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199 Publications
2014 | Conference Paper | LibreCat-ID: 39518
Titanium disilicide as hot side metallization layer for thermoelectric generators
U. Hilleringmann, M. Schonhoff, F. Assion, in: 2013 Africon, IEEE, 2014.
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| DOI
U. Hilleringmann, M. Schonhoff, F. Assion, in: 2013 Africon, IEEE, 2014.
2013 | Journal Article | LibreCat-ID: 4098
Self-organization of nanospheres in trenches on silicon surfaces
K. Brassat, F. Assion, U. Hilleringmann, J. Lindner, Physica Status Solidi (A) 210 (2013) 1485–1489.
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| DOI
K. Brassat, F. Assion, U. Hilleringmann, J. Lindner, Physica Status Solidi (A) 210 (2013) 1485–1489.
2013 | Journal Article | LibreCat-ID: 39506
Self-organization of nanospheres in trenches on silicon surfaces
K. Brassat, F. Assion, U. Hilleringmann, J.K.N. Lindner, Physica Status Solidi (a) 210 (2013) 1485–1489.
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K. Brassat, F. Assion, U. Hilleringmann, J.K.N. Lindner, Physica Status Solidi (a) 210 (2013) 1485–1489.
2013 | Journal Article | LibreCat-ID: 39508
Titanium Disilicide as High-Temperature Contact Material for Thermoelectric Generators
F. Assion, M. Schönhoff, U. Hilleringmann, Journal of Electronic Materials 42 (2013) 1932–1935.
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F. Assion, M. Schönhoff, U. Hilleringmann, Journal of Electronic Materials 42 (2013) 1932–1935.
2013 | Journal Article | LibreCat-ID: 39485
Enhanced organic light-emitting diode based on a columnar liquid crystal by integration in a microresonator
O. Kasdorf, J. Vollbrecht, B. Ohms, U. Hilleringmann, H. Bock, H.-S. Kitzerow, International Journal of Energy Research 38 (2013) 452–458.
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O. Kasdorf, J. Vollbrecht, B. Ohms, U. Hilleringmann, H. Bock, H.-S. Kitzerow, International Journal of Energy Research 38 (2013) 452–458.
2013 | Journal Article | LibreCat-ID: 39514
Design and implementation of a measurement system for automatically measurement of electrical parameters of thermoelectric generators
D. Petrov, F. Assion, U. Hilleringmann, MRS Proceedings 1490 (2013) 191–196.
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D. Petrov, F. Assion, U. Hilleringmann, MRS Proceedings 1490 (2013) 191–196.
2013 | Journal Article | LibreCat-ID: 39523
Formation and Properties of TiSi2 as Contact Material for High-Temperature Thermoelectric Generators
F. Assion, M. Schönhoff, U. Hilleringmann, MRS Proceedings 1490 (2013) 97–102.
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F. Assion, M. Schönhoff, U. Hilleringmann, MRS Proceedings 1490 (2013) 97–102.
2013 | Conference Paper | LibreCat-ID: 39524
Electrical characterization of rubber mixture sheets based on a coaxial probe method in combination with 3D electromagnetic simulation model
K. Kanwar, C. Fischer, V. Geneiss, T. Mager, U. Ballhausen, C. Hedayat, U. Hilleringmann, in: 2012 IEEE International Conference on RFID-Technologies and Applications (RFID-TA), IEEE, 2013.
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K. Kanwar, C. Fischer, V. Geneiss, T. Mager, U. Ballhausen, C. Hedayat, U. Hilleringmann, in: 2012 IEEE International Conference on RFID-Technologies and Applications (RFID-TA), IEEE, 2013.
2013 | Conference Paper | LibreCat-ID: 39511
Enhanced event-driven modeling of a CP-PLL with nonlinearities and nonidealities
C. Hangmann, C. Hedayat, U. Hilleringmann, in: 2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS), IEEE, 2013.
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C. Hangmann, C. Hedayat, U. Hilleringmann, in: 2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS), IEEE, 2013.
2013 | Conference Paper | LibreCat-ID: 39509
Resistivity reduction in flexible dye sensitized solar cells by UV irradiation and carbon nanotubes
U. Hilleringmann, B. Ohms, A. Kleine, in: 2013 IEEE International Conference on Industrial Technology (ICIT), IEEE, 2013.
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U. Hilleringmann, B. Ohms, A. Kleine, in: 2013 IEEE International Conference on Industrial Technology (ICIT), IEEE, 2013.
