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165 Publications


2007 | Misc | LibreCat-ID: 13042
@book{Oehler_Hellebrand_Wunderlich_2007, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany}, title={An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007} }
LibreCat
 

2007 | Misc | LibreCat-ID: 13043
@book{Hellebrand_2007, place={ForschungsForum Paderborn, 10. Ausgabe, Paderborn, Germany}, title={Qualitätssicherung für Nanochips - Wie IT-Produkte zuverlässig werden}, author={Hellebrand, Sybille}, year={2007} }
LibreCat
 

2007 | Conference Paper | LibreCat-ID: 12995
@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place={Rome, Italy}, title={A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction}, DOI={10.1109/dft.2007.43}, booktitle={22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)}, publisher={IEEE}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007}, pages={50–58} }
LibreCat | DOI
 

2007 | Conference Paper | LibreCat-ID: 12996
@inproceedings{Oehler_Hellebrand_Wunderlich_2007, place={Krakow, Poland}, title={Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair}, DOI={10.1109/ddecs.2007.4295278}, booktitle={10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007}, pages={185–190} }
LibreCat | DOI
 

2007 | Conference Paper | LibreCat-ID: 12997
@inproceedings{Oehler_Hellebrand_Wunderlich_2007, place={Freiburg, Germany}, title={An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy}, DOI={10.1109/ets.2007.10}, booktitle={12th IEEE European Test Symposium (ETS’07)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007}, pages={91–96} }
LibreCat | DOI
 

2007 | Conference Paper | LibreCat-ID: 13037
@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place={Bled, Slovenia}, title={Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}, booktitle={43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007} }
LibreCat
 

2007 | Journal Article | LibreCat-ID: 13036
@article{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, title={Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}, volume={37}, number={4 (124)}, journal={Informacije MIDEM, Ljubljana (Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007}, pages={212–219} }
LibreCat
 

2007 | Journal Article | LibreCat-ID: 13044
@article{Ali_Hessler_Welzl_Hellebrand_2007, title={An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip}, volume={1}, number={2}, journal={International Journal on High Performance Systems Architecture}, author={Ali, Muhammad and Hessler, Sven and Welzl, Michael and Hellebrand, Sybille}, year={2007}, pages={113–123} }
LibreCat
 

2007 | Conference Paper | LibreCat-ID: 13040
@inproceedings{Ali_Welzl_Hessler_Hellebrand_2007, place={Las Vegas, Nevada, USA}, title={A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip}, booktitle={4th International Conference on Information Technology: New Generations (ITNG’07)}, author={Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille}, year={2007}, pages={1027–1032} }
LibreCat
 

2007 | Conference Paper | LibreCat-ID: 13041
@inproceedings{Becker_Polian_Hellebrand_Straube_Wunderlich_2007, place={Munich, Germany}, title={Test und Zuverlässigkeit nanoelektronischer Systeme}, booktitle={1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim}, year={2007} }
LibreCat
 

2006 | Journal Article | LibreCat-ID: 13045
@article{Becker_Polian_Hellebrand_Straube_Wunderlich_2006, title={DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme}, volume={48}, number={5}, journal={it - Information Technology}, author={Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim}, year={2006}, pages={305–311} }
LibreCat
 

2005 | Misc | LibreCat-ID: 13046
@book{Oehler_Hellebrand_2005, place={Kleinheubachertagung 2005, Miltenberg, Germany}, title={A Low Power Design for Embedded DRAMs with Online Consistency Checking}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005} }
LibreCat
 

2005 | Misc | LibreCat-ID: 13101
@book{Ali_Welzl_Hellebrand_2005, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria}, title={Dynamic Routing: A Prerequisite for Reliable NoCs}, author={Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille}, year={2005} }
LibreCat
 

2005 | Misc | LibreCat-ID: 13102
@book{Oehler_Hellebrand_2005, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria}, title={Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005} }
LibreCat
 

2005 | Conference Paper | LibreCat-ID: 12999
@inproceedings{Ali_Welzl_Zwicknagl_Hellebrand_2005, place={Islamabad, Pakistan}, title={Considerations for Fault-Tolerant Networks on Chips}, DOI={10.1109/icm.2005.1590063}, booktitle={IEEE International Conference on Microelectronics (ICM’05)}, publisher={IEEE}, author={Ali, Muhammad and Welzl, Michael and Zwicknagl, Martin and Hellebrand, Sybille}, year={2005} }
LibreCat | DOI
 

2005 | Conference Paper | LibreCat-ID: 13000
@inproceedings{Oehler_Hellebrand_2005, place={Tallinn, Estonia}, title={Low Power Embedded DRAMs with High Quality Error Correcting Capabilities}, DOI={10.1109/ets.2005.28}, booktitle={10th IEEE European Test Symposium (ETS’05)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005}, pages={148–153} }
LibreCat | DOI
 

2005 | Conference Paper | LibreCat-ID: 12998
@inproceedings{Ali_Welzl_Hellebrand_2005, place={Oulu, Finland}, title={A Dynamic Routing Mechanism for Network on Chip}, DOI={10.1109/norchp.2005.1596991}, booktitle={23rd IEEE NORCHIP Conference}, publisher={IEEE}, author={Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille}, year={2005}, pages={70–73} }
LibreCat | DOI
 

2004 | Conference Paper | LibreCat-ID: 13071
@inproceedings{Liu Jing_Ruehrup_Schindelhauer_Volbert_Dierkes_Bellgardt_Ibers_Hilleringmann_2004, place={Tilburg, Netherlands}, title={Sensor Networks with More Features Using Less Hardware}, booktitle={{GOR/NGB Conference Tilburg 2004}}, author={Liu Jing, Michelle and Ruehrup, Stefan and Schindelhauer, Christian and Volbert, Klaus and Dierkes, Martin and Bellgardt, Andreas and Ibers, Rüdiger and Hilleringmann, Ulrich}, year={2004} }
LibreCat
 

2004 | Misc | LibreCat-ID: 13099
@book{Breu_Fahringer_Fensel_Hellebrand_Middeldorp_Scherzer_2004, place={OCG Journal, pp. 28-29}, title={Im Westen viel Neues - Informatik an der Universität Innsbruck}, author={Breu, Ruth and Fahringer, Thomas and Fensel, Dieter and Hellebrand, Sybille and Middeldorp, Aart and Scherzer, Otmar}, year={2004} }
LibreCat
 

2004 | Misc | LibreCat-ID: 13100
@book{Hellebrand_Wuertenberger_S. Tautermann_2004, place={9th IEEE European Test Symposium, Ajaccio, Corsica, France}, title={Data Compression for Multiple Scan Chains Using Dictionaries with Corrections}, author={Hellebrand, Sybille and Wuertenberger, Armin and S. Tautermann, Christofer}, year={2004} }
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