10.1109/ewdts.2010.5742156.
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2010 | Misc | LibreCat-ID: 10670
Fröse, Viktor, Rüdiger Ibers, and Sybille Hellebrand. Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.
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2010 | Conference Paper | LibreCat-ID: 12987
Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10). Chicago, IL, USA: IEEE, 2010. https://doi.org/10.1109/dsnw.2010.5542612.
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2010 | Conference Paper | LibreCat-ID: 13051
Hunger, Marc, and Sybille Hellebrand. “Ausbeute Und Fehlertoleranz Bei Dreifach Modularer Redundanz.” In 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 81–88. Wildbad Kreuth, Germany, 2010.
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2010 | Misc | LibreCat-ID: 13073
Hellebrand, Sybille. Nano-Electronic Systems. Editorial, it 4/2010, pp. 179-180, 2010.
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2010 | Conference Paper | LibreCat-ID: 12983
Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” In 19th IEEE Asian Test Symposium (ATS’10), 87–93. Shanghai, China: IEEE, 2010. https://doi.org/10.1109/ats.2010.24.
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2010 | Conference Paper | LibreCat-ID: 12985
Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” In 28th IEEE International Conference on Computer Design (ICCD’10), 480–85. Amsterdam, The Netherlands: IEEE, 2010. https://doi.org/10.1109/iccd.2010.5647648.
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2010 | Conference Paper | LibreCat-ID: 12986
Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), 101–8. Kyoto, Japan: IEEE, 2010. https://doi.org/10.1109/dft.2010.19.
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2010 | Conference Paper | LibreCat-ID: 12988
Froese, Viktor, Rüdiger Ibers, and Sybille Hellebrand. “Reusing NoC-Infrastructure for Test Data Compression.” In 28th IEEE VLSI Test Symposium (VTS’10), 227–31. Santa Cruz, CA, USA: IEEE, 2010. https://doi.org/10.1109/vts.2010.5469570.
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2010 | Conference Paper | LibreCat-ID: 13049
Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper). Chicago, IL, USA, 2010.
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2010 | Conference Paper | LibreCat-ID: 13050
Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Robuster Selbsttest Mit Extremer Kompaktierung.” In 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 17–24. Wildbad Kreuth, Germany, 2010.
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2009 | Conference Paper | LibreCat-ID: 12991
Hunger, Marc, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, and Bernd Becker. “ATPG-Based Grading of Strong Fault-Secureness.” In 15th IEEE International On-Line Testing Symposium (IOLTS’09. Sesimbra-Lisbon, Portugal: IEEE, 2009. https://doi.org/10.1109/iolts.2009.5196027.
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2009 | Conference Paper | LibreCat-ID: 12990
Hellebrand, Sybille, and Marc Hunger. “Are Robust Circuits Really Robust?” In 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), 77. Chicago, IL, USA: IEEE, 2009. https://doi.org/10.1109/dft.2009.28.
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2009 | Conference Paper | LibreCat-ID: 13030
Hunger, Marc, Sybille Hellebrand, Alexander Czutro, Ilia Polian, and Bernd Becker. “Robustheitsanalyse Stark Fehlersicherer Schaltungen Mit SAT-Basierter Testmustererzeugung.” In 3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Stuttgart, Germany, 2009.
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2008 | Misc | LibreCat-ID: 13033
Coym, Torsten, Sybille Hellebrand, Stefan Ludwig, Bernd Straube, Hans-Joachim Wunderlich, and Christian G. Zoellin. Ein Verfeinertes Elektrisches Modell Für Teilchentreffer Und Dessen Auswirkung Auf Die Bewertung Der Schaltungsempfindlichkeit. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich, 2008.
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2008 | Misc | LibreCat-ID: 13035
Amgalan, Uranmandakh, Christian Hachmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. Testen Mit Rücksetzpunkten - Ein Ansatz Zur Verbesserung Der Ausbeute Bei Robusten Schaltungen. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich, 2008.
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2008 | Conference Paper | LibreCat-ID: 12992
Oehler, Philipp, Alberto Bosio, Giorgio di Natale, and Sybille Hellebrand. “A Modular Memory BIST for Optimized Memory Repair.” In 14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster). Rhodos, Greece: IEEE, 2008. https://doi.org/10.1109/iolts.2008.30.
