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165 Publications
2007 | Misc | LibreCat-ID: 13042
@book{Oehler_Hellebrand_Wunderlich_2007, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany}, title={An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007} }
LibreCat
2007 | Misc | LibreCat-ID: 13043
@book{Hellebrand_2007, place={ForschungsForum Paderborn, 10. Ausgabe, Paderborn, Germany}, title={Qualitätssicherung für Nanochips - Wie IT-Produkte zuverlässig werden}, author={Hellebrand, Sybille}, year={2007} }
LibreCat
2007 | Conference Paper | LibreCat-ID: 12995
@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place={Rome, Italy}, title={A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction}, DOI={10.1109/dft.2007.43}, booktitle={22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)}, publisher={IEEE}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007}, pages={50–58} }
LibreCat
| DOI
2007 | Conference Paper | LibreCat-ID: 12996
@inproceedings{Oehler_Hellebrand_Wunderlich_2007, place={Krakow, Poland}, title={Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair}, DOI={10.1109/ddecs.2007.4295278}, booktitle={10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007}, pages={185–190} }
LibreCat
| DOI
2007 | Conference Paper | LibreCat-ID: 12997
@inproceedings{Oehler_Hellebrand_Wunderlich_2007, place={Freiburg, Germany}, title={An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy}, DOI={10.1109/ets.2007.10}, booktitle={12th IEEE European Test Symposium (ETS’07)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007}, pages={91–96} }
LibreCat
| DOI
2007 | Conference Paper | LibreCat-ID: 13037
@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place={Bled, Slovenia}, title={Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}, booktitle={43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007} }
LibreCat
2007 | Journal Article | LibreCat-ID: 13036
@article{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, title={Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}, volume={37}, number={4 (124)}, journal={Informacije MIDEM, Ljubljana (Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007}, pages={212–219} }
LibreCat
2007 | Journal Article | LibreCat-ID: 13044
@article{Ali_Hessler_Welzl_Hellebrand_2007, title={An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip}, volume={1}, number={2}, journal={International Journal on High Performance Systems Architecture}, author={Ali, Muhammad and Hessler, Sven and Welzl, Michael and Hellebrand, Sybille}, year={2007}, pages={113–123} }
LibreCat
2007 | Conference Paper | LibreCat-ID: 13040
@inproceedings{Ali_Welzl_Hessler_Hellebrand_2007, place={Las Vegas, Nevada, USA}, title={A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip}, booktitle={4th International Conference on Information Technology: New Generations (ITNG’07)}, author={Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille}, year={2007}, pages={1027–1032} }
LibreCat
2007 | Conference Paper | LibreCat-ID: 13041
@inproceedings{Becker_Polian_Hellebrand_Straube_Wunderlich_2007, place={Munich, Germany}, title={Test und Zuverlässigkeit nanoelektronischer Systeme}, booktitle={1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim}, year={2007} }
LibreCat
2006 | Journal Article | LibreCat-ID: 13045
@article{Becker_Polian_Hellebrand_Straube_Wunderlich_2006, title={DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme}, volume={48}, number={5}, journal={it - Information Technology}, author={Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim}, year={2006}, pages={305–311} }
LibreCat
2005 | Misc | LibreCat-ID: 13046
@book{Oehler_Hellebrand_2005, place={Kleinheubachertagung 2005, Miltenberg, Germany}, title={A Low Power Design for Embedded DRAMs with Online Consistency Checking}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005} }
LibreCat
2005 | Misc | LibreCat-ID: 13101
@book{Ali_Welzl_Hellebrand_2005, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria}, title={Dynamic Routing: A Prerequisite for Reliable NoCs}, author={Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille}, year={2005} }
LibreCat
2005 | Misc | LibreCat-ID: 13102
