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40 Publications


2006 | Conference Paper | LibreCat-ID: 39842
Pannemann, C., T. Diekmann, Ulrich Hilleringmann, U. Schurmann, M. Scharnberg, V. Zaporojtchenko, R. Adelung, and F. Faupel. “Encapsulating the Active Layer of Organic Thin-Film Transistors.” In Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics. IEEE, 2006. https://doi.org/10.1109/polytr.2005.1596488.
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2005 | Journal Article | LibreCat-ID: 39846
Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “Degradation of Organic Field-Effect Transistors Made of Pentacene.” Journal of Materials Research 19, no. 7 (2005): 1999–2002. https://doi.org/10.1557/jmr.2004.0267.
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2005 | Conference Paper | LibreCat-ID: 39848
Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “On the Degradation of Organic Field-Effect Transistors.” In Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004. IEEE, 2005. https://doi.org/10.1109/icm.2004.1434210.
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2005 | Journal Article | LibreCat-ID: 39349
Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “Degradation of Organic Field-Effect Transistors Made of Pentacene.” Journal of Materials Research 19, no. 7 (2005): 1999–2002. https://doi.org/10.1557/jmr.2004.0267.
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2005 | Journal Article | LibreCat-ID: 39574
Scharnberg, M., J. Hu, J. Kanzow, K. Rätzke, R. Adelung, F. Faupel, C. Pannemann, Ulrich Hilleringmann, S. Meyer, and J. Pflaum. “Radiotracer Measurements as a Sensitive Tool for the Detection of Metal Penetration in Molecular-Based Organic Electronics.” Applied Physics Letters 86, no. 2 (2005). https://doi.org/10.1063/1.1849845.
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2005 | Conference Paper | LibreCat-ID: 39835
Scholz, R., A.-D. Müller, F. Müller, I. Thurzo, B. A. Paez, L. Mancera, D. R. T. Zahn, C. Pannemann, and Ulrich Hilleringmann. “Comparison between the Charge Carrier Mobilities in Pentacene OFET Structures as Obtained from Electrical Characterization and Potentiometry.” In SPIE Proceedings, edited by Zhenan Bao and David J. Gundlach. SPIE, 2005. https://doi.org/10.1117/12.617004.
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2005 | Conference Paper | LibreCat-ID: 39834
Scholz, R., A.-D. Müller, F. Müller, I. Thurzo, B. A. Paez, L. Mancera, D. R. T. Zahn, C. Pannemann, and Ulrich Hilleringmann. “Comparison between the Charge Carrier Mobilities in Pentacene OFET Structures as Obtained from Electrical Characterization and Potentiometry.” In SPIE Proceedings, edited by Zhenan Bao and David J. Gundlach. SPIE, 2005. https://doi.org/10.1117/12.617004.
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2004 | Book Chapter | LibreCat-ID: 39850
Hilleringmann, Ulrich. “Ätztechnik.” In Silizium-Halbleitertechnologie, 65–90. Wiesbaden: Vieweg+Teubner Verlag, 2004. https://doi.org/10.1007/978-3-322-94072-8_5.
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2004 | Conference Paper | LibreCat-ID: 39872
Hilleringmann, Ulrich, and C. Pannemann. “Imprint Structured Organic Thin Film Transistors as Driving Circuit in Single-Use Sensor Applications.” In Fifth International Symposium on Instrumentation and Control Technology, edited by Guangjun Zhang, Huijie Zhao, and Zhongyu Wang. SPIE, 2004. https://doi.org/10.1117/12.521463.
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2004 | Conference Paper | LibreCat-ID: 39873
Otterbach, Ralf, and Ulrich Hilleringmann. “Piezoresistive Pressure Sensors in CVD Diamond for High-Temperature Applications.” In Fifth International Symposium on Instrumentation and Control Technology, edited by Guangjun Zhang, Huijie Zhao, and Zhongyu Wang. SPIE, 2004. https://doi.org/10.1117/12.521928.
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2003 | Conference Paper | LibreCat-ID: 39887
Hilleringmann, Ulrich, T. Vieregge, and J.T. Horstmann. “Masking and Etching of Silicon and Related Materials for Geometries down to 25 Nm.” In IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029). IEEE, 2003. https://doi.org/10.1109/iecon.1999.822171.
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2003 | Conference Paper | LibreCat-ID: 39888
Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Matching Analysis of NMOS-Transistors with a Channel Length down to 30 Nm.” In IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029). IEEE, 2003. https://doi.org/10.1109/iecon.1999.822163.
