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199 Publications
2002 | Journal Article | LibreCat-ID: 39926
Goser, K., Ulrich Hilleringmann, U. Rueckert, and K. Schumacher. “VLSI Technologies for Artificial Neural Networks.” IEEE Micro 9, no. 6 (2002): 28–44. https://doi.org/10.1109/40.42985.
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| DOI
2002 | Conference Paper | LibreCat-ID: 39892
Blum, F., A. Denisenko, R. Job, D. Borchert, W. Weber, J.V. Borany, Ulrich Hilleringmann, and W.R. Fahrner. “Nuclear Radiation Detectors on Various Type Diamonds.” In IECON ’98. Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.98CH36200). IEEE, 2002. https://doi.org/10.1109/iecon.1998.724097.
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| DOI
2002 | Journal Article | LibreCat-ID: 39920
Soennecken, A., Ulrich Hilleringmann, and K. Goser. “Floating Gate Structures as Nonvolatile Analog Memory Cells in 1.0μm-LOCOS-CMOS Technology with PZT Dielectrica.” Microelectronic Engineering 15, no. 1–4 (2002): 633–36. https://doi.org/10.1016/0167-9317(91)90299-s.
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| DOI
2002 | Journal Article | LibreCat-ID: 39915
Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.” Microelectronic Engineering 19, no. 1–4 (2002): 211–14. https://doi.org/10.1016/0167-9317(92)90425-q.
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| DOI
2002 | Journal Article | LibreCat-ID: 39916
Adams, S., Ulrich Hilleringmann, and K. Goser. “CMOS Compatible Micromachining by Dry Silicon-Etching Techniques.” Microelectronic Engineering 19, no. 1–4 (2002): 191–94. https://doi.org/10.1016/0167-9317(92)90420-v.
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| DOI
2002 | Journal Article | LibreCat-ID: 39348
Horstmann, J.T., Ulrich Hilleringmann, and K.F. Goser. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.” IEEE Transactions on Electron Devices 45, no. 1 (2002): 299–306. https://doi.org/10.1109/16.658845.
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| DOI
2002 | Conference Paper | LibreCat-ID: 39923
Goser, K., Ulrich Hilleringmann, and U. Rueckert. “Applications and Implementations of Neural Networks in Microelectronics-Overview and Status.” In [1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications. IEEE Comput. Soc. Press, 2002. https://doi.org/10.1109/cmpeur.1991.257442.
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| DOI
2002 | Journal Article | LibreCat-ID: 39889
Mankowski, V., Ulrich Hilleringmann, and K. Schumacher. “12 KV Low Current Cascaded Light Triggered Switch on One Silicon Chip.” Microelectronic Engineering 46, no. 1–4 (2002): 413–17. https://doi.org/10.1016/s0167-9317(99)00122-7.
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| DOI
2002 | Journal Article | LibreCat-ID: 39891
Horstmann, J.T., Ulrich Hilleringmann, and K.F. Goser. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.” IEEE Transactions on Electron Devices 45, no. 1 (2002): 299–306. https://doi.org/10.1109/16.658845.
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| DOI
2002 | Journal Article | LibreCat-ID: 39886
Wirth, G, Ulrich Hilleringmann, J.T Horstmann, and K Goser. “Mesoscopic Transport Phenomena in Ultrashort Channel MOSFETs.” Solid-State Electronics 43, no. 7 (2002): 1245–50. https://doi.org/10.1016/s0038-1101(99)00060-x.
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| DOI
2002 | Journal Article | LibreCat-ID: 39876
Otterbach, R., Ulrich Hilleringmann, T.J. Horstmann, and K. Goser. “Structures with a Minimum Feature Size of Less than 100 Nm in CVD-Diamond for Sensor Applications.” Diamond and Related Materials 10, no. 3–7 (2002): 511–14. https://doi.org/10.1016/s0925-9635(01)00373-9.
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| DOI
2002 | Journal Article | LibreCat-ID: 39877
Hilleringmann, Ulrich, T. Vieregge, and J.T. Horstmann. “A Structure Definition Technique for 25 Nm Lines of Silicon and Related Materials.” Microelectronic Engineering 53, no. 1–4 (2002): 569–72. https://doi.org/10.1016/s0167-9317(00)00380-4.
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| DOI
2002 | Journal Article | LibreCat-ID: 39874
Otterbach, R., and Ulrich Hilleringmann. “Reactive Ion Etching of CVD-Diamond for Piezoresistive Pressure Sensors.” Diamond and Related Materials 11, no. 3–6 (2002): 841–44. https://doi.org/10.1016/s0925-9635(01)00703-8.
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| DOI
2002 | Book Chapter | LibreCat-ID: 39875
Hilleringmann, Ulrich. “Metallisierung Und Kontakte.” In Silizium-Halbleitertechnologie, 131–151. Wiesbaden: Vieweg+Teubner Verlag, 2002. https://doi.org/10.1007/978-3-322-94119-0_8.
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| DOI
2000 | Conference Paper | LibreCat-ID: 39884
Hilleringmann, Ulrich, T Vieregge, and JT Horstmann. “Nanometer Scale Lateral Structures of MOS Type Layers.” In Proceedings Micro. Tec, 49–53, 2000.
LibreCat
1999 | Conference Paper | LibreCat-ID: 39890
Otterbach, R., and Ulrich Hilleringmann. “High Rate CVD-Diamond Etching for High Temperature Pressure Sensor Applications.” In 29th European Solid-State Device Research Conference, 1:320–23, 1999.
LibreCat
1998 | Conference Paper | LibreCat-ID: 39893
Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Correlation Analysis of the Statistical Electrical Parameter Fluctuations in 50 Nm MOS-Transistors.” In 28th European Solid-State Device Research Conference, 512–15, 1998.
LibreCat
1997 | Journal Article | LibreCat-ID: 39896
Heinrich, L.M.H., J. Muller, Ulrich Hilleringmann, K.F. Goser, A. Holmes, Do-Hoon Hwang, and R. Stern. “CMOS-Compatible Organic Light-Emitting Diodes.” IEEE Transactions on Electron Devices 44, no. 8 (1997): 1249–52. https://doi.org/10.1109/16.605463.
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| DOI
1996 | Conference Paper | LibreCat-ID: 39902
Muller, J., G. Wirth, Ulrich Hilleringmann, and K. Goser. “Analyses of Sub 1/4-Micron MOS-Transistors by Visible Light Emission.” In ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 947–50, 1996.
LibreCat
1996 | Conference Paper | LibreCat-ID: 39900
Horstmann, J. T., Ulrich Hilleringmann, and K. Goser. “Characterization and Matching Analysis of 50 Nm-NMOS-Transistors.” In ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 253–56, 1996.
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