@book{Oehler_Hellebrand_2005, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria}, title={Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005} }
LibreCat
2005 | Conference Paper | LibreCat-ID: 12999
@inproceedings{Ali_Welzl_Zwicknagl_Hellebrand_2005, place={Islamabad, Pakistan}, title={Considerations for Fault-Tolerant Networks on Chips}, DOI={10.1109/icm.2005.1590063}, booktitle={IEEE International Conference on Microelectronics (ICM’05)}, publisher={IEEE}, author={Ali, Muhammad and Welzl, Michael and Zwicknagl, Martin and Hellebrand, Sybille}, year={2005} }
LibreCat
| DOI
2005 | Conference Paper | LibreCat-ID: 13000
@inproceedings{Oehler_Hellebrand_2005, place={Tallinn, Estonia}, title={Low Power Embedded DRAMs with High Quality Error Correcting Capabilities}, DOI={10.1109/ets.2005.28}, booktitle={10th IEEE European Test Symposium (ETS’05)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005}, pages={148–153} }
LibreCat
| DOI
2005 | Conference Paper | LibreCat-ID: 12998
@inproceedings{Ali_Welzl_Hellebrand_2005, place={Oulu, Finland}, title={A Dynamic Routing Mechanism for Network on Chip}, DOI={10.1109/norchp.2005.1596991}, booktitle={23rd IEEE NORCHIP Conference}, publisher={IEEE}, author={Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille}, year={2005}, pages={70–73} }
LibreCat
| DOI
2004 | Conference Paper | LibreCat-ID: 13071
@inproceedings{Liu Jing_Ruehrup_Schindelhauer_Volbert_Dierkes_Bellgardt_Ibers_Hilleringmann_2004, place={Tilburg, Netherlands}, title={Sensor Networks with More Features Using Less Hardware}, booktitle={{GOR/NGB Conference Tilburg 2004}}, author={Liu Jing, Michelle and Ruehrup, Stefan and Schindelhauer, Christian and Volbert, Klaus and Dierkes, Martin and Bellgardt, Andreas and Ibers, Rüdiger and Hilleringmann, Ulrich}, year={2004} }
LibreCat
2004 | Misc | LibreCat-ID: 13099
@book{Breu_Fahringer_Fensel_Hellebrand_Middeldorp_Scherzer_2004, place={OCG Journal, pp. 28-29}, title={Im Westen viel Neues - Informatik an der Universität Innsbruck}, author={Breu, Ruth and Fahringer, Thomas and Fensel, Dieter and Hellebrand, Sybille and Middeldorp, Aart and Scherzer, Otmar}, year={2004} }
LibreCat
2004 | Misc | LibreCat-ID: 13100
@book{Hellebrand_Wuertenberger_S. Tautermann_2004, place={9th IEEE European Test Symposium, Ajaccio, Corsica, France}, title={Data Compression for Multiple Scan Chains Using Dictionaries with Corrections}, author={Hellebrand, Sybille and Wuertenberger, Armin and S. Tautermann, Christofer}, year={2004} }
LibreCat
2004 | Conference Paper | LibreCat-ID: 13001
@inproceedings{Wuertenberger_S. Tautermann_Hellebrand_2004, place={Charlotte, NC, USA}, title={Data Compression for Multiple Scan Chains Using Dictionaries with Corrections}, DOI={10.1109/test.2004.1387357}, booktitle={IEEE International Test Conference (ITC’04)}, publisher={IEEE}, author={Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille}, year={2004}, pages={926–935} }
LibreCat
| DOI
2003 | Misc | LibreCat-ID: 13098
@book{Breu_Hellebrand_Welzl_2003, place={Handouts ACS/IEEE Workshop on Practice and Experience with Java in Education, Tunis, Tunisia}, title={Experiences from Teaching Software Development in a Java Environment}, author={Breu, Ruth and Hellebrand, Sybille and Welzl, Michael}, year={2003} }
LibreCat
2003 | Conference Paper | LibreCat-ID: 13002
@inproceedings{Wuertenberger_S. Tautermann_Hellebrand_2003, place={Charlotte, NC, USA}, title={A Hybrid Coding Strategy for Optimized Test Data Compression}, DOI={10.1109/test.2003.1270870}, booktitle={IEEE International Test Conference (ITC’03)}, publisher={IEEE}, author={Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille}, year={2003}, pages={451–459} }
LibreCat
| DOI
2002 | Misc | LibreCat-ID: 13097
@book{Hellebrand_Wuertenberger_2002, place={IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA}, title={Alternating Run-Length Coding: A Technique for Improved Test Data Compression}, author={Hellebrand, Sybille and Wuertenberger, Armin}, year={2002} }
LibreCat
2002 | Journal Article | LibreCat-ID: 13003
@article{Hellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_2002, title={Efficient Online and Offline Testing of Embedded DRAMs}, volume={51}, DOI={10.1109/tc.2002.1017700}, number={7}, journal={IEEE Transactions on Computers}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav}, year={2002}, pages={801–809} }
