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24 Publications
2023 | Journal Article | LibreCat-ID: 46264
@article{Sadeghi-Kohan_Hellebrand_Wunderlich_2023, title={Workload-Aware Periodic Interconnect BIST}, DOI={10.1109/mdat.2023.3298849}, journal={IEEE Design &Test}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023}, pages={1–1} }
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2022 | Journal Article | LibreCat-ID: 29351
@article{Sadeghi-Kohan_Hellebrand_Wunderlich_2022, title={Stress-Aware Periodic Test of Interconnects}, DOI={10.1007/s10836-021-05979-5}, journal={Journal of Electronic Testing}, publisher={Springer Science and Business Media LLC}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2022} }
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2019 | Journal Article | LibreCat-ID: 8667
@article{Sprenger_Hellebrand_2019, title={Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test}, volume={28}, DOI={10.1142/s0218126619400012}, number={1}, journal={Journal of Circuits, Systems and Computers}, publisher={World Scientific Publishing Company}, author={Sprenger, Alexander and Hellebrand, Sybille}, year={2019}, pages={1–23} }
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2019 | Journal Article | LibreCat-ID: 13048
@article{Kampmann_A. Kochte_Liu_Schneider_Hellebrand_Wunderlich_2019, title={Built-in Test for Hidden Delay Faults}, volume={38}, number={10}, journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)}, publisher={IEEE}, author={Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Schneider, Eric and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2019}, pages={1956–1968} }
LibreCat
2018 | Journal Article | LibreCat-ID: 12974
@article{Hellebrand_Henkel_Raghunathan_Wunderlich_2018, title={Guest Editors’ Introduction - Special Issue on Approximate Computing}, volume={10}, DOI={10.1109/les.2018.2789942}, number={1}, journal={IEEE Embedded Systems Letters}, publisher={IEEE}, author={Hellebrand, Sybille and Henkel, Joerg and Raghunathan, Anand and Wunderlich, Hans-Joachim}, year={2018}, pages={1–1} }
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2018 | Journal Article | LibreCat-ID: 13057
@article{Kampmann_Hellebrand_2018, title={Design For Small Delay Test - A Simulation Study}, volume={80}, journal={Microelectronics Reliability}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2018}, pages={124–133} }
LibreCat
2017 | Journal Article | LibreCat-ID: 29462
@article{Sadeghi-Kohan_Kamal_Navabi_2017, title={Self-Adjusting Monitor for Measuring Aging Rate and Advancement}, volume={8}, DOI={10.1109/tetc.2017.2771441}, number={3}, journal={IEEE Transactions on Emerging Topics in Computing}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Sadeghi-Kohan, Somayeh and Kamal, Mehdi and Navabi, Zainalabedin}, year={2017}, pages={627–641} }
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2015 | Journal Article | LibreCat-ID: 13056
@article{Huang_Liang_Hellebrand_2015, title={A High Performance SEU Tolerant Latch}, volume={31}, number={4}, journal={Journal of Electronic Testing - Theory and Applications (JETTA)}, publisher={Springer}, author={Huang, Zhengfeng and Liang, Huaguo and Hellebrand, Sybille}, year={2015}, pages={349–359} }
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2014 | Journal Article | LibreCat-ID: 13054
@article{Hellebrand_Wunderlich_2014, title={SAT-Based ATPG beyond Stuck-at Fault Testing}, volume={56}, number={4}, journal={DeGruyter Journal on Information Technology (it)}, publisher={DeGruyter}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2014}, pages={165–172} }
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2014 | Journal Article | LibreCat-ID: 13055
@article{Rodriguez Gomez_Cook_Indlekofer_Hellebrand_Wunderlich_2014, title={Adaptive Bayesian Diagnosis of Intermittent Faults}, volume={30}, number={5}, journal={Journal of Electronic Testing - Theory and Applications (JETTA)}, publisher={Springer}, author={Rodriguez Gomez, Laura and Cook, Alejandro and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2014}, pages={527–540} }
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2014 | Journal Article | LibreCat-ID: 46266
@article{Alizadeh_Behnam_Sadeghi-Kohan_2014, title={A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs}, DOI={10.1109/tc.2014.2329687}, journal={IEEE Transactions on Computers}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Alizadeh, Bijan and Behnam, Payman and Sadeghi-Kohan, Somayeh}, year={2014}, pages={1–1} }
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2011 | Journal Article | LibreCat-ID: 13052
@article{Hopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2011, title={Variation-Aware Fault Modeling}, volume={54}, number={4}, journal={SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer}, author={Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2011}, pages={1813–1826} }
