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199 Publications
2002 | Journal Article | LibreCat-ID: 39926
Goser K, Hilleringmann U, Rueckert U, Schumacher K. VLSI technologies for artificial neural networks. IEEE Micro. 2002;9(6):28-44. doi:10.1109/40.42985
LibreCat
| DOI
2002 | Conference Paper | LibreCat-ID: 39892
Blum F, Denisenko A, Job R, et al. Nuclear radiation detectors on various type diamonds. In: IECON ’98. Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.98CH36200). IEEE; 2002. doi:10.1109/iecon.1998.724097
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39920
Soennecken A, Hilleringmann U, Goser K. Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica. Microelectronic Engineering. 2002;15(1-4):633-636. doi:10.1016/0167-9317(91)90299-s
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39915
Hilleringmann U, Goser K. Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon. Microelectronic Engineering. 2002;19(1-4):211-214. doi:10.1016/0167-9317(92)90425-q
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39916
Adams S, Hilleringmann U, Goser K. CMOS compatible micromachining by dry silicon-etching techniques. Microelectronic Engineering. 2002;19(1-4):191-194. doi:10.1016/0167-9317(92)90420-v
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39348
Horstmann JT, Hilleringmann U, Goser KF. Matching analysis of deposition defined 50-nm MOSFET’s. IEEE Transactions on Electron Devices. 2002;45(1):299-306. doi:10.1109/16.658845
LibreCat
| DOI
2002 | Conference Paper | LibreCat-ID: 39923
Goser K, Hilleringmann U, Rueckert U. Applications and implementations of neural networks in microelectronics-overview and status. In: [1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications. IEEE Comput. Soc. Press; 2002. doi:10.1109/cmpeur.1991.257442
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39889
Mankowski V, Hilleringmann U, Schumacher K. 12 kV low current cascaded light triggered switch on one silicon chip. Microelectronic Engineering. 2002;46(1-4):413-417. doi:10.1016/s0167-9317(99)00122-7
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39891
Horstmann JT, Hilleringmann U, Goser KF. Matching analysis of deposition defined 50-nm MOSFET’s. IEEE Transactions on Electron Devices. 2002;45(1):299-306. doi:10.1109/16.658845
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39886
Wirth G, Hilleringmann U, Horstmann JT, Goser K. Mesoscopic transport phenomena in ultrashort channel MOSFETs. Solid-State Electronics. 2002;43(7):1245-1250. doi:10.1016/s0038-1101(99)00060-x
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39876
Otterbach R, Hilleringmann U, Horstmann TJ, Goser K. Structures with a minimum feature size of less than 100 nm in CVD-diamond for sensor applications. Diamond and Related Materials. 2002;10(3-7):511-514. doi:10.1016/s0925-9635(01)00373-9
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39877
Hilleringmann U, Vieregge T, Horstmann JT. A structure definition technique for 25 nm lines of silicon and related materials. Microelectronic Engineering. 2002;53(1-4):569-572. doi:10.1016/s0167-9317(00)00380-4
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39874
Otterbach R, Hilleringmann U. Reactive ion etching of CVD-diamond for piezoresistive pressure sensors. Diamond and Related Materials. 2002;11(3-6):841-844. doi:10.1016/s0925-9635(01)00703-8
LibreCat
| DOI
2002 | Book Chapter | LibreCat-ID: 39875
Hilleringmann U. Metallisierung und Kontakte. In: Silizium-Halbleitertechnologie. Vieweg+Teubner Verlag; 2002:131–151. doi:10.1007/978-3-322-94119-0_8
LibreCat
| DOI
2000 | Conference Paper | LibreCat-ID: 39884
Hilleringmann U, Vieregge T, Horstmann J. Nanometer Scale Lateral Structures of MOS Type Layers. In: Proceedings Micro. Tec. ; 2000:49–53.
LibreCat
1999 | Conference Paper | LibreCat-ID: 39890
Otterbach R, Hilleringmann U. High rate CVD-diamond etching for high temperature pressure sensor applications. In: 29th European Solid-State Device Research Conference. Vol 1. ; 1999:320-323.
LibreCat
1998 | Conference Paper | LibreCat-ID: 39893
Horstmann JT, Hilleringmann U, Goser K. Correlation Analysis of the Statistical Electrical Parameter Fluctuations in 50 nm MOS-Transistors. In: 28th European Solid-State Device Research Conference. ; 1998:512-515.
LibreCat
1997 | Journal Article | LibreCat-ID: 39896
Heinrich LMH, Muller J, Hilleringmann U, et al. CMOS-compatible organic light-emitting diodes. IEEE Transactions on Electron Devices. 1997;44(8):1249-1252. doi:10.1109/16.605463
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| DOI
1996 | Conference Paper | LibreCat-ID: 39902
Muller J, Wirth G, Hilleringmann U, Goser K. Analyses of Sub 1/4-Micron MOS-Transistors by Visible Light Emission. In: ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference. ; 1996:947-950.
LibreCat
1996 | Conference Paper | LibreCat-ID: 39900
Horstmann JT, Hilleringmann U, Goser K. Characterization and Matching Analysis of 50 nm-NMOS-Transistors. In: ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference. ; 1996:253-256.
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