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165 Publications
2024 | Conference Paper | LibreCat-ID: 52744
Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations
H. Jafarzadeh, F. Klemme, H. Amrouch, S. Hellebrand, H.-J. Wunderlich, in: European Test Symposium, The Hague, Netherlands, May 20-24, 2024, IEEE, n.d., p. 6.
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H. Jafarzadeh, F. Klemme, H. Amrouch, S. Hellebrand, H.-J. Wunderlich, in: European Test Symposium, The Hague, Netherlands, May 20-24, 2024, IEEE, n.d., p. 6.
2024 | Conference Paper | LibreCat-ID: 52742
Vmin Testing under Variations: Defect vs. Fault Coverage
H. Jafarzadeh, F. Klemme, H. Amrouch, S. Hellebrand, H.-J. Wunderlich, in: IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024, IEEE, n.d., p. 6.
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H. Jafarzadeh, F. Klemme, H. Amrouch, S. Hellebrand, H.-J. Wunderlich, in: IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024, IEEE, n.d., p. 6.
2024 | Conference Paper | LibreCat-ID: 52743
Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle
S. Hellebrand, S. Sadeghi-Kohan, H.-J. Wunderlich, in: International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, n.d., p. 1.
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S. Hellebrand, S. Sadeghi-Kohan, H.-J. Wunderlich, in: International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, n.d., p. 1.
2024 | Conference Paper | LibreCat-ID: 52745
Robust Test of Small Delay Faults under PVT-Variations
H.-J. Wunderlich, H. Jafarzadeh, S. Hellebrand, in: International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, n.d., p. 1.
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H.-J. Wunderlich, H. Jafarzadeh, S. Hellebrand, in: International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, n.d., p. 1.
2024 | Misc | LibreCat-ID: 50284
Modeling Crosstalk-induced Interconnect Delay with Polynomial Regression
A. Stiballe, J.D. Reimer, S. Sadeghi-Kohan, S. Hellebrand, Modeling Crosstalk-Induced Interconnect Delay with Polynomial Regression, 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’24), Feb. 2024, Darmstadt, Germany, 2024.
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A. Stiballe, J.D. Reimer, S. Sadeghi-Kohan, S. Hellebrand, Modeling Crosstalk-Induced Interconnect Delay with Polynomial Regression, 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’24), Feb. 2024, Darmstadt, Germany, 2024.
2023 | Misc | LibreCat-ID: 35204
On Cryptography Effects on Interconnect Reliability
A. Ghazal, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, On Cryptography Effects on Interconnect Reliability, 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, Erfurt, Germany, 2023.
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A. Ghazal, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, On Cryptography Effects on Interconnect Reliability, 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, Erfurt, Germany, 2023.
2023 | Dissertation | LibreCat-ID: 46482 | 
Testinstrumente und Testdatenanalyse zur Verarbeitung von Unsicherheiten in Logikblöcken hochintegrierter Schaltungen
A. Sprenger, Testinstrumente und Testdatenanalyse zur Verarbeitung von Unsicherheiten in Logikblöcken hochintegrierter Schaltungen, Universität Paderborn, Paderborn, 2023.
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A. Sprenger, Testinstrumente und Testdatenanalyse zur Verarbeitung von Unsicherheiten in Logikblöcken hochintegrierter Schaltungen, Universität Paderborn, Paderborn, 2023.
2023 | Conference Paper | LibreCat-ID: 46739
Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication
S. Sadeghi-Kohan, S. Hellebrand, H.-J. Wunderlich, in: 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W), IEEE, 2023.
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S. Sadeghi-Kohan, S. Hellebrand, H.-J. Wunderlich, in: 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W), IEEE, 2023.
2023 | Conference Paper | LibreCat-ID: 46738
Optimizing the Streaming of Sensor Data with Approximate Communication
S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, H.-J. Wunderlich, in: IEEE Asian Test Symposium (ATS’23), October 2023, Beijing, China, 2023.
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S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, H.-J. Wunderlich, in: IEEE Asian Test Symposium (ATS’23), October 2023, Beijing, China, 2023.
