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165 Publications
2023 | Conference Paper | LibreCat-ID: 45830
@inproceedings{Jafarzadeh_Klemme_Reimer_Najafi Haghi_ Amrouch_Hellebrand_ Wunderlich_2023, place={Anaheim, CA, USA}, title={Robust Pattern Generation for Small Delay Faults under Process Variations}, booktitle={IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and Najafi Haghi, Zahra Paria and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023} }
LibreCat
2022 | Journal Article | LibreCat-ID: 29351
@article{Sadeghi-Kohan_Hellebrand_Wunderlich_2022, title={Stress-Aware Periodic Test of Interconnects}, DOI={10.1007/s10836-021-05979-5}, journal={Journal of Electronic Testing}, publisher={Springer Science and Business Media LLC}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2022} }
LibreCat
| DOI
2022 | Misc | LibreCat-ID: 29890
@book{Sadeghi-Kohan_Hellebrand_Wunderlich_2022, place={Online}, title={EM-Aware Interconnect BIST}, publisher={European Workshop on Silicon Lifecycle Management, March 18, 2022}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2022} }
LibreCat
2020 | Conference Paper | LibreCat-ID: 19422
@inproceedings{Sprenger_Sadeghi-Kohan_Reimer_Hellebrand_2020, place={Virtual Conference - Originally Frascati (Rome), Italy}, title={Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study}, booktitle={IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020}, author={Sprenger, Alexander and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2020} }
LibreCat
2020 | Misc | LibreCat-ID: 15419
@book{Sadeghi-Kohan_Hellebrand_2020, place={Ludwigsburg}, title={Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects}, publisher={32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2020} }
LibreCat
2020 | Conference Paper | LibreCat-ID: 29200
@inproceedings{Sadeghi-Kohan_Hellebrand_2020, place={Virtual Conference - Originally San Diego, CA, USA}, title={Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects}, DOI={10.1109/vts48691.2020.9107591}, booktitle={38th IEEE VLSI Test Symposium (VTS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2020} }
LibreCat
| DOI
2020 | Conference Paper | LibreCat-ID: 19421
@inproceedings{Holst_Kampmann_Sprenger_Reimer_Hellebrand_Wunderlich_Weng_2020, place={Virtual Conference - Originally Washington, DC, USA}, title={Logic Fault Diagnosis of Hidden Delay Defects}, booktitle={IEEE International Test Conference (ITC’20), November 2020}, author={Holst, Stefan and Kampmann, Matthias and Sprenger, Alexander and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Weng, Xiaoqing}, year={2020} }
LibreCat
2019 | Misc | LibreCat-ID: 8112
@book{Maaz_Sprenger_Hellebrand_2019, place={Prien am Chiemsee}, title={A Hybrid Space Compactor for Varying X-Rates}, publisher={31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19)}, author={Maaz, Mohammad Urf and Sprenger, Alexander and Hellebrand, Sybille}, year={2019} }
LibreCat
2019 | Journal Article | LibreCat-ID: 8667
@article{Sprenger_Hellebrand_2019, title={Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test}, volume={28}, DOI={10.1142/s0218126619400012}, number={1}, journal={Journal of Circuits, Systems and Computers}, publisher={World Scientific Publishing Company}, author={Sprenger, Alexander and Hellebrand, Sybille}, year={2019}, pages={1–23} }
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| DOI
2019 | Journal Article | LibreCat-ID: 13048
@article{Kampmann_A. Kochte_Liu_Schneider_Hellebrand_Wunderlich_2019, title={Built-in Test for Hidden Delay Faults}, volume={38}, number={10}, journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)}, publisher={IEEE}, author={Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Schneider, Eric and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2019}, pages={1956–1968} }
LibreCat
2019 | Conference Paper | LibreCat-ID: 12918