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2008 | Conference Paper | LibreCat-ID: 12994
Amgalan, Uranmandakh, Christian Hachmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Signature Rollback - A Technique for Testing Robust Circuits.” In 26th IEEE VLSI Test Symposium (VTS’08), 125–30. San Diego, CA, USA: IEEE, 2008. https://doi.org/10.1109/vts.2008.34.
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2008 | Conference Paper | LibreCat-ID: 12993
Hunger, Marc, and Sybille Hellebrand. “Verification and Analysis of Self-Checking Properties through ATPG.” In 14th IEEE International On-Line Testing Symposium (IOLTS’08). Rhodos, Greece: IEEE, 2008. https://doi.org/10.1109/iolts.2008.32.
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2008 | Conference Paper | LibreCat-ID: 13031
Hunger, Marc, and Sybille Hellebrand. “Analyse Selbstprüfender Schaltungen – Nachweis von Fehlersicherheit Und Selbsttestbarkeit Mit ATPG.” In 2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Ingolstadt, Germany, 2008.
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2008 | Conference Paper | LibreCat-ID: 13032
Oehler, Philipp, Alberto Bosio, Giorgio Di Natale, and Sybille Hellebrand. “Modularer Selbsttest Und Optimierte Reparaturanalyse.” In 2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Ingolstadt, Germany, 2008.
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2007 | Misc | LibreCat-ID: 13038
Hellebrand, Sybille. Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing. 5th IEEE East-West Design \& Test Symposium, Yerevan, Armenia (Invited Talk), 2007.
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2007 | Misc | LibreCat-ID: 13039
Ali, Muhammad, Michael Welzl, Sven Hessler, and Sybille Hellebrand. An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips. DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster), 2007.
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2007 | Misc | LibreCat-ID: 13042
Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany, 2007.
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2007 | Misc | LibreCat-ID: 13043
Hellebrand, Sybille. Qualitätssicherung Für Nanochips - Wie IT-Produkte Zuverlässig Werden. ForschungsForum Paderborn, 10. Ausgabe, Paderborn, Germany, 2007.
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2007 | Conference Paper | LibreCat-ID: 12995
Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “A Refined Electrical Model for Particle Strikes and Its Impact on SEU Prediction.” In 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07), 50–58. Rome, Italy: IEEE, 2007. https://doi.org/10.1109/dft.2007.43.
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2007 | Conference Paper | LibreCat-ID: 12996
Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair.” In 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07), 185–90. Krakow, Poland: IEEE, 2007. https://doi.org/10.1109/ddecs.2007.4295278.
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2007 | Conference Paper | LibreCat-ID: 12997
Oehler, Philipp, Sybille Hellebrand, and Hans-Joachim Wunderlich. “An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy.” In 12th IEEE European Test Symposium (ETS’07), 91–96. Freiburg, Germany: IEEE, 2007. https://doi.org/10.1109/ets.2007.10.
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2007 | Conference Paper | LibreCat-ID: 13037
Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” In 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper). Bled, Slovenia, 2007.
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2007 | Journal Article | LibreCat-ID: 13036
Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” Informacije MIDEM, Ljubljana (Invited Paper) 37, no. 4 (124) (2007): 212–19.
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2007 | Journal Article | LibreCat-ID: 13044
Ali, Muhammad, Sven Hessler, Michael Welzl, and Sybille Hellebrand. “An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip.” International Journal on High Performance Systems Architecture 1, no. 2 (2007): 113–23.
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2007 | Conference Paper | LibreCat-ID: 13040
Ali, Muhammad, Michael Welzl, Sven Hessler, and Sybille Hellebrand. “A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip.” In 4th International Conference on Information Technology: New Generations (ITNG’07), 1027–32. Las Vegas, Nevada, USA, 2007.
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2007 | Conference Paper | LibreCat-ID: 13041
Becker, Bernd, Ilia Polian, Sybille Hellebrand, Bernd Straube, and Hans-Joachim Wunderlich. “Test Und Zuverlässigkeit Nanoelektronischer Systeme.” In 1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Munich, Germany, 2007.