2023 | Journal Article | LibreCat-ID: 46264
Workload-Aware Periodic Interconnect BIST
S. Sadeghi-Kohan, S. Hellebrand, H.-J. Wunderlich, IEEE Design &Test (2023) 1–1.
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S. Sadeghi-Kohan, S. Hellebrand, H.-J. Wunderlich, IEEE Design &Test (2023) 1–1.
2023 | Conference Paper | LibreCat-ID: 45830
Robust Pattern Generation for Small Delay Faults under Process Variations
H. Jafarzadeh, F. Klemme, J.D. Reimer, Z.P. Najafi Haghi, H. Amrouch, S. Hellebrand, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023, IEEE, Anaheim, CA, USA, 2023.
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H. Jafarzadeh, F. Klemme, J.D. Reimer, Z.P. Najafi Haghi, H. Amrouch, S. Hellebrand, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023, IEEE, Anaheim, CA, USA, 2023.
2022 | Journal Article | LibreCat-ID: 29351
Stress-Aware Periodic Test of Interconnects
S. Sadeghi-Kohan, S. Hellebrand, H.-J. Wunderlich, Journal of Electronic Testing (2022).
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S. Sadeghi-Kohan, S. Hellebrand, H.-J. Wunderlich, Journal of Electronic Testing (2022).
2022 | Misc | LibreCat-ID: 29890
EM-Aware Interconnect BIST
S. Sadeghi-Kohan, S. Hellebrand, H.-J. Wunderlich, EM-Aware Interconnect BIST, European Workshop on Silicon Lifecycle Management, March 18, 2022, Online, 2022.
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S. Sadeghi-Kohan, S. Hellebrand, H.-J. Wunderlich, EM-Aware Interconnect BIST, European Workshop on Silicon Lifecycle Management, March 18, 2022, Online, 2022.
2020 | Conference Paper | LibreCat-ID: 19422
Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study
A. Sprenger, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, Virtual Conference - Originally Frascati (Rome), Italy, 2020.
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A. Sprenger, S. Sadeghi-Kohan, J.D. Reimer, S. Hellebrand, in: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020, Virtual Conference - Originally Frascati (Rome), Italy, 2020.
2020 | Misc | LibreCat-ID: 15419
Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects
S. Sadeghi-Kohan, S. Hellebrand, Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects, 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, Ludwigsburg, 2020.
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S. Sadeghi-Kohan, S. Hellebrand, Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects, 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, Ludwigsburg, 2020.
2020 | Conference Paper | LibreCat-ID: 29200
Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects
S. Sadeghi-Kohan, S. Hellebrand, in: 38th IEEE VLSI Test Symposium (VTS), IEEE, Virtual Conference - Originally San Diego, CA, USA, 2020.
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S. Sadeghi-Kohan, S. Hellebrand, in: 38th IEEE VLSI Test Symposium (VTS), IEEE, Virtual Conference - Originally San Diego, CA, USA, 2020.
2020 | Conference Paper | LibreCat-ID: 19421
Logic Fault Diagnosis of Hidden Delay Defects
S. Holst, M. Kampmann, A. Sprenger, J.D. Reimer, S. Hellebrand, H.-J. Wunderlich, X. Weng, in: IEEE International Test Conference (ITC’20), November 2020, Virtual Conference - Originally Washington, DC, USA, 2020.
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S. Holst, M. Kampmann, A. Sprenger, J.D. Reimer, S. Hellebrand, H.-J. Wunderlich, X. Weng, in: IEEE International Test Conference (ITC’20), November 2020, Virtual Conference - Originally Washington, DC, USA, 2020.
2019 | Misc | LibreCat-ID: 8112
A Hybrid Space Compactor for Varying X-Rates
M.U. Maaz, A. Sprenger, S. Hellebrand, A Hybrid Space Compactor for Varying X-Rates, 31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19), Prien am Chiemsee, 2019.
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M.U. Maaz, A. Sprenger, S. Hellebrand, A Hybrid Space Compactor for Varying X-Rates, 31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19), Prien am Chiemsee, 2019.
2019 | Journal Article | LibreCat-ID: 8667
Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test
A. Sprenger, S. Hellebrand, Journal of Circuits, Systems and Computers 28 (2019) 1–23.
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A. Sprenger, S. Hellebrand, Journal of Circuits, Systems and Computers 28 (2019) 1–23.
