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165 Publications


2004 | Conference Paper | LibreCat-ID: 13001
Data Compression for Multiple Scan Chains Using Dictionaries with Corrections
A. Wuertenberger, C. S. Tautermann, S. Hellebrand, in: IEEE International Test Conference (ITC’04), IEEE, Charlotte, NC, USA, 2004, pp. 926–935.
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2003 | Misc | LibreCat-ID: 13098
Experiences from Teaching Software Development in a Java Environment
R. Breu, S. Hellebrand, M. Welzl, Experiences from Teaching Software Development in a Java Environment, Handouts ACS/IEEE Workshop on Practice and Experience with Java in Education, Tunis, Tunisia, 2003.
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2003 | Conference Paper | LibreCat-ID: 13002
A Hybrid Coding Strategy for Optimized Test Data Compression
A. Wuertenberger, C. S. Tautermann, S. Hellebrand, in: IEEE International Test Conference (ITC’03), IEEE, Charlotte, NC, USA, 2003, pp. 451–459.
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2002 | Misc | LibreCat-ID: 13097
Alternating Run-Length Coding: A Technique for Improved Test Data Compression
S. Hellebrand, A. Wuertenberger, Alternating Run-Length Coding: A Technique for Improved Test Data Compression, IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA, 2002.
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2002 | Journal Article | LibreCat-ID: 13003
Efficient Online and Offline Testing of Embedded DRAMs
S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, V. N. Yarmolik, IEEE Transactions on Computers 51 (2002) 801–809.
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2002 | Journal Article | LibreCat-ID: 13069
Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST
S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, Journal of Electronic Testing - Theory and Applications (JETTA) 18 (2002) 157–168.
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2002 | Journal Article | LibreCat-ID: 13070
A Mixed-Mode BIST Scheme Based on Folding Compression
H. Liang, S. Hellebrand, H.-J. Wunderlich, Journal on Computer Science and Technology 17 (2002) 203–212.
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2001 | Misc | LibreCat-ID: 13096
Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST
H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, IEEE European Test Workshop, Stockholm, Sweden, 2001.
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2001 | Conference Paper | LibreCat-ID: 13004
Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST
H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’01), IEEE, Baltimore, MD, USA, 2001, pp. 894–902.
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2001 | Journal Article | LibreCat-ID: 13047
Deterministic BIST Scheme Based on Reseeding of Folding Counters
H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, Journal of Computer Research and Development, (Jisuanji Yanjiu Yu Fazhan) 38 (2001) 931.
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2001 | Journal Article | LibreCat-ID: 13068
A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters
S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, Journal of Electronic Testing - Theory and Applications (JETTA) 17 (2001) 341–349.
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2000 | Misc | LibreCat-ID: 13094
Hardwarepraktikum im Diplomstudiengang Informatik
S. Hellebrand, H.-J. Wunderlich, Hardwarepraktikum Im Diplomstudiengang Informatik, Handbuch Lehre, Berlin, Raabe Verlag, 2000.
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2000 | Misc | LibreCat-ID: 13095
A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters
S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters, IEEE European Test Workshop, Cascais, Portugal, 2000.
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2000 | Conference Paper | LibreCat-ID: 13005
A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters
S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’00), IEEE, Atlantic City, NJ, USA, 2000, pp. 778–784.
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1999 | Book | LibreCat-ID: 13065
Selbsttestbare Steuerwerke - Strukturen und Syntheseverfahren
S. Hellebrand, Selbsttestbare Steuerwerke - Strukturen Und Syntheseverfahren, Verlag Dr. Kovac, Hamburg, Verlag Dr. Kovac, Hamburg, 1999.
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1999 | Misc | LibreCat-ID: 13093
Exploiting Symmetries to Speed Up Transparent BIST
S. Hellebrand, H.-J. Wunderlich, V. N. Yarmolik, Exploiting Symmetries to Speed Up Transparent BIST, 11th GI/ITG/GMM/IEEE Workshop, 1999.
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1999 | Conference Paper | LibreCat-ID: 13006
Error Detecting Refreshment for Embedded DRAMs
S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, V. N. Yarmolik, in: 17th IEEE VLSI Test Symposium (VTS’99), IEEE, Dana Point, CA, USA, 1999, pp. 384–390.
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1999 | Conference Paper | LibreCat-ID: 13066
Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms
V. N. Yarmolik, I. V. Bykov, S. Hellebrand, H.-J. Wunderlich, in: Third European Dependable Computing Conference (EDCC-3), Prague, Czech Republic, 1999.