2013 | Journal Article | LibreCat-ID: 39504
Characterization and Analysis of the Hysteresis in a ZnO Nanoparticle Thin-Film Transistor
F.F. Vidor, G. Wirth, F. Assion, K. Wolff, U. Hilleringmann, IEEE Transactions on Nanotechnology 12 (2013) 296–303.
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F.F. Vidor, G. Wirth, F. Assion, K. Wolff, U. Hilleringmann, IEEE Transactions on Nanotechnology 12 (2013) 296–303.
2013 | Conference Paper | LibreCat-ID: 39516
Design and analysis of UHF RFID tag for a rubber transmission belt based on 3D electrical model
K. Kanwar, V. Geneiss, T. Mager, S. Scheele, U. Ballhausen, C. Hedayat, U. Hilleringmann, in: 2013 21st International Conference on Software, Telecommunications and Computer Networks - (SoftCOM 2013), IEEE, 2013.
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K. Kanwar, V. Geneiss, T. Mager, S. Scheele, U. Ballhausen, C. Hedayat, U. Hilleringmann, in: 2013 21st International Conference on Software, Telecommunications and Computer Networks - (SoftCOM 2013), IEEE, 2013.
2013 | Conference Paper | LibreCat-ID: 39515
Designing output-power-optimized thermoelectric generators via analytic and finite element method modelling
F. Assion, C. Fischer, M. Schonhof, U. Hilleringmann, C. Hedayat, in: 2013 IEEE International Conference on Industrial Technology (ICIT), IEEE, 2013.
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F. Assion, C. Fischer, M. Schonhof, U. Hilleringmann, C. Hedayat, in: 2013 IEEE International Conference on Industrial Technology (ICIT), IEEE, 2013.
2013 | Journal Article | LibreCat-ID: 39707
Enhanced organic light-emitting diode based on a columnar liquid crystal by integration in a microresonator
O. Kasdorf, J. Vollbrecht, B. Ohms, U. Hilleringmann, H. Bock, H.-S. Kitzerow, International Journal of Energy Research 38 (2013) 452–458.
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| DOI
O. Kasdorf, J. Vollbrecht, B. Ohms, U. Hilleringmann, H. Bock, H.-S. Kitzerow, International Journal of Energy Research 38 (2013) 452–458.
2012 | Journal Article | LibreCat-ID: 39520
Surface tension and its role for vertical wet etching of silicon
A. Brockmeier, F.J.S. Rodriguez, M. Harrison, U. Hilleringmann, Journal of Micromechanics and Microengineering 22 (2012).
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A. Brockmeier, F.J.S. Rodriguez, M. Harrison, U. Hilleringmann, Journal of Micromechanics and Microengineering 22 (2012).
2012 | Journal Article | LibreCat-ID: 39522
Surface tension and its role for vertical wet etching of silicon
A. Brockmeier, F.J.S. Rodriguez, M. Harrison, U. Hilleringmann, Journal of Micromechanics and Microengineering 22 (2012).
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A. Brockmeier, F.J.S. Rodriguez, M. Harrison, U. Hilleringmann, Journal of Micromechanics and Microengineering 22 (2012).
2012 | Book | LibreCat-ID: 39512
Mikrosystemtechnik auf Silizium
U. Hilleringmann, Mikrosystemtechnik Auf Silizium, Vieweg+Teubner Verlag, Wiesbaden, 2012.
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U. Hilleringmann, Mikrosystemtechnik Auf Silizium, Vieweg+Teubner Verlag, Wiesbaden, 2012.
2011 | Journal Article | LibreCat-ID: 39533
Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors
F.F. Vidor, G.I. Wirth, K. Wolff, U. Hilleringmann, ECS Transactions 39 (2011) 109–115.
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F.F. Vidor, G.I. Wirth, K. Wolff, U. Hilleringmann, ECS Transactions 39 (2011) 109–115.
2011 | Journal Article | LibreCat-ID: 39527
Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric
K. Wolff, U. Hilleringmann, Solid-State Electronics 62 (2011) 110–114.
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K. Wolff, U. Hilleringmann, Solid-State Electronics 62 (2011) 110–114.
2011 | Conference Paper | LibreCat-ID: 39536
Characterization of SiON integrated waveguides via FTIR and AFM measurements
T. Frers, T. Hett, U. Hilleringmann, G. Berth, A. Widhalm, A. Zrenner, in: 2011 Semiconductor Conference Dresden, IEEE, 2011.
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T. Frers, T. Hett, U. Hilleringmann, G. Berth, A. Widhalm, A. Zrenner, in: 2011 Semiconductor Conference Dresden, IEEE, 2011.