2019 | Journal Article | LibreCat-ID: 13048
Built-in Test for Hidden Delay Faults
M. Kampmann, M. A. Kochte, C. Liu, E. Schneider, S. Hellebrand, H.-J. Wunderlich, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 38 (2019) 1956–1968.
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M. Kampmann, M. A. Kochte, C. Liu, E. Schneider, S. Hellebrand, H.-J. Wunderlich, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 38 (2019) 1956–1968.
2019 | Conference Paper | LibreCat-ID: 12918
A Hybrid Space Compactor for Adaptive X-Handling
M.U. Maaz, A. Sprenger, S. Hellebrand, in: 50th IEEE International Test Conference (ITC), IEEE, Washington, DC, USA, 2019, pp. 1–8.
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M.U. Maaz, A. Sprenger, S. Hellebrand, in: 50th IEEE International Test Conference (ITC), IEEE, Washington, DC, USA, 2019, pp. 1–8.
2018 | Misc | LibreCat-ID: 4576
Stochastische Kompaktierung für den Hochgeschwindigkeitstest
A. Sprenger, S. Hellebrand, Stochastische Kompaktierung für den Hochgeschwindigkeitstest, 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), Freiburg, Germany, 2018.
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A. Sprenger, S. Hellebrand, Stochastische Kompaktierung für den Hochgeschwindigkeitstest, 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), Freiburg, Germany, 2018.
2018 | Journal Article | LibreCat-ID: 12974
Guest Editors' Introduction - Special Issue on Approximate Computing
S. Hellebrand, J. Henkel, A. Raghunathan, H.-J. Wunderlich, IEEE Embedded Systems Letters 10 (2018) 1–1.
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S. Hellebrand, J. Henkel, A. Raghunathan, H.-J. Wunderlich, IEEE Embedded Systems Letters 10 (2018) 1–1.
2018 | Journal Article | LibreCat-ID: 13057
Design For Small Delay Test - A Simulation Study
M. Kampmann, S. Hellebrand, Microelectronics Reliability 80 (2018) 124–133.
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M. Kampmann, S. Hellebrand, Microelectronics Reliability 80 (2018) 124–133.
2018 | Misc | LibreCat-ID: 13072
Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test
M. Kampmann, S. Hellebrand, Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test, 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China, 2018.
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M. Kampmann, S. Hellebrand, Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test, 19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China, 2018.
2018 | Conference Paper | LibreCat-ID: 29460
Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture
R. Rezaeizadeh Rookerd, S. Sadeghi-Kohan, Z. Navabi, in: Proceedings of the 2018 on Great Lakes Symposium on VLSI, ACM, 2018.
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R. Rezaeizadeh Rookerd, S. Sadeghi-Kohan, Z. Navabi, in: Proceedings of the 2018 on Great Lakes Symposium on VLSI, ACM, 2018.
2018 | Conference Paper | LibreCat-ID: 4575
Tuning Stochastic Space Compaction to Faster-than-at-Speed Test
A. Sprenger, S. Hellebrand, in: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), IEEE, Budapest, Hungary, 2018.
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A. Sprenger, S. Hellebrand, in: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), IEEE, Budapest, Hungary, 2018.
2018 | Conference Paper | LibreCat-ID: 10575
Extending Aging Monitors for Early Life and Wear-Out Failure Prevention
C. Liu, E. Schneider, M. Kampmann, S. Hellebrand, H.-J. Wunderlich, in: 27th IEEE Asian Test Symposium (ATS’18), 2018.
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C. Liu, E. Schneider, M. Kampmann, S. Hellebrand, H.-J. Wunderlich, in: 27th IEEE Asian Test Symposium (ATS’18), 2018.
2018 | Conference Paper | LibreCat-ID: 29459
Near-Optimal Node Selection Procedure for Aging Monitor Placement
S. Sadeghi-Kohan, A. Vafaei, Z. Navabi, in: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), IEEE, 2018.
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S. Sadeghi-Kohan, A. Vafaei, Z. Navabi, in: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), IEEE, 2018.