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2003 | Conference Paper | LibreCat-ID: 39885
Wirth, G., Ulrich Hilleringmann, J.T. Horstmann, and K. Goser. “Negative Differential Resistance in Ultrashort Bulk MOSFETs.” In IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029). IEEE, 2003. https://doi.org/10.1109/iecon.1999.822164.
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2003 | Journal Article | LibreCat-ID: 39851
Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “Nanometer Scale Organic Thin Film Transistors with Pentacene.” Microelectronic Engineering 67–68 (2003): 845–52. https://doi.org/10.1016/s0167-9317(03)00146-1.
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2002 | Journal Article | LibreCat-ID: 39904
Hilleringmann, Ulrich, and K. Goser. “Optoelectronic System Integration on Silicon: Waveguides, Photodetectors, and VLSI CMOS Circuits on One Chip.” IEEE Transactions on Electron Devices 42, no. 5 (2002): 841–46. https://doi.org/10.1109/16.381978.
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2002 | Journal Article | LibreCat-ID: 39912
Schönstein, I., J. Müller, Ulrich Hilleringmann, and K. Goser. “Characterization of Submicron NMOS Devices Due to Visible Light Emission.” Microelectronic Engineering 21, no. 1–4 (2002): 363–66. https://doi.org/10.1016/0167-9317(93)90092-j.
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2002 | Journal Article | LibreCat-ID: 39914
Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.” Microelectronic Engineering 19, no. 1–4 (2002): 211–14. https://doi.org/10.1016/0167-9317(92)90425-q.
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2002 | Journal Article | LibreCat-ID: 39906
Brass, E., Ulrich Hilleringmann, and K. Schumacher. “System Integration of Optical Devices and Analog CMOS Amplifiers.” IEEE Journal of Solid-State Circuits 29, no. 8 (2002): 1006–10. https://doi.org/10.1109/4.297714.
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2002 | Journal Article | LibreCat-ID: 39907
Brass, E., Ulrich Hilleringmann, and K. Schumacher. “System Integration of Optical Devices and Analog CMOS Amplifiers.” IEEE Journal of Solid-State Circuits 29, no. 8 (2002): 1006–10. https://doi.org/10.1109/4.297714.
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2002 | Journal Article | LibreCat-ID: 39899
Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Characterisation of Sub-100 Nm-MOS-Transistors Processed by Optical Lithography and a Sidewall-Etchback Technique.” Microelectronic Engineering 30, no. 1–4 (2002): 431–34. https://doi.org/10.1016/0167-9317(95)00280-4.
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2002 | Journal Article | LibreCat-ID: 39925
Goser, K., Ulrich Hilleringmann, U. Rueckert, and K. Schumacher. “VLSI Technologies for Artificial Neural Networks.” IEEE Micro 9, no. 6 (2002): 28–44. https://doi.org/10.1109/40.42985.
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2002 | Journal Article | LibreCat-ID: 39882
Mankowski, V., Ulrich Hilleringmann, and K. Schumacher. “A Novel Insulation Technique for Smart Power Switching Devices and Very High Voltage ICs above 10 KV.” Microelectronic Engineering 53, no. 1–4 (2002): 525–28. https://doi.org/10.1016/s0167-9317(00)00370-1.
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2002 | Journal Article | LibreCat-ID: 39879
Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “1/f-Noise of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.” Microelectronic Engineering 53, no. 1–4 (2002): 213–16. https://doi.org/10.1016/s0167-9317(00)00299-9.
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2002 | Conference Paper | LibreCat-ID: 39880
Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Noise Analysis of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.” In 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.00CH37141). IEEE, 2002. https://doi.org/10.1109/iecon.2000.972560.
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2002 | Conference Paper | LibreCat-ID: 39881
Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Noise Analysis of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.” In 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.00CH37141). IEEE, 2002. https://doi.org/10.1109/iecon.2000.972560.
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2002 | Journal Article | LibreCat-ID: 39919
Hilleringmann, Ulrich, K. Knospe, C. Heite, K. Schumacher, and K. Goser. “A Silicon Based Technology for Monolithic Integration of Waveguides and VLSI CMOS Circuits.” Microelectronic Engineering 15, no. 1–4 (2002): 289–92. https://doi.org/10.1016/0167-9317(91)90231-2.
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2002 | Journal Article | LibreCat-ID: 39926
Goser, K., Ulrich Hilleringmann, U. Rueckert, and K. Schumacher. “VLSI Technologies for Artificial Neural Networks.” IEEE Micro 9, no. 6 (2002): 28–44. https://doi.org/10.1109/40.42985.
