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165 Publications
2017 | Misc | LibreCat-ID: 13078
M. Kampmann and S. Hellebrand, X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz. 29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.
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2017 | Conference Paper | LibreCat-ID: 10576
M. Kampmann and S. Hellebrand, “Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test,” 2017, doi: 10.1109/ddecs.2017.7934564.
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2017 | Journal Article | LibreCat-ID: 29462
S. Sadeghi-Kohan, M. Kamal, and Z. Navabi, “Self-Adjusting Monitor for Measuring Aging Rate and Advancement,” IEEE Transactions on Emerging Topics in Computing, vol. 8, no. 3, pp. 627–641, 2017, doi: 10.1109/tetc.2017.2771441.
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2017 | Conference Paper | LibreCat-ID: 29463
M. Jenihhin, A. Kamkin, Z. Navabi, and S. Sadeghi-Kohan, “Universal mitigation of NBTI-induced aging by design randomization,” 2017, doi: 10.1109/ewdts.2016.7807635.
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2015 | Journal Article | LibreCat-ID: 13056
Z. Huang, H. Liang, and S. Hellebrand, “A High Performance SEU Tolerant Latch,” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 31, no. 4, pp. 349–359, 2015.
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2015 | Misc | LibreCat-ID: 13077
S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, and H.-J. Wunderlich, Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.
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2015 | Conference Paper | LibreCat-ID: 29465
S. Sadeghi-Kohan, A. Kamran, F. Forooghifar, and Z. Navabi, “Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation,” 2015, doi: 10.1109/dtis.2015.7127373.
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2015 | Conference Paper | LibreCat-ID: 29466
S. Sadeghi-Kohan, M. Kamal, J. McNeil, P. Prinetto, and Z. Navabi, “Online self adjusting progressive age monitoring of timing variations,” 2015, doi: 10.1109/dtis.2015.7127368.
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2014 | Journal Article | LibreCat-ID: 13054
S. Hellebrand and H.-J. Wunderlich, “SAT-Based ATPG beyond Stuck-at Fault Testing,” DeGruyter Journal on Information Technology (it), vol. 56, no. 4, pp. 165–172, 2014.
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2014 | Journal Article | LibreCat-ID: 13055
L. Rodriguez Gomez, A. Cook, T. Indlekofer, S. Hellebrand, and H.-J. Wunderlich, “Adaptive Bayesian Diagnosis of Intermittent Faults,” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 30, no. 5, pp. 527–540, 2014.
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2014 | Journal Article | LibreCat-ID: 46266
B. Alizadeh, P. Behnam, and S. Sadeghi-Kohan, “A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs,” IEEE Transactions on Computers, pp. 1–1, 2014, doi: 10.1109/tc.2014.2329687.
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2014 | Conference Paper | LibreCat-ID: 46268
M. Mohammadi, S. Sadeghi-Kohan, N. Masoumi, and Z. Navabi, “An off-line MDSI interconnect BIST incorporated in BS 1149.1,” 2014, doi: 10.1109/ets.2014.6847847.
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2014 | Conference Paper | LibreCat-ID: 46267
S. Sadeghi-Kohan, P. Behnam, B. Alizadeh, M. Fujita, and Z. Navabi, “Improving polynomial datapath debugging with HEDs,” 2014, doi: 10.1109/ets.2014.6847797.
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2013 | Misc | LibreCat-ID: 13075
A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, Adaptive Test and Diagnosis of Intermittent Faults. 14th Latin American Test Workshop, Cordoba, Argentina, 2013.
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2013 | Conference Paper | LibreCat-ID: 46271
S. Sadeghi-Kohan, M. Namaki-Shoushtari, F. Javaheri, and Z. Navabi, “BS 1149.1 extensions for an online interconnect fault detection and recovery,” 2013, doi: 10.1109/test.2012.6401583.
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2013 | Conference Paper | LibreCat-ID: 46270
S. Sadeghi-Kohan, S. Keshavarz, F. Zokaee, F. Farahmandi, and Z. Navabi, “A new structure for interconnect offline testing,” 2013, doi: 10.1109/ewdts.2013.6673207.
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2012 | Misc | LibreCat-ID: 13074
A. Cook, S. Hellebrand, and H.-J. Wunderlich, Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.
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2011 | Conference Paper | LibreCat-ID: 13053
A. Cook, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, “Robuster Selbsttest mit Diagnose,” in 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf,” 2011, pp. 48–53.
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2011 | Journal Article | LibreCat-ID: 13052
F. Hopsch et al., “Variation-Aware Fault Modeling,” SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer, vol. 54, no. 4, pp. 1813–1826, 2011.
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2011 | Conference Paper | LibreCat-ID: 46272
A. Kamran, N. Nemati, S. Sadeghi-Kohan, and Z. Navabi, “Virtual tester development using HDL/PLI,” 2011, doi: 10.1109/ewdts.2010.5742156.
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2010 | Misc | LibreCat-ID: 10670
V. Fröse, R. Ibers, and S. Hellebrand, Testdatenkompression mit Hilfe der Netzwerkinfrastruktur. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.
