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40 Publications
2006 | Conference Paper | LibreCat-ID: 39842
Pannemann, C., et al. “Encapsulating the Active Layer of Organic Thin-Film Transistors.” Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics, IEEE, 2006, doi:10.1109/polytr.2005.1596488.
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| DOI
2005 | Journal Article | LibreCat-ID: 39846
Pannemann, Ch., et al. “Degradation of Organic Field-Effect Transistors Made of Pentacene.” Journal of Materials Research, vol. 19, no. 7, Springer Science and Business Media LLC, 2005, pp. 1999–2002, doi:10.1557/jmr.2004.0267.
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| DOI
2005 | Conference Paper | LibreCat-ID: 39848
Pannemann, Ch., et al. “On the Degradation of Organic Field-Effect Transistors.” Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004., IEEE, 2005, doi:10.1109/icm.2004.1434210.
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| DOI
2005 | Journal Article | LibreCat-ID: 39349
Pannemann, Ch., et al. “Degradation of Organic Field-Effect Transistors Made of Pentacene.” Journal of Materials Research, vol. 19, no. 7, Springer Science and Business Media LLC, 2005, pp. 1999–2002, doi:10.1557/jmr.2004.0267.
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2005 | Journal Article | LibreCat-ID: 39574
Scharnberg, M., et al. “Radiotracer Measurements as a Sensitive Tool for the Detection of Metal Penetration in Molecular-Based Organic Electronics.” Applied Physics Letters, vol. 86, no. 2, 024104, AIP Publishing, 2005, doi:10.1063/1.1849845.
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2005 | Conference Paper | LibreCat-ID: 39835
Scholz, R., et al. “Comparison between the Charge Carrier Mobilities in Pentacene OFET Structures as Obtained from Electrical Characterization and Potentiometry.” SPIE Proceedings, edited by Zhenan Bao and David J. Gundlach, SPIE, 2005, doi:10.1117/12.617004.
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| DOI
2005 | Conference Paper | LibreCat-ID: 39834
Scholz, R., et al. “Comparison between the Charge Carrier Mobilities in Pentacene OFET Structures as Obtained from Electrical Characterization and Potentiometry.” SPIE Proceedings, edited by Zhenan Bao and David J. Gundlach, SPIE, 2005, doi:10.1117/12.617004.
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2004 | Book Chapter | LibreCat-ID: 39850
Hilleringmann, Ulrich. “Ätztechnik.” Silizium-Halbleitertechnologie, Vieweg+Teubner Verlag, 2004, pp. 65–90, doi:10.1007/978-3-322-94072-8_5.
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2004 | Conference Paper | LibreCat-ID: 39872
Hilleringmann, Ulrich, and C. Pannemann. “Imprint Structured Organic Thin Film Transistors as Driving Circuit in Single-Use Sensor Applications.” Fifth International Symposium on Instrumentation and Control Technology, edited by Guangjun Zhang et al., SPIE, 2004, doi:10.1117/12.521463.
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2004 | Conference Paper | LibreCat-ID: 39873
Otterbach, Ralf, and Ulrich Hilleringmann. “Piezoresistive Pressure Sensors in CVD Diamond for High-Temperature Applications.” Fifth International Symposium on Instrumentation and Control Technology, edited by Guangjun Zhang et al., SPIE, 2004, doi:10.1117/12.521928.
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2003 | Conference Paper | LibreCat-ID: 39887
Hilleringmann, Ulrich, et al. “Masking and Etching of Silicon and Related Materials for Geometries down to 25 Nm.” IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029), IEEE, 2003, doi:10.1109/iecon.1999.822171.
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2003 | Conference Paper | LibreCat-ID: 39888
Horstmann, J. T., et al. “Matching Analysis of NMOS-Transistors with a Channel Length down to 30 Nm.” IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029), IEEE, 2003, doi:10.1109/iecon.1999.822163.
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2003 | Conference Paper | LibreCat-ID: 39885
Wirth, G., et al. “Negative Differential Resistance in Ultrashort Bulk MOSFETs.” IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029), IEEE, 2003, doi:10.1109/iecon.1999.822164.
