Please note that LibreCat no longer supports Internet Explorer versions 8 or 9 (or earlier).
We recommend upgrading to the latest Internet Explorer, Google Chrome, or Firefox.
124 Publications
2002 | Journal Article | LibreCat-ID: 39912
Schönstein, I., J. Müller, Ulrich Hilleringmann, and K. Goser. “Characterization of Submicron NMOS Devices Due to Visible Light Emission.” Microelectronic Engineering 21, no. 1–4 (2002): 363–66. https://doi.org/10.1016/0167-9317(93)90092-j.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39914
Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.” Microelectronic Engineering 19, no. 1–4 (2002): 211–14. https://doi.org/10.1016/0167-9317(92)90425-q.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39899
Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Characterisation of Sub-100 Nm-MOS-Transistors Processed by Optical Lithography and a Sidewall-Etchback Technique.” Microelectronic Engineering 30, no. 1–4 (2002): 431–34. https://doi.org/10.1016/0167-9317(95)00280-4.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39882
Mankowski, V., Ulrich Hilleringmann, and K. Schumacher. “A Novel Insulation Technique for Smart Power Switching Devices and Very High Voltage ICs above 10 KV.” Microelectronic Engineering 53, no. 1–4 (2002): 525–28. https://doi.org/10.1016/s0167-9317(00)00370-1.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39879
Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “1/f-Noise of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.” Microelectronic Engineering 53, no. 1–4 (2002): 213–16. https://doi.org/10.1016/s0167-9317(00)00299-9.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39919
Hilleringmann, Ulrich, K. Knospe, C. Heite, K. Schumacher, and K. Goser. “A Silicon Based Technology for Monolithic Integration of Waveguides and VLSI CMOS Circuits.” Microelectronic Engineering 15, no. 1–4 (2002): 289–92. https://doi.org/10.1016/0167-9317(91)90231-2.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39920
Soennecken, A., Ulrich Hilleringmann, and K. Goser. “Floating Gate Structures as Nonvolatile Analog Memory Cells in 1.0μm-LOCOS-CMOS Technology with PZT Dielectrica.” Microelectronic Engineering 15, no. 1–4 (2002): 633–36. https://doi.org/10.1016/0167-9317(91)90299-s.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39915
Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.” Microelectronic Engineering 19, no. 1–4 (2002): 211–14. https://doi.org/10.1016/0167-9317(92)90425-q.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39916
Adams, S., Ulrich Hilleringmann, and K. Goser. “CMOS Compatible Micromachining by Dry Silicon-Etching Techniques.” Microelectronic Engineering 19, no. 1–4 (2002): 191–94. https://doi.org/10.1016/0167-9317(92)90420-v.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39348
Horstmann, J.T., Ulrich Hilleringmann, and K.F. Goser. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.” IEEE Transactions on Electron Devices 45, no. 1 (2002): 299–306. https://doi.org/10.1109/16.658845.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39889
Mankowski, V., Ulrich Hilleringmann, and K. Schumacher. “12 KV Low Current Cascaded Light Triggered Switch on One Silicon Chip.” Microelectronic Engineering 46, no. 1–4 (2002): 413–17. https://doi.org/10.1016/s0167-9317(99)00122-7.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39891
Horstmann, J.T., Ulrich Hilleringmann, and K.F. Goser. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.” IEEE Transactions on Electron Devices 45, no. 1 (2002): 299–306. https://doi.org/10.1109/16.658845.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39886
Wirth, G, Ulrich Hilleringmann, J.T Horstmann, and K Goser. “Mesoscopic Transport Phenomena in Ultrashort Channel MOSFETs.” Solid-State Electronics 43, no. 7 (2002): 1245–50. https://doi.org/10.1016/s0038-1101(99)00060-x.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39876
Otterbach, R., Ulrich Hilleringmann, T.J. Horstmann, and K. Goser. “Structures with a Minimum Feature Size of Less than 100 Nm in CVD-Diamond for Sensor Applications.” Diamond and Related Materials 10, no. 3–7 (2002): 511–14. https://doi.org/10.1016/s0925-9635(01)00373-9.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39877
Hilleringmann, Ulrich, T. Vieregge, and J.T. Horstmann. “A Structure Definition Technique for 25 Nm Lines of Silicon and Related Materials.” Microelectronic Engineering 53, no. 1–4 (2002): 569–72. https://doi.org/10.1016/s0167-9317(00)00380-4.
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 39874
Otterbach, R., and Ulrich Hilleringmann. “Reactive Ion Etching of CVD-Diamond for Piezoresistive Pressure Sensors.” Diamond and Related Materials 11, no. 3–6 (2002): 841–44. https://doi.org/10.1016/s0925-9635(01)00703-8.
LibreCat
| DOI
2000 | Journal Article | LibreCat-ID: 40083
Glossmann, Jochen, Andreas Hoischen, Thorsten Roder, and Heinz-Siegfried Kitzerow. “Asymmetric Switching and Storage Effects in Ferroelectric and Antiferroelectric Gels and Polymers.” Ferroelectrics 243, no. 1 (2000): 95–106. https://doi.org/10.1080/00150190008008011.
LibreCat
| DOI
1999 | Journal Article | LibreCat-ID: 40223
Buey, Julio, Pablo Espinet, Heinz-Siegfried Kitzerow, and Jochen Strauss. “Metallomesogens Presenting Blue Phases in a Glassy State and in Metallomesogen/Nematic Mixtures.” Chemical Communications, no. 5 (1999): 441–42. https://doi.org/10.1039/a900374f.
LibreCat
| DOI
1996 | Journal Article | LibreCat-ID: 40081
Kitzerow, Heinz-Siegfried, Andrew J. Slaney, and John W. Goodby. “Electric Field-Induced Transition from the Twist Grain Boundary TGBAPhase to the Tilted Smectic SmC* Phase.” Ferroelectrics 179, no. 1 (1996): 61–80. https://doi.org/10.1080/00150199608007874.
LibreCat
| DOI
1994 | Journal Article | LibreCat-ID: 35384
Kratzat, Krystyna, Claudia Schmidt, and Heino Finkelmann. “A Doubly Branched Nonionic Oligooxyethylene V-Amphiphile: Effect of Molecular Geometry on Liquid-Crystalline Phase Behavior, 3.” Journal of Colloid and Interface Science 163, no. 1 (1994): 190–98. https://doi.org/10.1006/jcis.1994.1095.
LibreCat
| DOI