@inproceedings{Maaz_Sprenger_Hellebrand_2019, place={Washington, DC, USA}, title={A Hybrid Space Compactor for Adaptive X-Handling}, booktitle={50th IEEE International Test Conference (ITC)}, publisher={IEEE}, author={Maaz, Mohammad Urf and Sprenger, Alexander and Hellebrand, Sybille}, year={2019}, pages={1–8} }
LibreCat
2018 | Misc | LibreCat-ID: 4576
@book{Sprenger_Hellebrand_2018, place={Freiburg, Germany}, title={Stochastische Kompaktierung für den Hochgeschwindigkeitstest}, publisher={30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18)}, author={Sprenger, Alexander and Hellebrand, Sybille}, year={2018} }
LibreCat
2018 | Journal Article | LibreCat-ID: 12974
@article{Hellebrand_Henkel_Raghunathan_Wunderlich_2018, title={Guest Editors’ Introduction - Special Issue on Approximate Computing}, volume={10}, DOI={10.1109/les.2018.2789942}, number={1}, journal={IEEE Embedded Systems Letters}, publisher={IEEE}, author={Hellebrand, Sybille and Henkel, Joerg and Raghunathan, Anand and Wunderlich, Hans-Joachim}, year={2018}, pages={1–1} }
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| DOI
2018 | Journal Article | LibreCat-ID: 13057
@article{Kampmann_Hellebrand_2018, title={Design For Small Delay Test - A Simulation Study}, volume={80}, journal={Microelectronics Reliability}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2018}, pages={124–133} }
LibreCat
2018 | Misc | LibreCat-ID: 13072
@book{Kampmann_Hellebrand_2018, place={19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China}, title={Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2018} }
LibreCat
2018 | Conference Paper | LibreCat-ID: 29460
@inproceedings{Rezaeizadeh Rookerd_Sadeghi-Kohan_Navabi_2018, title={Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture}, DOI={10.1145/3194554.3194599}, booktitle={Proceedings of the 2018 on Great Lakes Symposium on VLSI}, publisher={ACM}, author={Rezaeizadeh Rookerd, Ramin and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin}, year={2018} }
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| DOI
2018 | Conference Paper | LibreCat-ID: 4575
@inproceedings{Sprenger_Hellebrand_2018, place={Budapest, Hungary}, title={Tuning Stochastic Space Compaction to Faster-than-at-Speed Test}, DOI={10.1109/ddecs.2018.00020}, booktitle={2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)}, publisher={IEEE}, author={Sprenger, Alexander and Hellebrand, Sybille}, year={2018} }
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| DOI
2018 | Conference Paper | LibreCat-ID: 10575
@inproceedings{Liu_Schneider_Kampmann_Hellebrand_Wunderlich_2018, title={Extending Aging Monitors for Early Life and Wear-Out Failure Prevention}, DOI={10.1109/ats.2018.00028}, booktitle={27th IEEE Asian Test Symposium (ATS’18)}, author={Liu, Chang and Schneider, Eric and Kampmann, Matthias and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2018} }
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2018 | Conference Paper | LibreCat-ID: 29459
@inproceedings{Sadeghi-Kohan_Vafaei_Navabi_2018, title={Near-Optimal Node Selection Procedure for Aging Monitor Placement}, DOI={10.1109/iolts.2018.8474120}, booktitle={2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Vafaei, Arash and Navabi, Zainalabedin}, year={2018} }
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| DOI
2017 | Conference Paper | LibreCat-ID: 12973
@inproceedings{Deshmukh_Kunz_Wunderlich_Hellebrand_2017, place={Caesars Palace, Las Vegas, Nevada, USA}, title={Special Session on Early Life Failures}, DOI={10.1109/vts.2017.7928933}, booktitle={35th IEEE VLSI Test Symposium (VTS’17)}, publisher={IEEE}, author={Deshmukh, Jyotirmoy and Kunz, Wolfgang and Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={2017} }
LibreCat
| DOI
2017 | Misc | LibreCat-ID: 13078
@book{Kampmann_Hellebrand_2017, place={29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany}, title={X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2017} }
LibreCat