2011 | Conference Paper | LibreCat-ID: 39528
Modeling and simulation of arbitrary ordered nonlinear charge-pump phase-locked loops
C. Wiegand, C. Hangmann, C. Hedayat, U. Hilleringmann, in: 2011 Semiconductor Conference Dresden, IEEE, 2011.
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C. Wiegand, C. Hangmann, C. Hedayat, U. Hilleringmann, in: 2011 Semiconductor Conference Dresden, IEEE, 2011.
2011 | Conference Paper | LibreCat-ID: 39530
Semiconductor nanoparticles for electronic device integration on foils
U. Hilleringmann, K. Wolff, F. Assion, F.F. Vidor, G.I. Wirth, in: IEEE Africon ’11, IEEE, 2011.
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U. Hilleringmann, K. Wolff, F. Assion, F.F. Vidor, G.I. Wirth, in: IEEE Africon ’11, IEEE, 2011.
2011 | Conference Paper | LibreCat-ID: 39537
Plane wave spectrum expansion from near-field measurements on no-planar lattices
C. Reinhold, C. Hangmann, T. Mager, C. Hedayat, U. Hilleringmann, in: Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011, 2011, pp. 1–4.
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C. Reinhold, C. Hangmann, T. Mager, C. Hedayat, U. Hilleringmann, in: Proc. 5th Int. Conf. on Electromagnetic Near-Field Characterization and Imaging (ICONIC) 2011, 2011, pp. 1–4.
2011 | Conference Paper | LibreCat-ID: 39529
Piezoelectric sensor array with evaluation electronic for counting grains in seed drills
S. Meyer zu Hoberge, U. Hilleringmann, C. Jochheim, M. Liebich, in: IEEE Africon ’11, IEEE, 2011.
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S. Meyer zu Hoberge, U. Hilleringmann, C. Jochheim, M. Liebich, in: IEEE Africon ’11, IEEE, 2011.
2010 | Journal Article | LibreCat-ID: 39871
Telemetric surface acoustic wave sensor for humidity
M. Dierkes, U. Hilleringmann, Advances in Radio Science 1 (2010) 131–133.
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M. Dierkes, U. Hilleringmann, Advances in Radio Science 1 (2010) 131–133.
2010 | Journal Article | LibreCat-ID: 39539
Non-linear behaviour of charge-pump phase-locked loops
C. Wiegand, C. Hedayat, U. Hilleringmann, Advances in Radio Science 8 (2010) 161–166.
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C. Wiegand, C. Hedayat, U. Hilleringmann, Advances in Radio Science 8 (2010) 161–166.
2010 | Journal Article | LibreCat-ID: 39869
Organic Field-Effect-Transistors with Pentacene for radio-controlled-price-tag applications
C. Pannemannn, T. Diekmann, U. Hilleringmann, Advances in Radio Science 1 (2010) 219–221.
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C. Pannemannn, T. Diekmann, U. Hilleringmann, Advances in Radio Science 1 (2010) 219–221.
2010 | Conference Paper | LibreCat-ID: 39540
Analysis and modeling of pseudo-short-channel effects in ZnO-nanoparticle thin-film transistors
K. Wolff, U. Hilleringmann, in: 2010 Proceedings of the European Solid State Device Research Conference, IEEE, 2010.
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K. Wolff, U. Hilleringmann, in: 2010 Proceedings of the European Solid State Device Research Conference, IEEE, 2010.
2010 | Conference Paper | LibreCat-ID: 39545
Low-Temperature Integration of Nanoparticulate Zinc Oxide FETs on Glass Substrate
F. Assion, K. Wolff, U. Hilleringmann, in: Proceedings of the European Solid State Device Research Conference (ESSDERC), Seville, Spain, 2010, p. 17.
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F. Assion, K. Wolff, U. Hilleringmann, in: Proceedings of the European Solid State Device Research Conference (ESSDERC), Seville, Spain, 2010, p. 17.
2010 | Journal Article | LibreCat-ID: 39544
A Resonance PLL-based Tracking System for Capacitive Sensors-MEMS/NEMS
C. Wiegand, C. Hangmann, C. Hedayat, U. Hilleringmann, Smart System Integration SSI 2010 (2010).
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C. Wiegand, C. Hangmann, C. Hedayat, U. Hilleringmann, Smart System Integration SSI 2010 (2010).
2010 | Journal Article | LibreCat-ID: 39558
Macro-modelling via radial basis functionen nets
C. Wiegand, C. Fischer, R. Kazemzadeh, C. Hedayat, W. John, U. Hilleringmann, Advances in Radio Science 6 (2010) 139–143.
