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199 Publications


2002 | Journal Article | LibreCat-ID: 39926
Goser, K., et al. “VLSI Technologies for Artificial Neural Networks.” IEEE Micro, vol. 9, no. 6, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 28–44, doi:10.1109/40.42985.
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2002 | Conference Paper | LibreCat-ID: 39892
Blum, F., et al. “Nuclear Radiation Detectors on Various Type Diamonds.” IECON ’98. Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.98CH36200), IEEE, 2002, doi:10.1109/iecon.1998.724097.
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2002 | Journal Article | LibreCat-ID: 39920
Soennecken, A., et al. “Floating Gate Structures as Nonvolatile Analog Memory Cells in 1.0μm-LOCOS-CMOS Technology with PZT Dielectrica.” Microelectronic Engineering, vol. 15, no. 1–4, Elsevier BV, 2002, pp. 633–36, doi:10.1016/0167-9317(91)90299-s.
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2002 | Journal Article | LibreCat-ID: 39915
Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.” Microelectronic Engineering, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 211–14, doi:10.1016/0167-9317(92)90425-q.
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2002 | Journal Article | LibreCat-ID: 39916
Adams, S., et al. “CMOS Compatible Micromachining by Dry Silicon-Etching Techniques.” Microelectronic Engineering, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 191–94, doi:10.1016/0167-9317(92)90420-v.
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2002 | Journal Article | LibreCat-ID: 39348
Horstmann, J. T., et al. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.” IEEE Transactions on Electron Devices, vol. 45, no. 1, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 299–306, doi:10.1109/16.658845.
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2002 | Conference Paper | LibreCat-ID: 39923
Goser, K., et al. “Applications and Implementations of Neural Networks in Microelectronics-Overview and Status.” [1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications, IEEE Comput. Soc. Press, 2002, doi:10.1109/cmpeur.1991.257442.
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2002 | Journal Article | LibreCat-ID: 39889
Mankowski, V., et al. “12 KV Low Current Cascaded Light Triggered Switch on One Silicon Chip.” Microelectronic Engineering, vol. 46, no. 1–4, Elsevier BV, 2002, pp. 413–17, doi:10.1016/s0167-9317(99)00122-7.
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2002 | Journal Article | LibreCat-ID: 39891
Horstmann, J. T., et al. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.” IEEE Transactions on Electron Devices, vol. 45, no. 1, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 299–306, doi:10.1109/16.658845.
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2002 | Journal Article | LibreCat-ID: 39886
Wirth, G., et al. “Mesoscopic Transport Phenomena in Ultrashort Channel MOSFETs.” Solid-State Electronics, vol. 43, no. 7, Elsevier BV, 2002, pp. 1245–50, doi:10.1016/s0038-1101(99)00060-x.
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2002 | Journal Article | LibreCat-ID: 39876
Otterbach, R., et al. “Structures with a Minimum Feature Size of Less than 100 Nm in CVD-Diamond for Sensor Applications.” Diamond and Related Materials, vol. 10, no. 3–7, Elsevier BV, 2002, pp. 511–14, doi:10.1016/s0925-9635(01)00373-9.
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2002 | Journal Article | LibreCat-ID: 39877
Hilleringmann, Ulrich, et al. “A Structure Definition Technique for 25 Nm Lines of Silicon and Related Materials.” Microelectronic Engineering, vol. 53, no. 1–4, Elsevier BV, 2002, pp. 569–72, doi:10.1016/s0167-9317(00)00380-4.
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2002 | Journal Article | LibreCat-ID: 39874
Otterbach, R., and Ulrich Hilleringmann. “Reactive Ion Etching of CVD-Diamond for Piezoresistive Pressure Sensors.” Diamond and Related Materials, vol. 11, no. 3–6, Elsevier BV, 2002, pp. 841–44, doi:10.1016/s0925-9635(01)00703-8.
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2002 | Book Chapter | LibreCat-ID: 39875
Hilleringmann, Ulrich. “Metallisierung Und Kontakte.” Silizium-Halbleitertechnologie, Vieweg+Teubner Verlag, 2002, pp. 131–151, doi:10.1007/978-3-322-94119-0_8.
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2000 | Conference Paper | LibreCat-ID: 39884
Hilleringmann, Ulrich, et al. “Nanometer Scale Lateral Structures of MOS Type Layers.” Proceedings Micro. Tec, 2000, pp. 49–53.
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1999 | Conference Paper | LibreCat-ID: 39890
Otterbach, R., and Ulrich Hilleringmann. “High Rate CVD-Diamond Etching for High Temperature Pressure Sensor Applications.” 29th European Solid-State Device Research Conference, vol. 1, 1999, pp. 320–23.
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1998 | Conference Paper | LibreCat-ID: 39893
Horstmann, J. T., et al. “Correlation Analysis of the Statistical Electrical Parameter Fluctuations in 50 Nm MOS-Transistors.” 28th European Solid-State Device Research Conference, 1998, pp. 512–15.
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1997 | Journal Article | LibreCat-ID: 39896
Heinrich, L. M. H., et al. “CMOS-Compatible Organic Light-Emitting Diodes.” IEEE Transactions on Electron Devices, vol. 44, no. 8, 1997, pp. 1249–52, doi:10.1109/16.605463.
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1996 | Conference Paper | LibreCat-ID: 39902
Muller, J., et al. “Analyses of Sub 1/4-Micron MOS-Transistors by Visible Light Emission.” ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 1996, pp. 947–50.
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1996 | Conference Paper | LibreCat-ID: 39900
Horstmann, J. T., et al. “Characterization and Matching Analysis of 50 Nm-NMOS-Transistors.” ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 1996, pp. 253–56.
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