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1999 | Conference Paper | LibreCat-ID: 13067
Symmetric Transparent BIST for RAMs
S. Hellebrand, H.-J. Wunderlich, V. N. Yarmolik, in: Design Automation and Test in Europe (DATE’99), Munich, Germany, 1999, pp. 702–707.
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1998 | Report | LibreCat-ID: 13029
Test und Synthese schneller eingebetteter Systeme
S. Hellebrand, H.-J. Wunderlich, Test Und Synthese Schneller Eingebetteter Systeme, Universität Stuttgart, 1998.
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1998 | Misc | LibreCat-ID: 13091
Efficient Consistency Checking for Embedded Memories
V. N. Yarmolik, S. Hellebrand, H.-J. Wunderlich, Efficient Consistency Checking for Embedded Memories, 5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1998.
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1998 | Misc | LibreCat-ID: 13092
Efficient Consistency Checking for Embedded Memories
V. N. Yarmolik, S. Hellebrand, H.-J. Wunderlich, Efficient Consistency Checking for Embedded Memories, 10th GI/ITG/GMM/IEEE Workshop, 1998.
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1998 | Book Chapter | LibreCat-ID: 13060
Mixed-Mode BIST Using Embedded Processors
S. Hellebrand, H.-J. Wunderlich, A. Hertwig, in: Mixed-Mode BIST Using Embedded Processors, Kluwer Academic Publishers, In: M. Nicolaidis, Y. Zorian, D. K. Pradhan (Eds.): On-Line Testing for VLSI, Boston: Kluwer Academic Publishers 1998, 1998.
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1998 | Journal Article | LibreCat-ID: 13061
Mixed-Mode BIST Using Embedded Processors
S. Hellebrand, H.-J. Wunderlich, A. Hertwig, Journal of Electronic Testing Theory and Applications - JETTA 12 (1998) 127–138.
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1998 | Journal Article | LibreCat-ID: 13064
Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications
S. Hellebrand, A. Hertwig, H.-J. Wunderlich, IEEE Design and Test 15 (1998) 36–41.
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1998 | Conference Paper | LibreCat-ID: 13007
Fast Self-Recovering Controllers
A. Hertwig, S. Hellebrand, H.-J. Wunderlich, in: 16th IEEE VLSI Test Symposium (VTS’98), IEEE, Monterey, CA, USA, 1998, pp. 296–302.
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1998 | Conference Paper | LibreCat-ID: 13008
Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs
S. Hellebrand, H.-J. Wunderlich, V. N. Yarmolik, in: Design Automation and Test in Europe (DATE’98), Paris, France, 1998, pp. 173–179.
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1998 | Conference Paper | LibreCat-ID: 13063
New Transparent RAM BIST Based on Self-Adjusting Output Data Compression
V. N. Yarmolik, Y. V. Klimets, S. Hellebrand, H.-J. Wunderlich, in: Design & Diagnostics of Electronic Circuits & Systems (DDECS’98), Szczyrk, Poland, 1998, pp. 27–33.
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1997 | Misc | LibreCat-ID: 13089
STARBIST: Scan Autocorrelated Random Pattern Generation
K.-H. Tsai, S. Hellebrand, J. Rajski, M. Marek-Sadowska, STARBIST: Scan Autocorrelated Random Pattern Generation, 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1997.
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1997 | Misc | LibreCat-ID: 13090
Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications
A. Hertwig, S. Hellebrand, H.-J. Wunderlich, Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications, 3rd IEEE International On-Line Testing Workshop, Crete, Greece, 1997.
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1997 | Conference Paper | LibreCat-ID: 13009
STARBIST: Scan Autocorrelated Random Pattern Generation
K.-H. Tsai, S. Hellebrand, M. Marek-Sadowska, J. Rajski, in: 34th ACM/IEEE Design Automation Conference (DAC’97), IEEE, Anaheim, CA, USA, 1997.
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1996 | Misc | LibreCat-ID: 13087
Using Embedded Processors for BIST
S. Hellebrand, H.-J. Wunderlich, Using Embedded Processors for BIST, 3rd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1996.
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1996 | Misc | LibreCat-ID: 13088
Mixed-Mode BIST Using Embedded Processors
S. Hellebrand, H.-J. Wunderlich, A. Hertwig, Mixed-Mode BIST Using Embedded Processors, 2nd IEEE International On-Line Testing Workshop. Biarritz, France, 1996.
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1996 | Conference Paper | LibreCat-ID: 13010
Mixed-Mode BIST Using Embedded Processors
S. Hellebrand, H.-J. Wunderlich, A. Hertwig, in: IEEE International Test Conference (ITC’96), IEEE, Washington, DC, USA, 1996, pp. 195–204.
