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136 Publications


2019 | Misc | LibreCat-ID: 8112
Maaz, M. U., Sprenger, A., & Hellebrand, S. (2019). A Hybrid Space Compactor for Varying X-Rates. Prien am Chiemsee: 31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19).
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2019 | Journal Article | LibreCat-ID: 8667
Sprenger, A., & Hellebrand, S. (2019). Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test. Journal of Circuits, Systems and Computers. https://doi.org/10.1142/s0218126619400012
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2019 | Conference Paper | LibreCat-ID: 12918
Maaz, M. U., Sprenger, A., & Hellebrand, S. (n.d.). A Hybrid Space Compactor for Adaptive X-Handling. In 50th IEEE International Test Conference. Washington D.C.: IEEE.
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2019 | Journal Article | LibreCat-ID: 13048
Kampmann, M., A. Kochte, M., Liu, C., Schneider, E., Hellebrand, S., & Wunderlich, H.-J. (2019). Built-in Test for Hidden Delay Faults. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 38(10), 1956–1968.
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2018 | Misc | LibreCat-ID: 4576
Sprenger, A., & Hellebrand, S. (2018). Stochastische Kompaktierung für den Hochgeschwindigkeitstest. 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), Freiburg, Germany.
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2018 | Journal Article | LibreCat-ID: 13057
Kampmann, M., & Hellebrand, S. (2018). Design For Small Delay Test - A Simulation Study. Microelectronics Reliability, 80, 124–133.
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2018 | Misc | LibreCat-ID: 13072
Kampmann, M., & Hellebrand, S. (2018). Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test. 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China.
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2018 | Journal Article | LibreCat-ID: 12974
Hellebrand, S., Henkel, J., Raghunathan, A., & Wunderlich, H.-J. (2018). Guest Editors’ Introduction - Special Issue on Approximate Computing. {IEEE Embedded Systems Letters}, 10(1), 1–1. https://doi.org/10.1109/les.2018.2789942
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2018 | Conference Paper | LibreCat-ID: 10575
Liu, C., Schneider, E., Kampmann, M., Hellebrand, S., & Wunderlich, H.-J. (2018). Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. In 2018 IEEE 27th Asian Test Symposium (ATS). https://doi.org/10.1109/ats.2018.00028
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2018 | Conference Paper | LibreCat-ID: 4575
Sprenger, A., & Hellebrand, S. (2018). Tuning Stochastic Space Compaction to Faster-than-at-Speed Test. In 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS). Budapest: IEEE. https://doi.org/10.1109/ddecs.2018.00020
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2017 | Conference Paper | LibreCat-ID: 10576
Kampmann, M., & Hellebrand, S. (2017). Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test. In 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS). https://doi.org/10.1109/ddecs.2017.7934564
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2017 | Conference Paper | LibreCat-ID: 12973
Deshmukh, J., Kunz, W., Wunderlich, H.-J., & Hellebrand, S. (2017). Special Session on Early Life Failures. In {35th IEEE VLSI Test Symposium (VTS’17)}. Caesars Palace, Las Vegas, Nevada, USA: {IEEE}. https://doi.org/10.1109/vts.2017.7928933
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2017 | Misc | LibreCat-ID: 13078
Kampmann, M., & Hellebrand, S. (2017). X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz. 29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany.
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2016 | Conference Paper | LibreCat-ID: 12975
Kampmann, M., & Hellebrand, S. (2016). X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. In {25th IEEE Asian Test Symposium (ATS’16)} (pp. 1–6). Hiroshima, Japan: {IEEE}. https://doi.org/10.1109/ats.2016.20
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2015 | Conference Paper | LibreCat-ID: 12976
Kampmann, M., A. Kochte, M., Schneider, E., Indlekofer, T., Hellebrand, S., & Wunderlich, H.-J. (2015). Optimized Selection of Frequencies for Faster-Than-at-Speed Test. In {24th IEEE Asian Test Symposium (ATS’15)} (pp. 109–114). Mumbai, India: {IEEE}. https://doi.org/10.1109/ats.2015.26
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2015 | Journal Article | LibreCat-ID: 13056
Huang, Z., Liang, H., & Hellebrand, S. (2015). A High Performance SEU Tolerant Latch. {Journal of Electronic Testing - Theory and Applications (JETTA)}, 31(4), 349–359.
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2015 | Misc | LibreCat-ID: 13077
Hellebrand, S., Indlekofer, T., Kampmann, M., Kochte, M., Liu, C., & Wunderlich, H.-J. (2015). Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany.
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2014 | Conference Paper | LibreCat-ID: 12977
Hellebrand, S., Indlekofer, T., Kampmann, M., A. Kochte, M., Liu, C., & Wunderlich, H.-J. (2014). FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects. In {IEEE International Test Conference (ITC’14)}. Seattle, Washington, USA: {IEEE}. https://doi.org/10.1109/test.2014.7035360
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2014 | Journal Article | LibreCat-ID: 13054
Hellebrand, S., & Wunderlich, H.-J. (2014). SAT-Based ATPG beyond Stuck-at Fault Testing. {DeGruyter Journal on Information Technology (It)}, 56(4), 165–172.
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2014 | Journal Article | LibreCat-ID: 13055
Rodriguez Gomez, L., Cook, A., Indlekofer, T., Hellebrand, S., & Wunderlich, H.-J. (2014). Adaptive Bayesian Diagnosis of Intermittent Faults. {Journal of Electronic Testing - Theory and Applications (JETTA)}, 30(5), 527–540.
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