2017 | Conference Paper | LibreCat-ID: 10576
@inproceedings{Kampmann_Hellebrand_2017, title={Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test}, DOI={10.1109/ddecs.2017.7934564}, booktitle={20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17)}, publisher={IEEE}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2017} }
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2017 | Journal Article | LibreCat-ID: 29462
@article{Sadeghi-Kohan_Kamal_Navabi_2017, title={Self-Adjusting Monitor for Measuring Aging Rate and Advancement}, volume={8}, DOI={10.1109/tetc.2017.2771441}, number={3}, journal={IEEE Transactions on Emerging Topics in Computing}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Sadeghi-Kohan, Somayeh and Kamal, Mehdi and Navabi, Zainalabedin}, year={2017}, pages={627–641} }
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| DOI
2017 | Conference Paper | LibreCat-ID: 29463
@inproceedings{Jenihhin_Kamkin_Navabi_Sadeghi-Kohan_2017, title={Universal mitigation of NBTI-induced aging by design randomization}, DOI={10.1109/ewdts.2016.7807635}, booktitle={2016 IEEE East-West Design & Test Symposium (EWDTS)}, publisher={IEEE}, author={Jenihhin, Maksim and Kamkin, Alexander and Navabi, Zainalabedin and Sadeghi-Kohan, Somayeh}, year={2017} }
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2016 | Conference Paper | LibreCat-ID: 12975
@inproceedings{Kampmann_Hellebrand_2016, place={Hiroshima, Japan}, title={X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test}, DOI={10.1109/ats.2016.20}, booktitle={25th IEEE Asian Test Symposium (ATS’16)}, publisher={IEEE}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2016}, pages={1–6} }
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| DOI
2015 | Conference Paper | LibreCat-ID: 12976
@inproceedings{Kampmann_A. Kochte_Schneider_Indlekofer_Hellebrand_Wunderlich_2015, place={Mumbai, India}, title={Optimized Selection of Frequencies for Faster-Than-at-Speed Test}, DOI={10.1109/ats.2015.26}, booktitle={24th IEEE Asian Test Symposium (ATS’15)}, publisher={IEEE}, author={Kampmann, Matthias and A. Kochte, Michael and Schneider, Eric and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2015}, pages={109–114} }
LibreCat
| DOI
2015 | Journal Article | LibreCat-ID: 13056
@article{Huang_Liang_Hellebrand_2015, title={A High Performance SEU Tolerant Latch}, volume={31}, number={4}, journal={Journal of Electronic Testing - Theory and Applications (JETTA)}, publisher={Springer}, author={Huang, Zhengfeng and Liang, Huaguo and Hellebrand, Sybille}, year={2015}, pages={349–359} }
LibreCat
2015 | Misc | LibreCat-ID: 13077
@book{Hellebrand_Indlekofer_Kampmann_Kochte_Liu_Wunderlich_2015, place={27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany}, title={Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler}, author={Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim}, year={2015} }
LibreCat
2015 | Conference Paper | LibreCat-ID: 29465
@inproceedings{Sadeghi-Kohan_Kamran_Forooghifar_Navabi_2015, title={Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation}, DOI={10.1109/dtis.2015.7127373}, booktitle={2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Kamran, Arezoo and Forooghifar, Farnaz and Navabi, Zainalabedin}, year={2015} }
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| DOI
2015 | Conference Paper | LibreCat-ID: 29466
@inproceedings{Sadeghi-Kohan_Kamal_McNeil_Prinetto_Navabi_2015, title={Online self adjusting progressive age monitoring of timing variations}, DOI={10.1109/dtis.2015.7127368}, booktitle={2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Kamal, Mehdi and McNeil, John and Prinetto, Paolo and Navabi, Zain}, year={2015} }
LibreCat
| DOI
2014 | Conference Paper | LibreCat-ID: 12977
@inproceedings{Hellebrand_Indlekofer_Kampmann_A. Kochte_Liu_Wunderlich_2014, place={Seattle, Washington, USA}, title={FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects}, DOI={10.1109/test.2014.7035360}, booktitle={IEEE International Test Conference (ITC’14)}, publisher={IEEE}, author={Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim}, year={2014} }