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2007 | Journal Article | LibreCat-ID: 13036
@article{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, title={Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}, volume={37}, number={4 (124)}, journal={Informacije MIDEM, Ljubljana (Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007}, pages={212–219} }
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2007 | Journal Article | LibreCat-ID: 13044
@article{Ali_Hessler_Welzl_Hellebrand_2007, title={An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip}, volume={1}, number={2}, journal={International Journal on High Performance Systems Architecture}, author={Ali, Muhammad and Hessler, Sven and Welzl, Michael and Hellebrand, Sybille}, year={2007}, pages={113–123} }
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2006 | Journal Article | LibreCat-ID: 13045
@article{Becker_Polian_Hellebrand_Straube_Wunderlich_2006, title={DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme}, volume={48}, number={5}, journal={it - Information Technology}, author={Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim}, year={2006}, pages={305–311} }
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2002 | Journal Article | LibreCat-ID: 13003
@article{Hellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_2002, title={Efficient Online and Offline Testing of Embedded DRAMs}, volume={51}, DOI={10.1109/tc.2002.1017700}, number={7}, journal={IEEE Transactions on Computers}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav}, year={2002}, pages={801–809} }
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2002 | Journal Article | LibreCat-ID: 13069
@article{Hellebrand_Liang_Wunderlich_2002, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, volume={18}, number={2}, journal={Journal of Electronic Testing - Theory and Applications (JETTA)}, author={Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2002}, pages={157–168} }
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2002 | Journal Article | LibreCat-ID: 13070
@article{Liang_Hellebrand_Wunderlich_2002, title={A Mixed-Mode BIST Scheme Based on Folding Compression}, volume={17}, number={2}, journal={Journal on Computer Science and Technology}, author={Liang, Huaguo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2002}, pages={203–212} }
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2001 | Journal Article | LibreCat-ID: 13047
@article{Liang_Hellebrand_Wunderlich_2001, title={Deterministic BIST Scheme Based on Reseeding of Folding Counters}, volume={38}, number={8}, journal={Journal of Computer Research and Development, (Jisuanji Yanjiu yu Fazhan)}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001}, pages={931} }
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2001 | Journal Article | LibreCat-ID: 13068
@article{Hellebrand_Liang_Wunderlich_2001, title={A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters}, volume={17}, number={3/4}, journal={Journal of Electronic Testing - Theory and Applications (JETTA)}, author={Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2001}, pages={341–349} }
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1998 | Journal Article | LibreCat-ID: 13061
@article{Hellebrand_Wunderlich_Hertwig_1998, title={Mixed-Mode BIST Using Embedded Processors}, volume={12}, number={1/2}, journal={Journal of Electronic Testing Theory and Applications - JETTA}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}, year={1998}, pages={127–138} }
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1998 | Journal Article | LibreCat-ID: 13064
@article{Hellebrand_Hertwig_Wunderlich_1998, title={Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications}, volume={15}, number={4}, journal={IEEE Design and Test}, publisher={IEEE}, author={Hellebrand, Sybille and Hertwig, Andre and Wunderlich, Hans-Joachim}, year={1998}, pages={36–41} }
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1995 | Journal Article | LibreCat-ID: 13011
@article{Hellebrand_Rajski_Tarnick_Venkataraman_Courtois_1995, title={Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers}, volume={44}, DOI={10.1109/12.364534}, number={2}, journal={IEEE Transactions on Computers}, publisher={IEEE}, author={Hellebrand, Sybille and Rajski, Janusz and Tarnick, Steffen and Venkataraman, Srikanth and Courtois, B.}, year={1995}, pages={223–233} }
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1992 | Journal Article | LibreCat-ID: 13017
@article{Wunderlich_Hellebrand_1992, title={The Pseudoexhaustive Test of Sequential Circuits}, volume={11}, DOI={10.1109/43.108616}, number={1}, journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={1992}, pages={26–33} }
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