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84 Publications
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2007 | Conference Paper | LibreCat-ID: 12995
Hellebrand, Sybille, et al. “A Refined Electrical Model for Particle Strikes and Its Impact on SEU Prediction.” 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07), IEEE, 2007, pp. 50–58, doi:10.1109/dft.2007.43.
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2007 | Conference Paper | LibreCat-ID: 12996
Oehler, Philipp, et al. “Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair.” 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07), IEEE, 2007, pp. 185–90, doi:10.1109/ddecs.2007.4295278.
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2007 | Conference Paper | LibreCat-ID: 12997
Oehler, Philipp, et al. “An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy.” 12th IEEE European Test Symposium (ETS’07), IEEE, 2007, pp. 91–96, doi:10.1109/ets.2007.10.
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2007 | Conference Paper | LibreCat-ID: 13037
Hellebrand, Sybille, et al. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper), 2007.
LibreCat
2007 | Conference Paper | LibreCat-ID: 13040
Ali, Muhammad, et al. “A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip.” 4th International Conference on Information Technology: New Generations (ITNG’07), 2007, pp. 1027–32.
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2007 | Conference Paper | LibreCat-ID: 13041
Becker, Bernd, et al. “Test Und Zuverlässigkeit Nanoelektronischer Systeme.” 1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2007.
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2005 | Conference Paper | LibreCat-ID: 12999
Ali, Muhammad, et al. “Considerations for Fault-Tolerant Networks on Chips.” IEEE International Conference on Microelectronics (ICM’05), IEEE, 2005, doi:10.1109/icm.2005.1590063.
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2005 | Conference Paper | LibreCat-ID: 13000
Oehler, Philipp, and Sybille Hellebrand. “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities.” 10th IEEE European Test Symposium (ETS’05), IEEE, 2005, pp. 148–53, doi:10.1109/ets.2005.28.
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2005 | Conference Paper | LibreCat-ID: 12998
Ali, Muhammad, et al. “A Dynamic Routing Mechanism for Network on Chip.” 23rd IEEE NORCHIP Conference, IEEE, 2005, pp. 70–73, doi:10.1109/norchp.2005.1596991.
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2004 | Conference Paper | LibreCat-ID: 13071
Liu Jing, Michelle, et al. “Sensor Networks with More Features Using Less Hardware.” {GOR/NGB Conference Tilburg 2004}, 2004.
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2004 | Conference Paper | LibreCat-ID: 13001
Wuertenberger, Armin, et al. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.” IEEE International Test Conference (ITC’04), IEEE, 2004, pp. 926–35, doi:10.1109/test.2004.1387357.
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2003 | Conference Paper | LibreCat-ID: 13002
Wuertenberger, Armin, et al. “A Hybrid Coding Strategy for Optimized Test Data Compression.” IEEE International Test Conference (ITC’03), IEEE, 2003, pp. 451–59, doi:10.1109/test.2003.1270870.
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2001 | Conference Paper | LibreCat-ID: 13004
Liang, Hua-Guo, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” IEEE International Test Conference (ITC’01), IEEE, 2001, pp. 894–902, doi:10.1109/test.2001.966712.
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2000 | Conference Paper | LibreCat-ID: 13005
Hellebrand, Sybille, et al. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.” IEEE International Test Conference (ITC’00), IEEE, 2000, pp. 778–84, doi:10.1109/test.2000.894274.
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1999 | Conference Paper | LibreCat-ID: 13006
Hellebrand, Sybille, et al. “Error Detecting Refreshment for Embedded DRAMs.” 17th IEEE VLSI Test Symposium (VTS’99), IEEE, 1999, pp. 384–90, doi:10.1109/vtest.1999.766693.
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1999 | Conference Paper | LibreCat-ID: 13066
N. Yarmolik, Vyacheslav, et al. “Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms.” Third European Dependable Computing Conference (EDCC-3), 1999.
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1999 | Conference Paper | LibreCat-ID: 13067
Hellebrand, Sybille, et al. “Symmetric Transparent BIST for RAMs.” Design Automation and Test in Europe (DATE’99), 1999, pp. 702–07.
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1998 | Conference Paper | LibreCat-ID: 13007
Hertwig, Andre, et al. “Fast Self-Recovering Controllers.” 16th IEEE VLSI Test Symposium (VTS’98), IEEE, 1998, pp. 296–302, doi:10.1109/vtest.1998.670883.
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1998 | Conference Paper | LibreCat-ID: 13008
Hellebrand, Sybille, et al. “Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs.” Design Automation and Test in Europe (DATE’98), 1998, pp. 173–79, doi:10.1109/date.1998.655853.
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1998 | Conference Paper | LibreCat-ID: 13063
N. Yarmolik, Vyacheslav, et al. “New Transparent RAM BIST Based on Self-Adjusting Output Data Compression.” Design & Diagnostics of Electronic Circuits & Systems (DDECS’98), 1998, pp. 27–33.
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