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C. Wiegand, C. Fischer, R. Kazemzadeh, C. Hedayat, W. John, U. Hilleringmann, Advances in Radio Science 6 (2010) 139–143.
2009 | Journal Article | LibreCat-ID: 39547
Autonomous Sensor Nodes for Aircraft Structural Health Monitoring
T. Becker, M. Kluge, J. Schalk, K. Tiplady, C. Paget, U. Hilleringmann, T. Otterpohl, IEEE Sensors Journal 9 (2009) 1589–1595.
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T. Becker, M. Kluge, J. Schalk, K. Tiplady, C. Paget, U. Hilleringmann, T. Otterpohl, IEEE Sensors Journal 9 (2009) 1589–1595.
2009 | Journal Article | LibreCat-ID: 39559
Efficient Antenna Design of Inductive Coupled RFID-Systems with High Power Demand
C. Reinhold, P. Scholz, W. John, U. Hilleringmann, Journal of Communications 2 (2009).
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C. Reinhold, P. Scholz, W. John, U. Hilleringmann, Journal of Communications 2 (2009).
2009 | Conference Paper | LibreCat-ID: 39548
N-type single nanoparticle ZnO transistors processed at low temperature
K. Wolff, U. Hilleringmann, in: 2009 Proceedings of the European Solid State Device Research Conference, IEEE, 2009.
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K. Wolff, U. Hilleringmann, in: 2009 Proceedings of the European Solid State Device Research Conference, IEEE, 2009.
2009 | Journal Article | LibreCat-ID: 39552
Lock Detection for Charge-Pump Phase-Locked Loops
C. Wiegand, C. Hedayat, U. Hilleringmann, Sophia Antipolis Microelectronics SAME (2009).
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C. Wiegand, C. Hedayat, U. Hilleringmann, Sophia Antipolis Microelectronics SAME (2009).
2008 | Journal Article | LibreCat-ID: 39556
Dielectric layers for organic field effect transistors as gate dielectric and surface passivation
T. Diekmann, C. Pannemann, U. Hilleringmann, Physica Status Solidi (a) 205 (2008) 564–577.
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T. Diekmann, C. Pannemann, U. Hilleringmann, Physica Status Solidi (a) 205 (2008) 564–577.
2008 | Conference Paper | LibreCat-ID: 39568
Noise propagation for induced fast transient impulses on PCB-level
M. Taki, W. John, C. Hedayat, U. Hilleringmann, in: 2007 18th International Zurich Symposium on Electromagnetic Compatibility, IEEE, 2008.
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M. Taki, W. John, C. Hedayat, U. Hilleringmann, in: 2007 18th International Zurich Symposium on Electromagnetic Compatibility, IEEE, 2008.
2008 | Conference Paper | LibreCat-ID: 39555
Power management for thermal energy harvesting in aircrafts
Th. Becker, M. Kluge, J. Schalk, T. Otterpohl, U. Hilleringmann, in: 2008 IEEE Sensors, IEEE, 2008.
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Th. Becker, M. Kluge, J. Schalk, T. Otterpohl, U. Hilleringmann, in: 2008 IEEE Sensors, IEEE, 2008.
2008 | Conference Paper | LibreCat-ID: 39562
Analysis of Energy Transmission for Inductive Coupled RFID Tags
P. Scholz, C. Reinhold, W. John, U. Hilleringmann, in: 2007 IEEE International Conference on RFID, IEEE, 2008.
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P. Scholz, C. Reinhold, W. John, U. Hilleringmann, in: 2007 IEEE International Conference on RFID, IEEE, 2008.
2007 | Conference Paper | LibreCat-ID: 39570
Antenna design of HF-RFID tags with high power requirement
P. Scholz, C. Reinhold, W. John, U. Hilleringmann, in: 2007.
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P. Scholz, C. Reinhold, W. John, U. Hilleringmann, in: 2007.
2007 | Journal Article | LibreCat-ID: 39561
Tuning the threshold voltage of organic field-effect transistors by an electret encapsulating layer
M. Scharnberg, V. Zaporojtchenko, R. Adelung, F. Faupel, C. Pannemann, T. Diekmann, U. Hilleringmann, Applied Physics Letters 90 (2007).
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M. Scharnberg, V. Zaporojtchenko, R. Adelung, F. Faupel, C. Pannemann, T. Diekmann, U. Hilleringmann, Applied Physics Letters 90 (2007).