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 13069
@article{Hellebrand_Liang_Wunderlich_2002, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, volume={18}, number={2}, journal={Journal of Electronic Testing - Theory and Applications (JETTA)}, author={Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2002}, pages={157–168} }
LibreCat
2002 | Journal Article | LibreCat-ID: 13070
@article{Liang_Hellebrand_Wunderlich_2002, title={A Mixed-Mode BIST Scheme Based on Folding Compression}, volume={17}, number={2}, journal={Journal on Computer Science and Technology}, author={Liang, Huaguo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2002}, pages={203–212} }
LibreCat
2001 | Misc | LibreCat-ID: 13096
@book{Liang_Hellebrand_Wunderlich_2001, place={IEEE European Test Workshop, Stockholm, Sweden}, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001} }
LibreCat
2001 | Conference Paper | LibreCat-ID: 13004
@inproceedings{Liang_Hellebrand_Wunderlich_2001, place={Baltimore, MD, USA}, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, DOI={10.1109/test.2001.966712}, booktitle={IEEE International Test Conference (ITC’01)}, publisher={IEEE}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001}, pages={894–902} }
LibreCat
| DOI
2001 | Journal Article | LibreCat-ID: 13047
@article{Liang_Hellebrand_Wunderlich_2001, title={Deterministic BIST Scheme Based on Reseeding of Folding Counters}, volume={38}, number={8}, journal={Journal of Computer Research and Development, (Jisuanji Yanjiu yu Fazhan)}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001}, pages={931} }
LibreCat
2001 | Journal Article | LibreCat-ID: 13068
@article{Hellebrand_Liang_Wunderlich_2001, title={A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters}, volume={17}, number={3/4}, journal={Journal of Electronic Testing - Theory and Applications (JETTA)}, author={Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2001}, pages={341–349} }
LibreCat
2000 | Misc | LibreCat-ID: 13094
@book{Hellebrand_Wunderlich_2000, place={Handbuch Lehre, Berlin, Raabe Verlag}, title={Hardwarepraktikum im Diplomstudiengang Informatik}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2000} }
LibreCat
2000 | Misc | LibreCat-ID: 13095
@book{Hellebrand_Liang_Wunderlich_2000, place={IEEE European Test Workshop, Cascais, Portugal}, title={A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters}, author={Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2000} }
LibreCat
2000 | Conference Paper | LibreCat-ID: 13005
@inproceedings{Hellebrand_Liang_Wunderlich_2000, place={Atlantic City, NJ, USA}, title={A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters}, DOI={10.1109/test.2000.894274}, booktitle={IEEE International Test Conference (ITC’00)}, publisher={IEEE}, author={Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2000}, pages={778–784} }
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| DOI
1999 | Book | LibreCat-ID: 13065
@book{Hellebrand_1999, place={Verlag Dr. Kovac, Hamburg}, series={10}, title={Selbsttestbare Steuerwerke - Strukturen und Syntheseverfahren}, publisher={Verlag Dr. Kovac, Hamburg}, author={Hellebrand, Sybille}, year={1999}, collection={10} }
LibreCat
1999 | Misc | LibreCat-ID: 13093
@book{Hellebrand_Wunderlich_N. Yarmolik_1999, place={11th GI/ITG/GMM/IEEE Workshop}, title={Exploiting Symmetries to Speed Up Transparent BIST}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav}, year={1999} }
LibreCat
1999 | Conference Paper | LibreCat-ID: 13006
@inproceedings{Hellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_1999, place={Dana Point, CA, USA}, title={Error Detecting Refreshment for Embedded DRAMs}, DOI={10.1109/vtest.1999.766693}, booktitle={17th IEEE VLSI Test Symposium (VTS’99)}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav}, year={1999}, pages={384–390} }
LibreCat
| DOI
1999 | Conference Paper | LibreCat-ID: 13066
@inproceedings{N. Yarmolik_V. Bykov_Hellebrand_Wunderlich_1999, place={Prague, Czech Republic}, title={Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms}, booktitle={Third European Dependable Computing Conference (EDCC-3)}, author={N. Yarmolik, Vyacheslav and V. Bykov, Iuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1999} }