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2003 | Journal Article | LibreCat-ID: 39851
Pannemann, Ch., et al. “Nanometer Scale Organic Thin Film Transistors with Pentacene.” Microelectronic Engineering, vol. 67–68, Elsevier BV, 2003, pp. 845–52, doi:10.1016/s0167-9317(03)00146-1.
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2002 | Journal Article | LibreCat-ID: 39904
Hilleringmann, Ulrich, and K. Goser. “Optoelectronic System Integration on Silicon: Waveguides, Photodetectors, and VLSI CMOS Circuits on One Chip.” IEEE Transactions on Electron Devices, vol. 42, no. 5, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 841–46, doi:10.1109/16.381978.
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2002 | Journal Article | LibreCat-ID: 39912
Schönstein, I., et al. “Characterization of Submicron NMOS Devices Due to Visible Light Emission.” Microelectronic Engineering, vol. 21, no. 1–4, Elsevier BV, 2002, pp. 363–66, doi:10.1016/0167-9317(93)90092-j.
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2002 | Journal Article | LibreCat-ID: 39914
Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.” Microelectronic Engineering, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 211–14, doi:10.1016/0167-9317(92)90425-q.
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2002 | Journal Article | LibreCat-ID: 39906
Brass, E., et al. “System Integration of Optical Devices and Analog CMOS Amplifiers.” IEEE Journal of Solid-State Circuits, vol. 29, no. 8, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 1006–10, doi:10.1109/4.297714.
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| DOI
2002 | Journal Article | LibreCat-ID: 39907
Brass, E., et al. “System Integration of Optical Devices and Analog CMOS Amplifiers.” IEEE Journal of Solid-State Circuits, vol. 29, no. 8, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 1006–10, doi:10.1109/4.297714.
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| DOI
2002 | Journal Article | LibreCat-ID: 39899
Horstmann, J. T., et al. “Characterisation of Sub-100 Nm-MOS-Transistors Processed by Optical Lithography and a Sidewall-Etchback Technique.” Microelectronic Engineering, vol. 30, no. 1–4, Elsevier BV, 2002, pp. 431–34, doi:10.1016/0167-9317(95)00280-4.
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| DOI
2002 | Journal Article | LibreCat-ID: 39925
Goser, K., et al. “VLSI Technologies for Artificial Neural Networks.” IEEE Micro, vol. 9, no. 6, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 28–44, doi:10.1109/40.42985.
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2002 | Journal Article | LibreCat-ID: 39882
Mankowski, V., et al. “A Novel Insulation Technique for Smart Power Switching Devices and Very High Voltage ICs above 10 KV.” Microelectronic Engineering, vol. 53, no. 1–4, Elsevier BV, 2002, pp. 525–28, doi:10.1016/s0167-9317(00)00370-1.
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2002 | Journal Article | LibreCat-ID: 39879
Horstmann, J. T., et al. “1/f-Noise of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.” Microelectronic Engineering, vol. 53, no. 1–4, Elsevier BV, 2002, pp. 213–16, doi:10.1016/s0167-9317(00)00299-9.
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2002 | Conference Paper | LibreCat-ID: 39880
Horstmann, J. T., et al. “Noise Analysis of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.” 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.00CH37141), IEEE, 2002, doi:10.1109/iecon.2000.972560.
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2002 | Conference Paper | LibreCat-ID: 39881
Horstmann, J. T., et al. “Noise Analysis of Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.” 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.00CH37141), IEEE, 2002, doi:10.1109/iecon.2000.972560.
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| DOI
2002 | Journal Article | LibreCat-ID: 39919
Hilleringmann, Ulrich, et al. “A Silicon Based Technology for Monolithic Integration of Waveguides and VLSI CMOS Circuits.” Microelectronic Engineering, vol. 15, no. 1–4, Elsevier BV, 2002, pp. 289–92, doi:10.1016/0167-9317(91)90231-2.
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2002 | Journal Article | LibreCat-ID: 39926
Goser, K., et al. “VLSI Technologies for Artificial Neural Networks.” IEEE Micro, vol. 9, no. 6, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 28–44, doi:10.1109/40.42985.