2007 | Journal Article | LibreCat-ID: 39563
Electro-thermo-mechanical analytical modeling of multilayer cantilever microactuator
J. Jiang, U. Hilleringmann, X. Shui, Sensors and Actuators A: Physical 137 (2007) 302–307.
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J. Jiang, U. Hilleringmann, X. Shui, Sensors and Actuators A: Physical 137 (2007) 302–307.
2007 | Conference Paper | LibreCat-ID: 39567
Nonlinear Identification of Complex Systems Using Radial Basis Function Networks and Model Order Reduction
C. Wiegand, C. Hedayat, W. John, Lj. Radic-Weissenfeld, U. Hilleringmann, in: 2007 IEEE International Symposium on Electromagnetic Compatibility, IEEE, 2007.
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C. Wiegand, C. Hedayat, W. John, Lj. Radic-Weissenfeld, U. Hilleringmann, in: 2007 IEEE International Symposium on Electromagnetic Compatibility, IEEE, 2007.
2007 | Conference Paper | LibreCat-ID: 39573
6I-3 Low-Cost Transceiver Unit for SAW-Sensors Using Customized Hardware Components
P. Scholz, M. Dierkes, U. Hilleringmann, in: 2006 IEEE Ultrasonics Symposium, IEEE, 2007.
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P. Scholz, M. Dierkes, U. Hilleringmann, in: 2006 IEEE Ultrasonics Symposium, IEEE, 2007.
2006 | Conference Paper | LibreCat-ID: 39842
Encapsulating the active Layer of organic Thin-Film Transistors
C. Pannemann, T. Diekmann, U. Hilleringmann, U. Schurmann, M. Scharnberg, V. Zaporojtchenko, R. Adelung, F. Faupel, in: Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics, IEEE, 2006.
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C. Pannemann, T. Diekmann, U. Hilleringmann, U. Schurmann, M. Scharnberg, V. Zaporojtchenko, R. Adelung, F. Faupel, in: Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics, IEEE, 2006.
2005 | Journal Article | LibreCat-ID: 39846
Degradation of organic field-effect transistors made of pentacene
Ch. Pannemann, T. Diekmann, U. Hilleringmann, Journal of Materials Research 19 (2005) 1999–2002.
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Ch. Pannemann, T. Diekmann, U. Hilleringmann, Journal of Materials Research 19 (2005) 1999–2002.
2005 | Conference Paper | LibreCat-ID: 39848
On the degradation of organic field-effect transistors
Ch. Pannemann, T. Diekmann, U. Hilleringmann, in: Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004., IEEE, 2005.
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Ch. Pannemann, T. Diekmann, U. Hilleringmann, in: Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004., IEEE, 2005.
2005 | Journal Article | LibreCat-ID: 39349
Degradation of organic field-effect transistors made of pentacene
Ch. Pannemann, T. Diekmann, U. Hilleringmann, Journal of Materials Research 19 (2005) 1999–2002.
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Ch. Pannemann, T. Diekmann, U. Hilleringmann, Journal of Materials Research 19 (2005) 1999–2002.
2005 | Journal Article | LibreCat-ID: 39574
Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics
M. Scharnberg, J. Hu, J. Kanzow, K. Rätzke, R. Adelung, F. Faupel, C. Pannemann, U. Hilleringmann, S. Meyer, J. Pflaum, Applied Physics Letters 86 (2005).
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M. Scharnberg, J. Hu, J. Kanzow, K. Rätzke, R. Adelung, F. Faupel, C. Pannemann, U. Hilleringmann, S. Meyer, J. Pflaum, Applied Physics Letters 86 (2005).
2005 | Conference Paper | LibreCat-ID: 39835
Comparison between the charge carrier mobilities in pentacene OFET structures as obtained from electrical characterization and potentiometry
R. Scholz, A.-D. Müller, F. Müller, I. Thurzo, B.A. Paez, L. Mancera, D.R.T. Zahn, C. Pannemann, U. Hilleringmann, in: Z. Bao, D.J. Gundlach (Eds.), SPIE Proceedings, SPIE, 2005.
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R. Scholz, A.-D. Müller, F. Müller, I. Thurzo, B.A. Paez, L. Mancera, D.R.T. Zahn, C. Pannemann, U. Hilleringmann, in: Z. Bao, D.J. Gundlach (Eds.), SPIE Proceedings, SPIE, 2005.