LibreCat
1999 | Conference Paper | LibreCat-ID: 13067
@inproceedings{Hellebrand_Wunderlich_N. Yarmolik_1999, place={Munich, Germany}, title={Symmetric Transparent BIST for RAMs}, booktitle={Design Automation and Test in Europe (DATE’99)}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav}, year={1999}, pages={702–707} }
LibreCat
1998 | Report | LibreCat-ID: 13029
@book{Hellebrand_Wunderlich_1998, place={Universität Stuttgart}, title={Test und Synthese schneller eingebetteter Systeme}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1998} }
LibreCat
1998 | Misc | LibreCat-ID: 13091
@book{N. Yarmolik_Hellebrand_Wunderlich_1998, place={5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA}, title={Efficient Consistency Checking for Embedded Memories}, author={N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1998} }
LibreCat
1998 | Misc | LibreCat-ID: 13092
@book{N. Yarmolik_Hellebrand_Wunderlich_1998, place={10th GI/ITG/GMM/IEEE Workshop}, title={Efficient Consistency Checking for Embedded Memories}, author={N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1998} }
LibreCat
1998 | Book Chapter | LibreCat-ID: 13060
@inbook{Hellebrand_Wunderlich_Hertwig_1998, place={In: M. Nicolaidis, Y. Zorian, D. K. Pradhan (Eds.): On-Line Testing for VLSI, Boston: Kluwer Academic Publishers 1998}, series={5}, title={Mixed-Mode BIST Using Embedded Processors}, booktitle={Mixed-Mode BIST Using Embedded Processors}, publisher={Kluwer Academic Publishers}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}, year={1998}, collection={5} }
LibreCat
1998 | Journal Article | LibreCat-ID: 13061
@article{Hellebrand_Wunderlich_Hertwig_1998, title={Mixed-Mode BIST Using Embedded Processors}, volume={12}, number={1/2}, journal={Journal of Electronic Testing Theory and Applications - JETTA}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}, year={1998}, pages={127–138} }
LibreCat
1998 | Journal Article | LibreCat-ID: 13064
@article{Hellebrand_Hertwig_Wunderlich_1998, title={Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications}, volume={15}, number={4}, journal={IEEE Design and Test}, publisher={IEEE}, author={Hellebrand, Sybille and Hertwig, Andre and Wunderlich, Hans-Joachim}, year={1998}, pages={36–41} }
LibreCat
1998 | Conference Paper | LibreCat-ID: 13007
@inproceedings{Hertwig_Hellebrand_Wunderlich_1998, place={Monterey, CA, USA}, title={Fast Self-Recovering Controllers}, DOI={10.1109/vtest.1998.670883}, booktitle={16th IEEE VLSI Test Symposium (VTS’98)}, publisher={IEEE}, author={Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1998}, pages={296–302} }
LibreCat
| DOI
1998 | Conference Paper | LibreCat-ID: 13008
@inproceedings{Hellebrand_Wunderlich_N. Yarmolik_1998, place={Paris, France}, title={Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs}, DOI={10.1109/date.1998.655853}, booktitle={Design Automation and Test in Europe (DATE’98)}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav}, year={1998}, pages={173–179} }
LibreCat
| DOI
1998 | Conference Paper | LibreCat-ID: 13063
@inproceedings{N. Yarmolik_V. Klimets_Hellebrand_Wunderlich_1998, place={Szczyrk, Poland}, title={New Transparent RAM BIST Based on Self-Adjusting Output Data Compression}, booktitle={Design & Diagnostics of Electronic Circuits & Systems (DDECS’98)}, author={N. Yarmolik, Vyacheslav and V. Klimets, Yuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1998}, pages={27–33} }
LibreCat
1997 | Misc | LibreCat-ID: 13089
@book{Tsai_Hellebrand_Rajski_Marek-Sadowska_1997, place={4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA}, title={STARBIST: Scan Autocorrelated Random Pattern Generation}, author={Tsai, Kun-Han and Hellebrand, Sybille and Rajski, Janusz and Marek-Sadowska, Malgorzata}, year={1997} }
LibreCat
1997 | Misc | LibreCat-ID: 13090
@book{Hertwig_Hellebrand_Wunderlich_1997, place={3rd IEEE International On-Line Testing Workshop, Crete, Greece}, title={Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications}, author={Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1997} }
LibreCat