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2010 | Conference Paper | LibreCat-ID: 12987
B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, and H.-J. Wunderlich, “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits,” in 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10), 2010.
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2010 | Conference Paper | LibreCat-ID: 13051
M. Hunger and S. Hellebrand, “Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz,” in 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf,” 2010, pp. 81–88.
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2010 | Misc | LibreCat-ID: 13073
S. Hellebrand, Nano-Electronic Systems. Editorial, it 4/2010, pp. 179-180, 2010.
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2010 | Conference Paper | LibreCat-ID: 12983
F. Hopsch et al., “Variation-Aware Fault Modeling,” in 19th IEEE Asian Test Symposium (ATS’10), 2010, pp. 87–93, doi: 10.1109/ats.2010.24.
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2010 | Conference Paper | LibreCat-ID: 12985
T. Indlekofer, M. Schnittger, and S. Hellebrand, “Efficient Test Response Compaction for Robust BIST Using Parity Sequences,” in 28th IEEE International Conference on Computer Design (ICCD’10), 2010, pp. 480–485, doi: 10.1109/iccd.2010.5647648.
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2010 | Conference Paper | LibreCat-ID: 12986
M. Hunger and S. Hellebrand, “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems,” in 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), 2010, pp. 101–108, doi: 10.1109/dft.2010.19.
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2010 | Conference Paper | LibreCat-ID: 12988
V. Froese, R. Ibers, and S. Hellebrand, “Reusing NoC-Infrastructure for Test Data Compression,” in 28th IEEE VLSI Test Symposium (VTS’10), 2010, pp. 227–231, doi: 10.1109/vts.2010.5469570.
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2010 | Conference Paper | LibreCat-ID: 13049
B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, and H.-J. Wunderlich, “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits,” 2010.
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2010 | Conference Paper | LibreCat-ID: 13050
T. Indlekofer, M. Schnittger, and S. Hellebrand, “Robuster Selbsttest mit extremer Kompaktierung,” in 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf,” 2010, pp. 17–24.
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2009 | Conference Paper | LibreCat-ID: 12991
M. Hunger, S. Hellebrand, A. Czutro, I. Polian, and B. Becker, “ATPG-Based Grading of Strong Fault-Secureness,” 2009, doi: 10.1109/iolts.2009.5196027.
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2009 | Conference Paper | LibreCat-ID: 12990
S. Hellebrand and M. Hunger, “Are Robust Circuits Really Robust?,” in 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), 2009, p. 77, doi: 10.1109/dft.2009.28.
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2009 | Conference Paper | LibreCat-ID: 13030
M. Hunger, S. Hellebrand, A. Czutro, I. Polian, and B. Becker, “Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung,” 2009.
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2008 | Misc | LibreCat-ID: 13033
T. Coym, S. Hellebrand, S. Ludwig, B. Straube, H.-J. Wunderlich, and C. G. Zoellin, Ein verfeinertes elektrisches Modell für Teilchentreffer und dessen Auswirkung auf die Bewertung der Schaltungsempfindlichkeit. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich, 2008.
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2008 | Misc | LibreCat-ID: 13035
U. Amgalan, C. Hachmann, S. Hellebrand, and H.-J. Wunderlich, Testen mit Rücksetzpunkten - ein Ansatz zur Verbesserung der Ausbeute bei robusten Schaltungen. 20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich, 2008.
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2008 | Conference Paper | LibreCat-ID: 12992
P. Oehler, A. Bosio, G. di Natale, and S. Hellebrand, “A Modular Memory BIST for Optimized Memory Repair,” 2008, doi: 10.1109/iolts.2008.30.
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2008 | Conference Paper | LibreCat-ID: 12994
U. Amgalan, C. Hachmann, S. Hellebrand, and H.-J. Wunderlich, “Signature Rollback - A Technique for Testing Robust Circuits,” in 26th IEEE VLSI Test Symposium (VTS’08), 2008, pp. 125–130, doi: 10.1109/vts.2008.34.
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2008 | Conference Paper | LibreCat-ID: 12993
M. Hunger and S. Hellebrand, “Verification and Analysis of Self-Checking Properties through ATPG,” 2008, doi: 10.1109/iolts.2008.32.
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2008 | Conference Paper | LibreCat-ID: 13031
M. Hunger and S. Hellebrand, “Analyse selbstprüfender Schaltungen – Nachweis von Fehlersicherheit und Selbsttestbarkeit mit ATPG,” 2008.
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2008 | Conference Paper | LibreCat-ID: 13032
P. Oehler, A. Bosio, G. Di Natale, and S. Hellebrand, “Modularer Selbsttest und optimierte Reparaturanalyse,” 2008.
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2007 | Misc | LibreCat-ID: 13038
S. Hellebrand, Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing. 5th IEEE East-West Design \& Test Symposium, Yerevan, Armenia (Invited Talk), 2007.
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2007 | Misc | LibreCat-ID: 13039
M. Ali, M. Welzl, S. Hessler, and S. Hellebrand, An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips. DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster), 2007.
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