2005 | Conference Paper | LibreCat-ID: 39834
Comparison between the charge carrier mobilities in pentacene OFET structures as obtained from electrical characterization and potentiometry
R. Scholz, A.-D. Müller, F. Müller, I. Thurzo, B.A. Paez, L. Mancera, D.R.T. Zahn, C. Pannemann, U. Hilleringmann, in: Z. Bao, D.J. Gundlach (Eds.), SPIE Proceedings, SPIE, 2005.
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R. Scholz, A.-D. Müller, F. Müller, I. Thurzo, B.A. Paez, L. Mancera, D.R.T. Zahn, C. Pannemann, U. Hilleringmann, in: Z. Bao, D.J. Gundlach (Eds.), SPIE Proceedings, SPIE, 2005.
2004 | Book Chapter | LibreCat-ID: 39850
Ätztechnik
U. Hilleringmann, in: Silizium-Halbleitertechnologie, Vieweg+Teubner Verlag, Wiesbaden, 2004, pp. 65–90.
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U. Hilleringmann, in: Silizium-Halbleitertechnologie, Vieweg+Teubner Verlag, Wiesbaden, 2004, pp. 65–90.
2004 | Conference Paper | LibreCat-ID: 39872
Imprint structured organic thin film transistors as driving circuit in single-use sensor applications
U. Hilleringmann, C. Pannemann, in: G. Zhang, H. Zhao, Z. Wang (Eds.), Fifth International Symposium on Instrumentation and Control Technology, SPIE, 2004.
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U. Hilleringmann, C. Pannemann, in: G. Zhang, H. Zhao, Z. Wang (Eds.), Fifth International Symposium on Instrumentation and Control Technology, SPIE, 2004.
2004 | Conference Paper | LibreCat-ID: 39873
Piezoresistive pressure sensors in CVD diamond for high-temperature applications
R. Otterbach, U. Hilleringmann, in: G. Zhang, H. Zhao, Z. Wang (Eds.), Fifth International Symposium on Instrumentation and Control Technology, SPIE, 2004.
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R. Otterbach, U. Hilleringmann, in: G. Zhang, H. Zhao, Z. Wang (Eds.), Fifth International Symposium on Instrumentation and Control Technology, SPIE, 2004.
2003 | Conference Paper | LibreCat-ID: 39887
Masking and etching of silicon and related materials for geometries down to 25 nm
U. Hilleringmann, T. Vieregge, J.T. Horstmann, in: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029), IEEE, 2003.
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U. Hilleringmann, T. Vieregge, J.T. Horstmann, in: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029), IEEE, 2003.
2003 | Conference Paper | LibreCat-ID: 39888
Matching analysis of NMOS-transistors with a channel length down to 30 nm
J.T. Horstmann, U. Hilleringmann, K. Goser, in: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029), IEEE, 2003.
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J.T. Horstmann, U. Hilleringmann, K. Goser, in: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029), IEEE, 2003.
2003 | Conference Paper | LibreCat-ID: 39885
Negative differential resistance in ultrashort bulk MOSFETs
G. Wirth, U. Hilleringmann, J.T. Horstmann, K. Goser, in: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029), IEEE, 2003.
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G. Wirth, U. Hilleringmann, J.T. Horstmann, K. Goser, in: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029), IEEE, 2003.
2003 | Journal Article | LibreCat-ID: 39851
Nanometer scale organic thin film transistors with Pentacene
Ch. Pannemann, T. Diekmann, U. Hilleringmann, Microelectronic Engineering 67–68 (2003) 845–852.
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Ch. Pannemann, T. Diekmann, U. Hilleringmann, Microelectronic Engineering 67–68 (2003) 845–852.
2002 | Journal Article | LibreCat-ID: 39904
Optoelectronic system integration on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip
U. Hilleringmann, K. Goser, IEEE Transactions on Electron Devices 42 (2002) 841–846.
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U. Hilleringmann, K. Goser, IEEE Transactions on Electron Devices 42 (2002) 841–846.
2002 | Journal Article | LibreCat-ID: 39912
Characterization of submicron NMOS devices due to visible light emission
I. Schönstein, J. Müller, U. Hilleringmann, K. Goser, Microelectronic Engineering 21 (2002) 363–366.
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I. Schönstein, J. Müller, U. Hilleringmann, K. Goser, Microelectronic Engineering 21 (2002) 363–366.
2002 | Journal Article | LibreCat-ID: 39914
Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon
U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 211–214.
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U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 211–214.
2002 | Journal Article | LibreCat-ID: 39906
System integration of optical devices and analog CMOS amplifiers
E. Brass, U. Hilleringmann, K. Schumacher, IEEE Journal of Solid-State Circuits 29 (2002) 1006–1010.
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E. Brass, U. Hilleringmann, K. Schumacher, IEEE Journal of Solid-State Circuits 29 (2002) 1006–1010.
