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165 Publications
2009 | Conference Paper | LibreCat-ID: 13030
@inproceedings{Hunger_Hellebrand_Czutro_Polian_Becker_2009, place={Stuttgart, Germany}, title={Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung}, booktitle={3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Hunger, Marc and Hellebrand, Sybille and Czutro, Alexander and Polian, Ilia and Becker, Bernd}, year={2009} }
LibreCat
2008 | Misc | LibreCat-ID: 13033
@book{Coym_Hellebrand_Ludwig_Straube_Wunderlich_G. Zoellin_2008, place={20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich}, title={Ein verfeinertes elektrisches Modell für Teilchentreffer und dessen Auswirkung auf die Bewertung der Schaltungsempfindlichkeit}, author={Coym, Torsten and Hellebrand, Sybille and Ludwig, Stefan and Straube, Bernd and Wunderlich, Hans-Joachim and G. Zoellin, Christian}, year={2008} }
LibreCat
2008 | Misc | LibreCat-ID: 13035
@book{Amgalan_Hachmann_Hellebrand_Wunderlich_2008, place={20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich}, title={Testen mit Rücksetzpunkten - ein Ansatz zur Verbesserung der Ausbeute bei robusten Schaltungen}, author={Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2008} }
LibreCat
2008 | Conference Paper | LibreCat-ID: 12992
@inproceedings{Oehler_Bosio_di Natale_Hellebrand_2008, place={Rhodos, Greece}, title={A Modular Memory BIST for Optimized Memory Repair}, DOI={10.1109/iolts.2008.30}, booktitle={14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)}, publisher={IEEE}, author={Oehler, Philipp and Bosio, Alberto and di Natale, Giorgio and Hellebrand, Sybille}, year={2008} }
LibreCat
| DOI
2008 | Conference Paper | LibreCat-ID: 12994
@inproceedings{Amgalan_Hachmann_Hellebrand_Wunderlich_2008, place={San Diego, CA, USA}, title={Signature Rollback - A Technique for Testing Robust Circuits}, DOI={10.1109/vts.2008.34}, booktitle={26th IEEE VLSI Test Symposium (VTS’08)}, publisher={IEEE}, author={Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2008}, pages={125–130} }
LibreCat
| DOI
2008 | Conference Paper | LibreCat-ID: 12993
@inproceedings{Hunger_Hellebrand_2008, place={Rhodos, Greece}, title={Verification and Analysis of Self-Checking Properties through ATPG}, DOI={10.1109/iolts.2008.32}, booktitle={14th IEEE International On-Line Testing Symposium (IOLTS’08)}, publisher={IEEE}, author={Hunger, Marc and Hellebrand, Sybille}, year={2008} }
LibreCat
| DOI
2008 | Conference Paper | LibreCat-ID: 13031
@inproceedings{Hunger_Hellebrand_2008, place={Ingolstadt, Germany}, title={Analyse selbstprüfender Schaltungen – Nachweis von Fehlersicherheit und Selbsttestbarkeit mit ATPG}, booktitle={2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Hunger, Marc and Hellebrand, Sybille}, year={2008} }
LibreCat
2008 | Conference Paper | LibreCat-ID: 13032
@inproceedings{Oehler_Bosio_Di Natale_Hellebrand_2008, place={Ingolstadt, Germany}, title={Modularer Selbsttest und optimierte Reparaturanalyse}, booktitle={2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Oehler, Philipp and Bosio, Alberto and Di Natale, Giorgio and Hellebrand, Sybille}, year={2008} }
LibreCat
2007 | Misc | LibreCat-ID: 13038
@book{Hellebrand_2007, place={5th IEEE East-West Design \& Test Symposium, Yerevan, Armenia (Invited Talk)}, title={Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing}, author={Hellebrand, Sybille}, year={2007} }
LibreCat
2007 | Misc | LibreCat-ID: 13039
@book{Ali_Welzl_Hessler_Hellebrand_2007, place={DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster)}, title={An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips}, author={Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille}, year={2007} }
LibreCat
2007 | Misc | LibreCat-ID: 13042
@book{Oehler_Hellebrand_Wunderlich_2007, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany}, title={An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007} }
LibreCat
2007 | Misc | LibreCat-ID: 13043
@book{Hellebrand_2007, place={ForschungsForum Paderborn, 10. Ausgabe, Paderborn, Germany}, title={Qualitätssicherung für Nanochips - Wie IT-Produkte zuverlässig werden}, author={Hellebrand, Sybille}, year={2007} }
LibreCat
2007 | Conference Paper | LibreCat-ID: 12995
@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place={Rome, Italy}, title={A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction}, DOI={10.1109/dft.2007.43}, booktitle={22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)}, publisher={IEEE}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007}, pages={50–58} }
LibreCat
| DOI
2007 | Conference Paper | LibreCat-ID: 12996
@inproceedings{Oehler_Hellebrand_Wunderlich_2007, place={Krakow, Poland}, title={Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair}, DOI={10.1109/ddecs.2007.4295278}, booktitle={10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007}, pages={185–190} }
LibreCat
| DOI
2007 | Conference Paper | LibreCat-ID: 12997
@inproceedings{Oehler_Hellebrand_Wunderlich_2007, place={Freiburg, Germany}, title={An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy}, DOI={10.1109/ets.2007.10}, booktitle={12th IEEE European Test Symposium (ETS’07)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007}, pages={91–96} }
LibreCat
| DOI
2007 | Conference Paper | LibreCat-ID: 13037
@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place={Bled, Slovenia}, title={Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}, booktitle={43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007} }
LibreCat
2007 | Journal Article | LibreCat-ID: 13036
@article{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, title={Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}, volume={37}, number={4 (124)}, journal={Informacije MIDEM, Ljubljana (Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007}, pages={212–219} }
LibreCat
2007 | Journal Article | LibreCat-ID: 13044
@article{Ali_Hessler_Welzl_Hellebrand_2007, title={An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip}, volume={1}, number={2}, journal={International Journal on High Performance Systems Architecture}, author={Ali, Muhammad and Hessler, Sven and Welzl, Michael and Hellebrand, Sybille}, year={2007}, pages={113–123} }
LibreCat
2007 | Conference Paper | LibreCat-ID: 13040
@inproceedings{Ali_Welzl_Hessler_Hellebrand_2007, place={Las Vegas, Nevada, USA}, title={A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip}, booktitle={4th International Conference on Information Technology: New Generations (ITNG’07)}, author={Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille}, year={2007}, pages={1027–1032} }
LibreCat
2007 | Conference Paper | LibreCat-ID: 13041
@inproceedings{Becker_Polian_Hellebrand_Straube_Wunderlich_2007, place={Munich, Germany}, title={Test und Zuverlässigkeit nanoelektronischer Systeme}, booktitle={1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim}, year={2007} }
LibreCat