LibreCat
| DOI
2014 | Journal Article | LibreCat-ID: 13054
@article{Hellebrand_Wunderlich_2014, title={SAT-Based ATPG beyond Stuck-at Fault Testing}, volume={56}, number={4}, journal={DeGruyter Journal on Information Technology (it)}, publisher={DeGruyter}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2014}, pages={165–172} }
LibreCat
2014 | Journal Article | LibreCat-ID: 13055
@article{Rodriguez Gomez_Cook_Indlekofer_Hellebrand_Wunderlich_2014, title={Adaptive Bayesian Diagnosis of Intermittent Faults}, volume={30}, number={5}, journal={Journal of Electronic Testing - Theory and Applications (JETTA)}, publisher={Springer}, author={Rodriguez Gomez, Laura and Cook, Alejandro and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2014}, pages={527–540} }
LibreCat
2014 | Journal Article | LibreCat-ID: 46266
@article{Alizadeh_Behnam_Sadeghi-Kohan_2014, title={A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs}, DOI={10.1109/tc.2014.2329687}, journal={IEEE Transactions on Computers}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Alizadeh, Bijan and Behnam, Payman and Sadeghi-Kohan, Somayeh}, year={2014}, pages={1–1} }
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| DOI
2014 | Conference Paper | LibreCat-ID: 46268
@inproceedings{Mohammadi_Sadeghi-Kohan_Masoumi_Navabi_2014, title={An off-line MDSI interconnect BIST incorporated in BS 1149.1}, DOI={10.1109/ets.2014.6847847}, booktitle={2014 19th IEEE European Test Symposium (ETS)}, publisher={IEEE}, author={Mohammadi, Marzieh and Sadeghi-Kohan, Somayeh and Masoumi, Nasser and Navabi, Zainalabedin}, year={2014} }
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| DOI
2014 | Conference Paper | LibreCat-ID: 46267
@inproceedings{Sadeghi-Kohan_Behnam_Alizadeh_Fujita_Navabi_2014, title={Improving polynomial datapath debugging with HEDs}, DOI={10.1109/ets.2014.6847797}, booktitle={2014 19th IEEE European Test Symposium (ETS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Behnam, Payman and Alizadeh, Bijan and Fujita, Masahiro and Navabi, Zainalabedin}, year={2014} }
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| DOI
2013 | Conference Paper | LibreCat-ID: 12979
@inproceedings{Hellebrand_2013, place={Cordoba, Argentina}, title={Analyzing and Quantifying Fault Tolerance Properties}, DOI={10.1109/latw.2013.6562662}, booktitle={14th IEEE Latin American Test Workshop - (LATW’13)}, publisher={IEEE}, author={Hellebrand, Sybille}, year={2013} }
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| DOI
2013 | Misc | LibreCat-ID: 13075
@book{Cook_Rodriguez Gomez_Hellebrand_Indlekofer_Wunderlich_2013, place={14th Latin American Test Workshop, Cordoba, Argentina}, title={Adaptive Test and Diagnosis of Intermittent Faults}, author={Cook, Alejandro and Rodriguez Gomez, Laura and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2013} }
LibreCat
2013 | Conference Paper | LibreCat-ID: 46271
@inproceedings{Sadeghi-Kohan_Namaki-Shoushtari_Javaheri_Navabi_2013, title={BS 1149.1 extensions for an online interconnect fault detection and recovery}, DOI={10.1109/test.2012.6401583}, booktitle={2012 IEEE International Test Conference}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Namaki-Shoushtari, Majid and Javaheri, Fatemeh and Navabi, Zainalabedin}, year={2013} }
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| DOI
2013 | Conference Paper | LibreCat-ID: 46270
@inproceedings{Sadeghi-Kohan_Keshavarz_Zokaee_Farahmandi_Navabi_2013, title={A new structure for interconnect offline testing}, DOI={10.1109/ewdts.2013.6673207}, booktitle={East-West Design & Test Symposium (EWDTS 2013)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Keshavarz, Shahrzad and Zokaee, Farzaneh and Farahmandi, Farimah and Navabi, Zainalabedin}, year={2013} }
