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136 Publications


2019 | Misc | LibreCat-ID: 8112
Maaz, Mohammad Urf, et al. A Hybrid Space Compactor for Varying X-Rates. 31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19), 2019.
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2019 | Journal Article | LibreCat-ID: 8667
Sprenger, Alexander, and Sybille Hellebrand. “Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test.” Journal of Circuits, Systems and Computers, vol. 28, no. 1, World Scientific Publishing Company, 2019, pp. 1–23, doi:10.1142/s0218126619400012.
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2019 | Conference Paper | LibreCat-ID: 12918
Maaz, Mohammad Urf, et al. “A Hybrid Space Compactor for Adaptive X-Handling.” 50th IEEE International Test Conference (ITC), IEEE, 2019, pp. 1–8.
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2019 | Journal Article | LibreCat-ID: 13048
Kampmann, Matthias, et al. “Built-in Test for Hidden Delay Faults.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), vol. 38, no. 10, IEEE, 2019, pp. 1956–68.
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2018 | Misc | LibreCat-ID: 4576
Sprenger, Alexander, and Sybille Hellebrand. Stochastische Kompaktierung für den Hochgeschwindigkeitstest. 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), 2018.
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2018 | Journal Article | LibreCat-ID: 13057
Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test - A Simulation Study.” Microelectronics Reliability, vol. 80, 2018, pp. 124–33.
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2018 | Misc | LibreCat-ID: 13072
Kampmann, Matthias, and Sybille Hellebrand. Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test. 2018.
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2018 | Journal Article | LibreCat-ID: 12974
Hellebrand, Sybille, et al. “Guest Editors’ Introduction - Special Issue on Approximate Computing.” IEEE Embedded Systems Letters, vol. 10, no. 1, IEEE, 2018, pp. 1–1, doi:10.1109/les.2018.2789942.
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2018 | Conference Paper | LibreCat-ID: 10575
Liu, Chang, et al. “Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.” 2018 IEEE 27th Asian Test Symposium (ATS), 2018, doi:10.1109/ats.2018.00028.
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2018 | Conference Paper | LibreCat-ID: 4575
Sprenger, Alexander, and Sybille Hellebrand. “Tuning Stochastic Space Compaction to Faster-than-at-Speed Test.” 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), IEEE, 2018, doi:10.1109/ddecs.2018.00020.
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2017 | Conference Paper | LibreCat-ID: 10576
Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting X-Tolerant Compaction during Faster-than-at-Speed Test.” 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), IEEE, 2017, doi:10.1109/ddecs.2017.7934564.
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2017 | Conference Paper | LibreCat-ID: 12973
Deshmukh, Jyotirmoy, et al. “Special Session on Early Life Failures.” 35th IEEE VLSI Test Symposium (VTS’17), IEEE, 2017, doi:10.1109/vts.2017.7928933.
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2017 | Misc | LibreCat-ID: 13078
Kampmann, Matthias, and Sybille Hellebrand. X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz. 2017.
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2016 | Conference Paper | LibreCat-ID: 12975
Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test.” 25th IEEE Asian Test Symposium (ATS’16), IEEE, 2016, pp. 1–6, doi:10.1109/ats.2016.20.
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2015 | Conference Paper | LibreCat-ID: 12976
Kampmann, Matthias, et al. “Optimized Selection of Frequencies for Faster-Than-at-Speed Test.” 24th IEEE Asian Test Symposium (ATS’15), IEEE, 2015, pp. 109–14, doi:10.1109/ats.2015.26.
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2015 | Journal Article | LibreCat-ID: 13056
Huang, Zhengfeng, et al. “A High Performance SEU Tolerant Latch.” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 31, no. 4, Springer, 2015, pp. 349–59.
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2015 | Misc | LibreCat-ID: 13077
Hellebrand, Sybille, et al. Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler. 2015.
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2014 | Conference Paper | LibreCat-ID: 12977
Hellebrand, Sybille, et al. “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects.” IEEE International Test Conference (ITC’14), IEEE, 2014, doi:10.1109/test.2014.7035360.
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2014 | Journal Article | LibreCat-ID: 13054
Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond Stuck-at Fault Testing.” DeGruyter Journal on Information Technology (It), vol. 56, no. 4, DeGruyter, 2014, pp. 165–72.
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2014 | Journal Article | LibreCat-ID: 13055
Rodriguez Gomez, Laura, et al. “Adaptive Bayesian Diagnosis of Intermittent Faults.” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 30, no. 5, Springer, 2014, pp. 527–40.
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2013 | Misc | LibreCat-ID: 13075
Cook, Alejandro, et al. Adaptive Test and Diagnosis of Intermittent Faults. 2013.
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2013 | Conference Paper | LibreCat-ID: 12979
Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.” 14th IEEE Latin American Test Workshop - (LATW’13), IEEE, 2013, doi:10.1109/latw.2013.6562662.
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2012 | Conference Paper | LibreCat-ID: 12980
Cook, Alejandro, et al. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” 13th IEEE Latin American Test Workshop (LATW’12), IEEE, 2012, pp. 1–4, doi:10.1109/latw.2012.6261229.
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2012 | Conference Paper | LibreCat-ID: 12981
Cook, Alejandro, et al. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.” 17th IEEE European Test Symposium (ETS’12), IEEE, 2012, pp. 1–6, doi:10.1109/ets.2012.6233025.
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2012 | Misc | LibreCat-ID: 13074
Cook, Alejandro, et al. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 2012.
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2011 | Conference Paper | LibreCat-ID: 12984
Polian, Ilia, et al. “Towards Variation-Aware Test Methods.” 16th IEEE European Test Symposium Trondheim (ETS’11), IEEE, 2011, doi:10.1109/ets.2011.51.