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2006 | Journal Article | LibreCat-ID: 13045
Becker, Bernd, Ilia Polian, Sybille Hellebrand, Bernd Straube, and Hans-Joachim Wunderlich. “DFG-Projekt RealTest - Test Und Zuverlässigkeit Nanoelektronischer Systeme.” It - Information Technology 48, no. 5 (2006): 305–11.
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2005 | Misc | LibreCat-ID: 13046
Oehler, Philipp, and Sybille Hellebrand. A Low Power Design for Embedded DRAMs with Online Consistency Checking. Kleinheubachertagung 2005, Miltenberg, Germany, 2005.
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2005 | Misc | LibreCat-ID: 13101
Ali, Muhammad, Michael Welzl, and Sybille Hellebrand. Dynamic Routing: A Prerequisite for Reliable NoCs. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.
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2005 | Misc | LibreCat-ID: 13102
Oehler, Philipp, and Sybille Hellebrand. Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.
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2005 | Conference Paper | LibreCat-ID: 12999
Ali, Muhammad, Michael Welzl, Martin Zwicknagl, and Sybille Hellebrand. “Considerations for Fault-Tolerant Networks on Chips.” In IEEE International Conference on Microelectronics (ICM’05). Islamabad, Pakistan: IEEE, 2005. https://doi.org/10.1109/icm.2005.1590063.
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2005 | Conference Paper | LibreCat-ID: 13000
Oehler, Philipp, and Sybille Hellebrand. “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities.” In 10th IEEE European Test Symposium (ETS’05), 148–53. Tallinn, Estonia: IEEE, 2005. https://doi.org/10.1109/ets.2005.28.
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2005 | Conference Paper | LibreCat-ID: 12998
Ali, Muhammad, Michael Welzl, and Sybille Hellebrand. “A Dynamic Routing Mechanism for Network on Chip.” In 23rd IEEE NORCHIP Conference, 70–73. Oulu, Finland: IEEE, 2005. https://doi.org/10.1109/norchp.2005.1596991.
LibreCat
| DOI
2004 | Conference Paper | LibreCat-ID: 13071
Liu Jing, Michelle, Stefan Ruehrup, Christian Schindelhauer, Klaus Volbert, Martin Dierkes, Andreas Bellgardt, Rüdiger Ibers, and Ulrich Hilleringmann. “Sensor Networks with More Features Using Less Hardware.” In {GOR/NGB Conference Tilburg 2004}. Tilburg, Netherlands, 2004.
LibreCat
2004 | Misc | LibreCat-ID: 13099
Breu, Ruth, Thomas Fahringer, Dieter Fensel, Sybille Hellebrand, Aart Middeldorp, and Otmar Scherzer. Im Westen Viel Neues - Informatik an Der Universität Innsbruck. OCG Journal, pp. 28-29, 2004.
LibreCat
2004 | Misc | LibreCat-ID: 13100
Hellebrand, Sybille, Armin Wuertenberger, and Christofer S. Tautermann. Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. 9th IEEE European Test Symposium, Ajaccio, Corsica, France, 2004.
LibreCat
2004 | Conference Paper | LibreCat-ID: 13001
Wuertenberger, Armin, Christofer S. Tautermann, and Sybille Hellebrand. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.” In IEEE International Test Conference (ITC’04), 926–35. Charlotte, NC, USA: IEEE, 2004. https://doi.org/10.1109/test.2004.1387357.
LibreCat
| DOI
2003 | Misc | LibreCat-ID: 13098
Breu, Ruth, Sybille Hellebrand, and Michael Welzl. Experiences from Teaching Software Development in a Java Environment. Handouts ACS/IEEE Workshop on Practice and Experience with Java in Education, Tunis, Tunisia, 2003.
LibreCat
2003 | Conference Paper | LibreCat-ID: 13002
Wuertenberger, Armin, Christofer S. Tautermann, and Sybille Hellebrand. “A Hybrid Coding Strategy for Optimized Test Data Compression.” In IEEE International Test Conference (ITC’03), 451–59. Charlotte, NC, USA: IEEE, 2003. https://doi.org/10.1109/test.2003.1270870.
LibreCat
| DOI
2002 | Misc | LibreCat-ID: 13097
Hellebrand, Sybille, and Armin Wuertenberger. Alternating Run-Length Coding: A Technique for Improved Test Data Compression. IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA, 2002.