2017 | Conference Paper | LibreCat-ID: 12973
Special Session on Early Life Failures
J. Deshmukh, W. Kunz, H.-J. Wunderlich, S. Hellebrand, in: 35th IEEE VLSI Test Symposium (VTS’17), IEEE, Caesars Palace, Las Vegas, Nevada, USA, 2017.
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J. Deshmukh, W. Kunz, H.-J. Wunderlich, S. Hellebrand, in: 35th IEEE VLSI Test Symposium (VTS’17), IEEE, Caesars Palace, Las Vegas, Nevada, USA, 2017.
2017 | Misc | LibreCat-ID: 13078
X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz
M. Kampmann, S. Hellebrand, X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz, 29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.
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M. Kampmann, S. Hellebrand, X-Tolerante Prüfzellengruppierung Für Den Test Mit Erhöhter Betriebsfrequenz, 29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.
2017 | Conference Paper | LibreCat-ID: 10576
Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test
M. Kampmann, S. Hellebrand, in: 20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17), IEEE, 2017.
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M. Kampmann, S. Hellebrand, in: 20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17), IEEE, 2017.
2017 | Journal Article | LibreCat-ID: 29462
Self-Adjusting Monitor for Measuring Aging Rate and Advancement
S. Sadeghi-Kohan, M. Kamal, Z. Navabi, IEEE Transactions on Emerging Topics in Computing 8 (2017) 627–641.
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S. Sadeghi-Kohan, M. Kamal, Z. Navabi, IEEE Transactions on Emerging Topics in Computing 8 (2017) 627–641.
2017 | Conference Paper | LibreCat-ID: 29463
Universal mitigation of NBTI-induced aging by design randomization
M. Jenihhin, A. Kamkin, Z. Navabi, S. Sadeghi-Kohan, in: 2016 IEEE East-West Design & Test Symposium (EWDTS), IEEE, 2017.
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M. Jenihhin, A. Kamkin, Z. Navabi, S. Sadeghi-Kohan, in: 2016 IEEE East-West Design & Test Symposium (EWDTS), IEEE, 2017.
2016 | Conference Paper | LibreCat-ID: 12975
X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test
M. Kampmann, S. Hellebrand, in: 25th IEEE Asian Test Symposium (ATS’16), IEEE, Hiroshima, Japan, 2016, pp. 1–6.
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M. Kampmann, S. Hellebrand, in: 25th IEEE Asian Test Symposium (ATS’16), IEEE, Hiroshima, Japan, 2016, pp. 1–6.
2015 | Conference Paper | LibreCat-ID: 12976
Optimized Selection of Frequencies for Faster-Than-at-Speed Test
M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, H.-J. Wunderlich, in: 24th IEEE Asian Test Symposium (ATS’15), IEEE, Mumbai, India, 2015, pp. 109–114.
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M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, H.-J. Wunderlich, in: 24th IEEE Asian Test Symposium (ATS’15), IEEE, Mumbai, India, 2015, pp. 109–114.
2015 | Journal Article | LibreCat-ID: 13056
A High Performance SEU Tolerant Latch
Z. Huang, H. Liang, S. Hellebrand, Journal of Electronic Testing - Theory and Applications (JETTA) 31 (2015) 349–359.
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Z. Huang, H. Liang, S. Hellebrand, Journal of Electronic Testing - Theory and Applications (JETTA) 31 (2015) 349–359.
2015 | Misc | LibreCat-ID: 13077
Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler
S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, H.-J. Wunderlich, Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler, 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.
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S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, H.-J. Wunderlich, Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler, 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.
2015 | Conference Paper | LibreCat-ID: 29465
Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation
S. Sadeghi-Kohan, A. Kamran, F. Forooghifar, Z. Navabi, in: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), IEEE, 2015.
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S. Sadeghi-Kohan, A. Kamran, F. Forooghifar, Z. Navabi, in: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), IEEE, 2015.
2015 | Conference Paper | LibreCat-ID: 29466
Online self adjusting progressive age monitoring of timing variations
S. Sadeghi-Kohan, M. Kamal, J. McNeil, P. Prinetto, Z. Navabi, in: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), IEEE, 2015.
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S. Sadeghi-Kohan, M. Kamal, J. McNeil, P. Prinetto, Z. Navabi, in: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), IEEE, 2015.