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1995 | Report | LibreCat-ID: 13026
Synthesis Procedures for Self-Testable Controllers
S. Hellebrand, H.-J. Wunderlich, Synthesis Procedures for Self-Testable Controllers, University of Siegen, Germany, 1995.
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1995 | Report | LibreCat-ID: 13027
Evaluation of Self-Testable Controller Architectures Based on Realistic Fault Analysis
S. Hellebrand, H.-J. Wunderlich, F. Goncalves, J. Paulo Teixeira, Evaluation of Self-Testable Controller Architectures Based on Realistic Fault Analysis, University Siegen, Germany, 1995.
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1995 | Report | LibreCat-ID: 13028
Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing
S. Hellebrand, M. Herzog, H.-J. Wunderlich, Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing, University of Siegen, Germany, 1995.
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1995 | Misc | LibreCat-ID: 13086
Pattern Generation for a Deterministic BIST Scheme
S. Hellebrand, B. Reeb, S. Tarnick, H.-J. Wunderlich, Pattern Generation for a Deterministic BIST Scheme, 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1995.
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1995 | Journal Article | LibreCat-ID: 13011
Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers
S. Hellebrand, J. Rajski, S. Tarnick, S. Venkataraman, B. Courtois, IEEE Transactions on Computers 44 (1995) 223–233.
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1995 | Conference Paper | LibreCat-ID: 13012
Pattern Generation for a Deterministic BIST Scheme
S. Hellebrand, B. Reeb, S. Tarnick, H.-J. Wunderlich, in: ACM/IEEE International Conference on Computer Aided Design (ICCAD’95), IEEE, San Jose, CA, USA, 1995, pp. 88–94.
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1994 | Report | LibreCat-ID: 13024
Synthesis for Off-line Testability
S. Hellebrand, A. Juergensen, H.-J. Wunderlich, Synthesis for Off-Line Testability, University of Siegen, Germany, 1994.
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1994 | Report | LibreCat-ID: 13025
Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time
S. Hellebrand, A. Juergensen, A. Stroele, H.-J. Wunderlich, Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time, University of Siegen, Germany, 1994.
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1994 | Misc | LibreCat-ID: 13083
Effiziente Testsatzkodierung für Prüfpfad-basierte Selbsttestarchitekturen
S. Venkataraman, J. Rajski, S. Hellebrand, S. Tarnick, Effiziente Testsatzkodierung Für Prüfpfad-Basierte Selbsttestarchitekturen, 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, 1994.
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1994 | Misc | LibreCat-ID: 13084
Ein Verfahren zur testfreundlichen Steuerwerkssynthese
S. Hellebrand, H.-J. Wunderlich, Ein Verfahren Zur Testfreundlichen Steuerwerkssynthese, 6th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Vaals, The Netherlands, 1994.
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1994 | Misc | LibreCat-ID: 13085
Synthesis for Testability - the ARCHIMEDES Approach
S. Hellebrand, J. Paulo Teixeira, H.-J. Wunderlich, Synthesis for Testability - the ARCHIMEDES Approach, 1st IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1994.
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1994 | Conference Paper | LibreCat-ID: 13014
An Efficient Procedure for the Synthesis of Fast Self-Testable Controller Structures
S. Hellebrand, H.-J. Wunderlich, in: ACM/IEEE International Conference on Computer-Aided Design (ICCAD’94), IEEE, San Jose, CA, USA, 1994, pp. 110–116.
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1994 | Conference Paper | LibreCat-ID: 13059
Synthese schneller selbsttestbarer Steuerwerke
S. Hellebrand, H.-J. Wunderlich, in: Tagungsband Der GI/GME/ITG-Fachtagung \& Rechnergestützter Entwurf Und Architektur Mikroelektronischer Systeme, Oberwiesenthal, Informatik Xpress 4, TU Chemnitz Zwickau, Germany, 1994, pp. 3–11.
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1994 | Conference Paper | LibreCat-ID: 13013
Synthesis of Self-Testable Controllers
S. Hellebrand, H.-J. Wunderlich, in: European Design and Test Conference (EDAC/ETC/EUROASIC), Paris, France, 1994, pp. 580–585.
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1993 | Misc | LibreCat-ID: 13081
Effiziente Erzeugung deterministischer Muster im Selbsttest
S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Effiziente Erzeugung Deterministischer Muster Im Selbsttest, 5th ITG/GI/GME Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Holzhau, Germany, 1993.
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1993 | Misc | LibreCat-ID: 13082
Synthesis of Self-Testable Controllers
S. Hellebrand, H.-J. Wunderlich, Synthesis of Self-Testable Controllers, ARCHIMEDES Open Workshop on “Synthesis - Architectural Testability Support”, Montpellier, France, 1993.
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