LibreCat
2002 | Journal Article | LibreCat-ID: 13003
Hellebrand, Sybille, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, and Vyacheslav N. Yarmolik. “Efficient Online and Offline Testing of Embedded DRAMs.” IEEE Transactions on Computers 51, no. 7 (2002): 801–9. https://doi.org/10.1109/tc.2002.1017700.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 13069
Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” Journal of Electronic Testing - Theory and Applications (JETTA) 18, no. 2 (2002): 157–68.
LibreCat
2002 | Journal Article | LibreCat-ID: 13070
Liang, Huaguo, Sybille Hellebrand, and Hans-Joachim Wunderlich. “A Mixed-Mode BIST Scheme Based on Folding Compression.” Journal on Computer Science and Technology 17, no. 2 (2002): 203–12.
LibreCat
2001 | Misc | LibreCat-ID: 13096
Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden, 2001.
LibreCat
2001 | Conference Paper | LibreCat-ID: 13004
Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” In IEEE International Test Conference (ITC’01), 894–902. Baltimore, MD, USA: IEEE, 2001. https://doi.org/10.1109/test.2001.966712.
LibreCat
| DOI
2001 | Journal Article | LibreCat-ID: 13047
Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Deterministic BIST Scheme Based on Reseeding of Folding Counters.” Journal of Computer Research and Development, (Jisuanji Yanjiu Yu Fazhan) 38, no. 8 (2001): 931.
LibreCat
2001 | Journal Article | LibreCat-ID: 13068
Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.” Journal of Electronic Testing - Theory and Applications (JETTA) 17, no. 3/4 (2001): 341–49.
LibreCat
2000 | Misc | LibreCat-ID: 13094
Hellebrand, Sybille, and Hans-Joachim Wunderlich. Hardwarepraktikum Im Diplomstudiengang Informatik. Handbuch Lehre, Berlin, Raabe Verlag, 2000.
LibreCat
2000 | Misc | LibreCat-ID: 13095
Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. IEEE European Test Workshop, Cascais, Portugal, 2000.
LibreCat
2000 | Conference Paper | LibreCat-ID: 13005
Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.” In IEEE International Test Conference (ITC’00), 778–84. Atlantic City, NJ, USA: IEEE, 2000. https://doi.org/10.1109/test.2000.894274.
LibreCat
| DOI
1999 | Book | LibreCat-ID: 13065
Hellebrand, Sybille. Selbsttestbare Steuerwerke - Strukturen Und Syntheseverfahren. 10. Verlag Dr. Kovac, Hamburg: Verlag Dr. Kovac, Hamburg, 1999.
LibreCat
1999 | Misc | LibreCat-ID: 13093
Hellebrand, Sybille, Hans-Joachim Wunderlich, and Vyacheslav N. Yarmolik. Exploiting Symmetries to Speed Up Transparent BIST. 11th GI/ITG/GMM/IEEE Workshop, 1999.
LibreCat
1999 | Conference Paper | LibreCat-ID: 13006
Hellebrand, Sybille, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri V. Klimets, and Vyacheslav N. Yarmolik. “Error Detecting Refreshment for Embedded DRAMs.” In 17th IEEE VLSI Test Symposium (VTS’99), 384–90. Dana Point, CA, USA: IEEE, 1999. https://doi.org/10.1109/vtest.1999.766693.
LibreCat
| DOI
1999 | Conference Paper | LibreCat-ID: 13066
N. Yarmolik, Vyacheslav, Iuri V. Bykov, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms.” In Third European Dependable Computing Conference (EDCC-3). Prague, Czech Republic, 1999.
LibreCat
1999 | Conference Paper | LibreCat-ID: 13067
Hellebrand, Sybille, Hans-Joachim Wunderlich, and Vyacheslav N. Yarmolik. “Symmetric Transparent BIST for RAMs.” In Design Automation and Test in Europe (DATE’99), 702–7. Munich, Germany, 1999.
LibreCat
1998 | Report | LibreCat-ID: 13029
Hellebrand, Sybille, and Hans-Joachim Wunderlich. Test Und Synthese Schneller Eingebetteter Systeme. Universität Stuttgart, 1998.
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