2014 | Conference Paper | LibreCat-ID: 12977
FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects
S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’14), IEEE, Seattle, Washington, USA, 2014.
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S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, H.-J. Wunderlich, in: IEEE International Test Conference (ITC’14), IEEE, Seattle, Washington, USA, 2014.
2014 | Journal Article | LibreCat-ID: 13054
SAT-Based ATPG beyond Stuck-at Fault Testing
S. Hellebrand, H.-J. Wunderlich, DeGruyter Journal on Information Technology (It) 56 (2014) 165–172.
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S. Hellebrand, H.-J. Wunderlich, DeGruyter Journal on Information Technology (It) 56 (2014) 165–172.
2014 | Journal Article | LibreCat-ID: 13055
Adaptive Bayesian Diagnosis of Intermittent Faults
L. Rodriguez Gomez, A. Cook, T. Indlekofer, S. Hellebrand, H.-J. Wunderlich, Journal of Electronic Testing - Theory and Applications (JETTA) 30 (2014) 527–540.
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L. Rodriguez Gomez, A. Cook, T. Indlekofer, S. Hellebrand, H.-J. Wunderlich, Journal of Electronic Testing - Theory and Applications (JETTA) 30 (2014) 527–540.
2014 | Journal Article | LibreCat-ID: 46266
A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs
B. Alizadeh, P. Behnam, S. Sadeghi-Kohan, IEEE Transactions on Computers (2014) 1–1.
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B. Alizadeh, P. Behnam, S. Sadeghi-Kohan, IEEE Transactions on Computers (2014) 1–1.
2014 | Conference Paper | LibreCat-ID: 46268
An off-line MDSI interconnect BIST incorporated in BS 1149.1
M. Mohammadi, S. Sadeghi-Kohan, N. Masoumi, Z. Navabi, in: 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014.
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M. Mohammadi, S. Sadeghi-Kohan, N. Masoumi, Z. Navabi, in: 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014.
2014 | Conference Paper | LibreCat-ID: 46267
Improving polynomial datapath debugging with HEDs
S. Sadeghi-Kohan, P. Behnam, B. Alizadeh, M. Fujita, Z. Navabi, in: 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014.
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S. Sadeghi-Kohan, P. Behnam, B. Alizadeh, M. Fujita, Z. Navabi, in: 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014.
2013 | Conference Paper | LibreCat-ID: 12979
Analyzing and Quantifying Fault Tolerance Properties
S. Hellebrand, in: 14th IEEE Latin American Test Workshop - (LATW’13), IEEE, Cordoba, Argentina, 2013.
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S. Hellebrand, in: 14th IEEE Latin American Test Workshop - (LATW’13), IEEE, Cordoba, Argentina, 2013.
2013 | Misc | LibreCat-ID: 13075
Adaptive Test and Diagnosis of Intermittent Faults
A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, Adaptive Test and Diagnosis of Intermittent Faults, 14th Latin American Test Workshop, Cordoba, Argentina, 2013.
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A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, Adaptive Test and Diagnosis of Intermittent Faults, 14th Latin American Test Workshop, Cordoba, Argentina, 2013.
2013 | Conference Paper | LibreCat-ID: 46271
BS 1149.1 extensions for an online interconnect fault detection and recovery
S. Sadeghi-Kohan, M. Namaki-Shoushtari, F. Javaheri, Z. Navabi, in: 2012 IEEE International Test Conference, IEEE, 2013.
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S. Sadeghi-Kohan, M. Namaki-Shoushtari, F. Javaheri, Z. Navabi, in: 2012 IEEE International Test Conference, IEEE, 2013.
2013 | Conference Paper | LibreCat-ID: 46270
A new structure for interconnect offline testing
S. Sadeghi-Kohan, S. Keshavarz, F. Zokaee, F. Farahmandi, Z. Navabi, in: East-West Design & Test Symposium (EWDTS 2013), IEEE, 2013.
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S. Sadeghi-Kohan, S. Keshavarz, F. Zokaee, F. Farahmandi, Z. Navabi, in: East-West Design & Test Symposium (EWDTS 2013), IEEE, 2013.