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2002 | Conference Paper | LibreCat-ID: 39892
Blum, F., A. Denisenko, R. Job, D. Borchert, W. Weber, J.V. Borany, Ulrich Hilleringmann, and W.R. Fahrner. “Nuclear Radiation Detectors on Various Type Diamonds.” In IECON ’98. Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.98CH36200). IEEE, 2002. https://doi.org/10.1109/iecon.1998.724097.
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2002 | Journal Article | LibreCat-ID: 39920
Soennecken, A., Ulrich Hilleringmann, and K. Goser. “Floating Gate Structures as Nonvolatile Analog Memory Cells in 1.0μm-LOCOS-CMOS Technology with PZT Dielectrica.” Microelectronic Engineering 15, no. 1–4 (2002): 633–36. https://doi.org/10.1016/0167-9317(91)90299-s.
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2002 | Journal Article | LibreCat-ID: 39915
Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.” Microelectronic Engineering 19, no. 1–4 (2002): 211–14. https://doi.org/10.1016/0167-9317(92)90425-q.
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2002 | Journal Article | LibreCat-ID: 39916
Adams, S., Ulrich Hilleringmann, and K. Goser. “CMOS Compatible Micromachining by Dry Silicon-Etching Techniques.” Microelectronic Engineering 19, no. 1–4 (2002): 191–94. https://doi.org/10.1016/0167-9317(92)90420-v.
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2002 | Journal Article | LibreCat-ID: 39348
Horstmann, J.T., Ulrich Hilleringmann, and K.F. Goser. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.” IEEE Transactions on Electron Devices 45, no. 1 (2002): 299–306. https://doi.org/10.1109/16.658845.
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2002 | Conference Paper | LibreCat-ID: 39923
Goser, K., Ulrich Hilleringmann, and U. Rueckert. “Applications and Implementations of Neural Networks in Microelectronics-Overview and Status.” In [1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications. IEEE Comput. Soc. Press, 2002. https://doi.org/10.1109/cmpeur.1991.257442.
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2002 | Journal Article | LibreCat-ID: 39889
Mankowski, V., Ulrich Hilleringmann, and K. Schumacher. “12 KV Low Current Cascaded Light Triggered Switch on One Silicon Chip.” Microelectronic Engineering 46, no. 1–4 (2002): 413–17. https://doi.org/10.1016/s0167-9317(99)00122-7.
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2002 | Journal Article | LibreCat-ID: 39891
Horstmann, J.T., Ulrich Hilleringmann, and K.F. Goser. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.” IEEE Transactions on Electron Devices 45, no. 1 (2002): 299–306. https://doi.org/10.1109/16.658845.
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2002 | Journal Article | LibreCat-ID: 39886
Wirth, G, Ulrich Hilleringmann, J.T Horstmann, and K Goser. “Mesoscopic Transport Phenomena in Ultrashort Channel MOSFETs.” Solid-State Electronics 43, no. 7 (2002): 1245–50. https://doi.org/10.1016/s0038-1101(99)00060-x.
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2002 | Journal Article | LibreCat-ID: 39876
Otterbach, R., Ulrich Hilleringmann, T.J. Horstmann, and K. Goser. “Structures with a Minimum Feature Size of Less than 100 Nm in CVD-Diamond for Sensor Applications.” Diamond and Related Materials 10, no. 3–7 (2002): 511–14. https://doi.org/10.1016/s0925-9635(01)00373-9.
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2002 | Journal Article | LibreCat-ID: 39877
Hilleringmann, Ulrich, T. Vieregge, and J.T. Horstmann. “A Structure Definition Technique for 25 Nm Lines of Silicon and Related Materials.” Microelectronic Engineering 53, no. 1–4 (2002): 569–72. https://doi.org/10.1016/s0167-9317(00)00380-4.
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2002 | Journal Article | LibreCat-ID: 39874
Otterbach, R., and Ulrich Hilleringmann. “Reactive Ion Etching of CVD-Diamond for Piezoresistive Pressure Sensors.” Diamond and Related Materials 11, no. 3–6 (2002): 841–44. https://doi.org/10.1016/s0925-9635(01)00703-8.
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2002 | Book Chapter | LibreCat-ID: 39875
Hilleringmann, Ulrich. “Metallisierung Und Kontakte.” In Silizium-Halbleitertechnologie, 131–151. Wiesbaden: Vieweg+Teubner Verlag, 2002. https://doi.org/10.1007/978-3-322-94119-0_8.
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