2002 | Journal Article | LibreCat-ID: 39907
System integration of optical devices and analog CMOS amplifiers
E. Brass, U. Hilleringmann, K. Schumacher, IEEE Journal of Solid-State Circuits 29 (2002) 1006–1010.
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E. Brass, U. Hilleringmann, K. Schumacher, IEEE Journal of Solid-State Circuits 29 (2002) 1006–1010.
2002 | Journal Article | LibreCat-ID: 39899
Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique
J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 30 (2002) 431–434.
LibreCat
| DOI
J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 30 (2002) 431–434.
2002 | Journal Article | LibreCat-ID: 39925
VLSI technologies for artificial neural networks
K. Goser, U. Hilleringmann, U. Rueckert, K. Schumacher, IEEE Micro 9 (2002) 28–44.
LibreCat
| DOI
K. Goser, U. Hilleringmann, U. Rueckert, K. Schumacher, IEEE Micro 9 (2002) 28–44.
2002 | Journal Article | LibreCat-ID: 39882
A novel insulation technique for smart power switching devices and very high voltage ICs above 10 kV
V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering 53 (2002) 525–528.
LibreCat
| DOI
V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering 53 (2002) 525–528.
2002 | Journal Article | LibreCat-ID: 39879
1/f-Noise of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique
J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 53 (2002) 213–216.
LibreCat
| DOI
J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 53 (2002) 213–216.
2002 | Conference Paper | LibreCat-ID: 39880
Noise analysis of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique
J.T. Horstmann, U. Hilleringmann, K. Goser, in: 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.00CH37141), IEEE, 2002.
LibreCat
| DOI
J.T. Horstmann, U. Hilleringmann, K. Goser, in: 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.00CH37141), IEEE, 2002.
2002 | Conference Paper | LibreCat-ID: 39881
Noise analysis of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique
J.T. Horstmann, U. Hilleringmann, K. Goser, in: 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.00CH37141), IEEE, 2002.
LibreCat
| DOI
J.T. Horstmann, U. Hilleringmann, K. Goser, in: 2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.00CH37141), IEEE, 2002.
2002 | Journal Article | LibreCat-ID: 39919
A silicon based technology for monolithic integration of waveguides and VLSI CMOS circuits
U. Hilleringmann, K. Knospe, C. Heite, K. Schumacher, K. Goser, Microelectronic Engineering 15 (2002) 289–292.
LibreCat
| DOI
U. Hilleringmann, K. Knospe, C. Heite, K. Schumacher, K. Goser, Microelectronic Engineering 15 (2002) 289–292.
2002 | Journal Article | LibreCat-ID: 39926
VLSI technologies for artificial neural networks
K. Goser, U. Hilleringmann, U. Rueckert, K. Schumacher, IEEE Micro 9 (2002) 28–44.
LibreCat
| DOI
K. Goser, U. Hilleringmann, U. Rueckert, K. Schumacher, IEEE Micro 9 (2002) 28–44.
2002 | Conference Paper | LibreCat-ID: 39892
Nuclear radiation detectors on various type diamonds
F. Blum, A. Denisenko, R. Job, D. Borchert, W. Weber, J.V. Borany, U. Hilleringmann, W.R. Fahrner, in: IECON ’98. Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.98CH36200), IEEE, 2002.
LibreCat
| DOI
F. Blum, A. Denisenko, R. Job, D. Borchert, W. Weber, J.V. Borany, U. Hilleringmann, W.R. Fahrner, in: IECON ’98. Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.98CH36200), IEEE, 2002.
2002 | Journal Article | LibreCat-ID: 39920
Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica
A. Soennecken, U. Hilleringmann, K. Goser, Microelectronic Engineering 15 (2002) 633–636.
LibreCat
| DOI
A. Soennecken, U. Hilleringmann, K. Goser, Microelectronic Engineering 15 (2002) 633–636.
2002 | Journal Article | LibreCat-ID: 39915
Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon
U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 211–214.
LibreCat
| DOI
U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 211–214.
2002 | Journal Article | LibreCat-ID: 39916
CMOS compatible micromachining by dry silicon-etching techniques
S. Adams, U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 191–194.
LibreCat
| DOI
S. Adams, U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 191–194.
2002 | Journal Article | LibreCat-ID: 39348
Matching analysis of deposition defined 50-nm MOSFET's
J.T. Horstmann, U. Hilleringmann, K.F. Goser, IEEE Transactions on Electron Devices 45 (2002) 299–306.