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2002 | Conference Paper | LibreCat-ID: 39892
Blum, F., et al. “Nuclear Radiation Detectors on Various Type Diamonds.” IECON ’98. Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.98CH36200), IEEE, 2002, doi:10.1109/iecon.1998.724097.
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| DOI
2002 | Journal Article | LibreCat-ID: 39920
Soennecken, A., et al. “Floating Gate Structures as Nonvolatile Analog Memory Cells in 1.0μm-LOCOS-CMOS Technology with PZT Dielectrica.” Microelectronic Engineering, vol. 15, no. 1–4, Elsevier BV, 2002, pp. 633–36, doi:10.1016/0167-9317(91)90299-s.
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2002 | Journal Article | LibreCat-ID: 39915
Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.” Microelectronic Engineering, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 211–14, doi:10.1016/0167-9317(92)90425-q.
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2002 | Journal Article | LibreCat-ID: 39916
Adams, S., et al. “CMOS Compatible Micromachining by Dry Silicon-Etching Techniques.” Microelectronic Engineering, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 191–94, doi:10.1016/0167-9317(92)90420-v.
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2002 | Journal Article | LibreCat-ID: 39348
Horstmann, J. T., et al. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.” IEEE Transactions on Electron Devices, vol. 45, no. 1, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 299–306, doi:10.1109/16.658845.
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2002 | Conference Paper | LibreCat-ID: 39923
Goser, K., et al. “Applications and Implementations of Neural Networks in Microelectronics-Overview and Status.” [1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications, IEEE Comput. Soc. Press, 2002, doi:10.1109/cmpeur.1991.257442.
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2002 | Journal Article | LibreCat-ID: 39889
Mankowski, V., et al. “12 KV Low Current Cascaded Light Triggered Switch on One Silicon Chip.” Microelectronic Engineering, vol. 46, no. 1–4, Elsevier BV, 2002, pp. 413–17, doi:10.1016/s0167-9317(99)00122-7.
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2002 | Journal Article | LibreCat-ID: 39891
Horstmann, J. T., et al. “Matching Analysis of Deposition Defined 50-Nm MOSFET’s.” IEEE Transactions on Electron Devices, vol. 45, no. 1, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 299–306, doi:10.1109/16.658845.
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2002 | Journal Article | LibreCat-ID: 39886
Wirth, G., et al. “Mesoscopic Transport Phenomena in Ultrashort Channel MOSFETs.” Solid-State Electronics, vol. 43, no. 7, Elsevier BV, 2002, pp. 1245–50, doi:10.1016/s0038-1101(99)00060-x.
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2002 | Journal Article | LibreCat-ID: 39876
Otterbach, R., et al. “Structures with a Minimum Feature Size of Less than 100 Nm in CVD-Diamond for Sensor Applications.” Diamond and Related Materials, vol. 10, no. 3–7, Elsevier BV, 2002, pp. 511–14, doi:10.1016/s0925-9635(01)00373-9.
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2002 | Journal Article | LibreCat-ID: 39877
Hilleringmann, Ulrich, et al. “A Structure Definition Technique for 25 Nm Lines of Silicon and Related Materials.” Microelectronic Engineering, vol. 53, no. 1–4, Elsevier BV, 2002, pp. 569–72, doi:10.1016/s0167-9317(00)00380-4.
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2002 | Journal Article | LibreCat-ID: 39874
Otterbach, R., and Ulrich Hilleringmann. “Reactive Ion Etching of CVD-Diamond for Piezoresistive Pressure Sensors.” Diamond and Related Materials, vol. 11, no. 3–6, Elsevier BV, 2002, pp. 841–44, doi:10.1016/s0925-9635(01)00703-8.
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2002 | Book Chapter | LibreCat-ID: 39875
Hilleringmann, Ulrich. “Metallisierung Und Kontakte.” Silizium-Halbleitertechnologie, Vieweg+Teubner Verlag, 2002, pp. 131–151, doi:10.1007/978-3-322-94119-0_8.
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