Please note that LibreCat no longer supports Internet Explorer versions 8 or 9 (or earlier).

We recommend upgrading to the latest Internet Explorer, Google Chrome, or Firefox.

136 Publications


2019 | Misc | LibreCat-ID: 8112
Maaz, Mohammad Urf, et al. A Hybrid Space Compactor for Varying X-Rates. 31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19), 2019.
LibreCat
 

2019 | Journal Article | LibreCat-ID: 8667
Sprenger, Alexander, and Sybille Hellebrand. “Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test.” Journal of Circuits, Systems and Computers, 2019, doi:10.1142/s0218126619400012.
LibreCat | DOI
 

2019 | Conference Paper | LibreCat-ID: 12918
Maaz, Mohammad Urf, et al. “A Hybrid Space Compactor for Adaptive X-Handling.” 50th IEEE International Test Conference, IEEE.
LibreCat
 

2019 | Journal Article | LibreCat-ID: 13048
Kampmann, Matthias, et al. “Built-in Test for Hidden Delay Faults.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), vol. 38, no. 10, 2019, pp. 1956–68.
LibreCat
 

2018 | Misc | LibreCat-ID: 4576
Sprenger, Alexander, and Sybille Hellebrand. Stochastische Kompaktierung für den Hochgeschwindigkeitstest. 2018.
LibreCat
 

2018 | Journal Article | LibreCat-ID: 13057
Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test - A Simulation Study.” Microelectronics Reliability, vol. 80, 2018, pp. 124–33.
LibreCat
 

2018 | Misc | LibreCat-ID: 13072
Kampmann, Matthias, and Sybille Hellebrand. Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test. 2018.
LibreCat
 

2018 | Journal Article | LibreCat-ID: 12974
Hellebrand, Sybille, et al. “Guest Editors’ Introduction - Special Issue on Approximate Computing.” {IEEE Embedded Systems Letters}, vol. 10, no. 1, Institute of Electrical and Electronics Engineers ({IEEE}), 2018, pp. 1–1, doi:10.1109/les.2018.2789942.
LibreCat | DOI
 

2018 | Conference Paper | LibreCat-ID: 10575
Liu, Chang, et al. “Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.” 2018 IEEE 27th Asian Test Symposium (ATS), 2018, doi:10.1109/ats.2018.00028.
LibreCat | DOI
 

2018 | Conference Paper | LibreCat-ID: 4575
Sprenger, Alexander, and Sybille Hellebrand. “Tuning Stochastic Space Compaction to Faster-than-at-Speed Test.” 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), IEEE, 2018, doi:10.1109/ddecs.2018.00020.
LibreCat | DOI
 

2017 | Conference Paper | LibreCat-ID: 10576
Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting X-Tolerant Compaction during Faster-than-at-Speed Test.” 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2017, doi:10.1109/ddecs.2017.7934564.
LibreCat | DOI
 

2017 | Conference Paper | LibreCat-ID: 12973
Deshmukh, Jyotirmoy, et al. “Special Session on Early Life Failures.” {35th IEEE VLSI Test Symposium (VTS’17)}, {IEEE}, 2017, doi:10.1109/vts.2017.7928933.
LibreCat | DOI
 

2017 | Misc | LibreCat-ID: 13078
Kampmann, Matthias, and Sybille Hellebrand. X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz. 2017.
LibreCat
 

2016 | Conference Paper | LibreCat-ID: 12975
Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test.” {25th IEEE Asian Test Symposium (ATS’16)}, {IEEE}, 2016, pp. 1–6, doi:10.1109/ats.2016.20.
LibreCat | DOI
 

2015 | Conference Paper | LibreCat-ID: 12976
Kampmann, Matthias, et al. “Optimized Selection of Frequencies for Faster-Than-at-Speed Test.” {24th IEEE Asian Test Symposium (ATS’15)}, {IEEE}, 2015, pp. 109–14, doi:10.1109/ats.2015.26.
LibreCat | DOI
 

2015 | Journal Article | LibreCat-ID: 13056
Huang, Zhengfeng, et al. “A High Performance SEU Tolerant Latch.” {Journal of Electronic Testing - Theory and Applications (JETTA)}, vol. 31, no. 4, 2015, pp. 349–59.
LibreCat
 

2015 | Misc | LibreCat-ID: 13077
Hellebrand, Sybille, et al. Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler. 2015.
LibreCat
 

2014 | Conference Paper | LibreCat-ID: 12977
Hellebrand, Sybille, et al. “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects.” {IEEE International Test Conference (ITC’14)}, {IEEE}, 2014, doi:10.1109/test.2014.7035360.
LibreCat | DOI
 

2014 | Journal Article | LibreCat-ID: 13054
Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond Stuck-at Fault Testing.” {DeGruyter Journal on Information Technology (It)}, vol. 56, no. 4, 2014, pp. 165–72.
LibreCat
 

2014 | Journal Article | LibreCat-ID: 13055
Rodriguez Gomez, Laura, et al. “Adaptive Bayesian Diagnosis of Intermittent Faults.” {Journal of Electronic Testing - Theory and Applications (JETTA)}, vol. 30, no. 5, 2014, pp. 527–40.
LibreCat
 

Filters and Search Terms

department=48

Search

Filter Publications

Display / Sort

Citation Style: MLA

Export / Embed