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| DOI
2012 | Conference Paper | LibreCat-ID: 12980
@inproceedings{Cook_Hellebrand_E. Imhof_Mumtaz_Wunderlich_2012, place={Quito, Ecuador}, title={Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test}, DOI={10.1109/latw.2012.6261229}, booktitle={13th IEEE Latin American Test Workshop (LATW’12)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and E. Imhof, Michael and Mumtaz, Abdullah and Wunderlich, Hans-Joachim}, year={2012}, pages={1–4} }
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2012 | Conference Paper | LibreCat-ID: 12981
@inproceedings{Cook_Hellebrand_Wunderlich_2012, place={Annecy, France}, title={Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test}, DOI={10.1109/ets.2012.6233025}, booktitle={17th IEEE European Test Symposium (ETS’12)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2012}, pages={1–6} }
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2012 | Misc | LibreCat-ID: 13074
@book{Cook_Hellebrand_Wunderlich_2012, place={24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany}, title={Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern}, author={Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2012} }
LibreCat
2011 | Conference Paper | LibreCat-ID: 12982
@inproceedings{Cook_Hellebrand_Indlekofer_Wunderlich_2011, place={New Delhi, India}, title={Diagnostic Test of Robust Circuits}, DOI={10.1109/ats.2011.55}, booktitle={20th IEEE Asian Test Symposium (ATS’11)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2011}, pages={285–290} }
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2011 | Conference Paper | LibreCat-ID: 12984
@inproceedings{Polian_Becker_Hellebrand_Wunderlich_Maxwell_2011, place={Trondheim, Norway}, title={Towards Variation-Aware Test Methods}, DOI={10.1109/ets.2011.51}, booktitle={16th IEEE European Test Symposium Trondheim (ETS’11)}, publisher={IEEE}, author={Polian, Ilia and Becker, Bernd and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Maxwell, Peter}, year={2011} }
LibreCat
| DOI
2011 | Conference Paper | LibreCat-ID: 13053
@inproceedings{Cook_Hellebrand_Indlekofer_Wunderlich_2011, place={Hamburg, Germany}, title={Robuster Selbsttest mit Diagnose}, booktitle={5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf”}, author={Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2011}, pages={48–53} }
LibreCat
2011 | Journal Article | LibreCat-ID: 13052
@article{Hopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2011, title={Variation-Aware Fault Modeling}, volume={54}, number={4}, journal={SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer}, author={Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2011}, pages={1813–1826} }
LibreCat
2011 | Conference Paper | LibreCat-ID: 46272
@inproceedings{Kamran_Nemati_Sadeghi-Kohan_Navabi_2011, title={Virtual tester development using HDL/PLI}, DOI={10.1109/ewdts.2010.5742156}, booktitle={2010 East-West Design & Test Symposium (EWDTS)}, publisher={IEEE}, author={Kamran, Arezoo and Nemati, Nastaran and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin}, year={2011} }
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2010 | Misc | LibreCat-ID: 10670
@book{Fröse_Ibers_Hellebrand_2010, place={22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany}, title={Testdatenkompression mit Hilfe der Netzwerkinfrastruktur}, author={Fröse, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}, year={2010} }
LibreCat
2010 | Conference Paper | LibreCat-ID: 12987
@inproceedings{Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Chicago, IL, USA}, title={Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}, DOI={10.1109/dsnw.2010.5542612}, booktitle={40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)}, publisher={IEEE}, author={Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010} }
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| DOI