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2011 | Journal Article | LibreCat-ID: 13052
Hopsch, Fabian, et al. “Variation-Aware Fault Modeling.” {SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer}, vol. 54, no. 4, 2011, pp. 1813–26.
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2011 | Conference Paper | LibreCat-ID: 13053
Cook, Alejandro, et al. “Robuster Selbsttest Mit Diagnose.” 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,” 2011, pp. 48–53.
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2011 | Conference Paper | LibreCat-ID: 12982
Cook, Alejandro, et al. “Diagnostic Test of Robust Circuits.” 20th IEEE Asian Test Symposium (ATS’11), IEEE, 2011, pp. 285–90, doi:10.1109/ats.2011.55.
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2010 | Conference Paper | LibreCat-ID: 12983
Hopsch, Fabian, et al. “Variation-Aware Fault Modeling.” {19th IEEE Asian Test Symposium (ATS’10)}, {IEEE}, 2010, pp. 87–93, doi:10.1109/ats.2010.24.
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2010 | Conference Paper | LibreCat-ID: 12988
Froese, Viktor, et al. “Reusing NoC-Infrastructure for Test Data Compression.” {28th IEEE VLSI Test Symposium (VTS’10)}, {IEEE}, 2010, pp. 227–31, doi:10.1109/vts.2010.5469570.
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2010 | Conference Paper | LibreCat-ID: 13049
Becker, Bernd, et al. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” {4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}, 2010.
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2010 | Conference Paper | LibreCat-ID: 13051
Hunger, Marc, and Sybille Hellebrand. “Ausbeute Und Fehlertoleranz Bei Dreifach Modularer Redundanz.” 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2010, pp. 81–88.
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2010 | Conference Paper | LibreCat-ID: 12985
Indlekofer, Thomas, et al. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” {28th IEEE International Conference on Computer Design (ICCD’10)}, {IEEE}, 2010, pp. 480–85, doi:10.1109/iccd.2010.5647648.
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2010 | Misc | LibreCat-ID: 10670
Fröse, Viktor, et al. Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur. 2010.
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2010 | Conference Paper | LibreCat-ID: 12986
Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” {25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)}, {IEEE}, 2010, pp. 101–08, doi:10.1109/dft.2010.19.
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2010 | Misc | LibreCat-ID: 13073
Hellebrand, Sybille. Nano-Electronic Systems. 2010.
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2010 | Conference Paper | LibreCat-ID: 12987
Becker, Bernd, et al. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10), IEEE, 2010, doi:10.1109/dsnw.2010.5542612.
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2010 | Conference Paper | LibreCat-ID: 13050
Indlekofer, Thomas, et al. “Robuster Selbsttest Mit Extremer Kompaktierung.” {4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf”}, 2010, pp. 17–24.
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2009 | Conference Paper | LibreCat-ID: 12990
Hellebrand, Sybille, and Marc Hunger. “Are Robust Circuits Really Robust?” {24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk)}, {IEEE}, 2009, p. 77, doi:10.1109/dft.2009.28.
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2009 | Conference Paper | LibreCat-ID: 12991
Hunger, Marc, et al. “ATPG-Based Grading of Strong Fault-Secureness.” {15th IEEE International On-Line Testing Symposium (IOLTS’09)}, {IEEE}, 2009, doi:10.1109/iolts.2009.5196027.
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2009 | Conference Paper | LibreCat-ID: 13030
Hunger, Marc, et al. “Robustheitsanalyse Stark Fehlersicherer Schaltungen Mit SAT-Basierter Testmustererzeugung.” {3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf”}, 2009.
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2008 | Conference Paper | LibreCat-ID: 13032
Oehler, Philipp, et al. “Modularer Selbsttest Und Optimierte Reparaturanalyse.” {2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf”}, 2008.
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2008 | Misc | LibreCat-ID: 13033
Coym, Torsten, et al. Ein Verfeinertes Elektrisches Modell Für Teilchentreffer Und Dessen Auswirkung Auf Die Bewertung Der Schaltungsempfindlichkeit. 2008.
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2008 | Conference Paper | LibreCat-ID: 12992
Oehler, Philipp, et al. “A Modular Memory BIST for Optimized Memory Repair.” {14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)}, {IEEE}, 2008, doi:10.1109/iolts.2008.30.
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2008 | Conference Paper | LibreCat-ID: 12993
Hunger, Marc, and Sybille Hellebrand. “Verification and Analysis of Self-Checking Properties through ATPG.” {14th IEEE International On-Line Testing Symposium (IOLTS’08)}, {IEEE}, 2008, doi:10.1109/iolts.2008.32.
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2008 | Misc | LibreCat-ID: 13035
Amgalan, Uranmandakh, et al. Testen Mit Rücksetzpunkten - Ein Ansatz Zur Verbesserung Der Ausbeute Bei Robusten Schaltungen. 2008.
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2008 | Conference Paper | LibreCat-ID: 12994
Amgalan, Uranmandakh, et al. “Signature Rollback - A Technique for Testing Robust Circuits.” {26th IEEE VLSI Test Symposium (VTS’08)}, {IEEE}, 2008, pp. 125–30, doi:10.1109/vts.2008.34.
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2008 | Conference Paper | LibreCat-ID: 13031
Hunger, Marc, and Sybille Hellebrand. “Analyse Selbstprüfender Schaltungen – Nachweis von Fehlersicherheit Und Selbsttestbarkeit Mit ATPG.” {2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf”}, 2008.
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2007 | Conference Paper | LibreCat-ID: 12995
Hellebrand, Sybille, et al. “A Refined Electrical Model for Particle Strikes and Its Impact on SEU Prediction.” {22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)}, {IEEE}, 2007, pp. 50–58, doi:10.1109/dft.2007.43.
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