LibreCat
| DOI
J.T. Horstmann, U. Hilleringmann, K.F. Goser, IEEE Transactions on Electron Devices 45 (2002) 299–306.
2002 | Conference Paper | LibreCat-ID: 39923
Applications and implementations of neural networks in microelectronics-overview and status
K. Goser, U. Hilleringmann, U. Rueckert, in: [1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications, IEEE Comput. Soc. Press, 2002.
LibreCat
| DOI
K. Goser, U. Hilleringmann, U. Rueckert, in: [1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications, IEEE Comput. Soc. Press, 2002.
2002 | Journal Article | LibreCat-ID: 39889
12 kV low current cascaded light triggered switch on one silicon chip
V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering 46 (2002) 413–417.
LibreCat
| DOI
V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering 46 (2002) 413–417.
2002 | Journal Article | LibreCat-ID: 39891
Matching analysis of deposition defined 50-nm MOSFET's
J.T. Horstmann, U. Hilleringmann, K.F. Goser, IEEE Transactions on Electron Devices 45 (2002) 299–306.
LibreCat
| DOI
J.T. Horstmann, U. Hilleringmann, K.F. Goser, IEEE Transactions on Electron Devices 45 (2002) 299–306.
2002 | Journal Article | LibreCat-ID: 39886
Mesoscopic transport phenomena in ultrashort channel MOSFETs
G. Wirth, U. Hilleringmann, J.T. Horstmann, K. Goser, Solid-State Electronics 43 (2002) 1245–1250.
LibreCat
| DOI
G. Wirth, U. Hilleringmann, J.T. Horstmann, K. Goser, Solid-State Electronics 43 (2002) 1245–1250.
2002 | Journal Article | LibreCat-ID: 39876
Structures with a minimum feature size of less than 100 nm in CVD-diamond for sensor applications
R. Otterbach, U. Hilleringmann, T.J. Horstmann, K. Goser, Diamond and Related Materials 10 (2002) 511–514.
LibreCat
| DOI
R. Otterbach, U. Hilleringmann, T.J. Horstmann, K. Goser, Diamond and Related Materials 10 (2002) 511–514.
2002 | Journal Article | LibreCat-ID: 39877
A structure definition technique for 25 nm lines of silicon and related materials
U. Hilleringmann, T. Vieregge, J.T. Horstmann, Microelectronic Engineering 53 (2002) 569–572.
LibreCat
| DOI
U. Hilleringmann, T. Vieregge, J.T. Horstmann, Microelectronic Engineering 53 (2002) 569–572.
2002 | Journal Article | LibreCat-ID: 39874
Reactive ion etching of CVD-diamond for piezoresistive pressure sensors
R. Otterbach, U. Hilleringmann, Diamond and Related Materials 11 (2002) 841–844.
LibreCat
| DOI
R. Otterbach, U. Hilleringmann, Diamond and Related Materials 11 (2002) 841–844.
2002 | Book Chapter | LibreCat-ID: 39875
Metallisierung und Kontakte
U. Hilleringmann, in: Silizium-Halbleitertechnologie, Vieweg+Teubner Verlag, Wiesbaden, 2002, pp. 131–151.
LibreCat
| DOI
U. Hilleringmann, in: Silizium-Halbleitertechnologie, Vieweg+Teubner Verlag, Wiesbaden, 2002, pp. 131–151.
2000 | Conference Paper | LibreCat-ID: 39884
Nanometer Scale Lateral Structures of MOS Type Layers
U. Hilleringmann, T. Vieregge, J. Horstmann, in: Proceedings Micro. Tec, 2000, pp. 49–53.
LibreCat
U. Hilleringmann, T. Vieregge, J. Horstmann, in: Proceedings Micro. Tec, 2000, pp. 49–53.
1999 | Conference Paper | LibreCat-ID: 39890
High rate CVD-diamond etching for high temperature pressure sensor applications
R. Otterbach, U. Hilleringmann, in: 29th European Solid-State Device Research Conference, 1999, pp. 320–323.
LibreCat
R. Otterbach, U. Hilleringmann, in: 29th European Solid-State Device Research Conference, 1999, pp. 320–323.
1998 | Conference Paper | LibreCat-ID: 39893
Correlation Analysis of the Statistical Electrical Parameter Fluctuations in 50 nm MOS-Transistors
J.T. Horstmann, U. Hilleringmann, K. Goser, in: 28th European Solid-State Device Research Conference, 1998, pp. 512–515.
LibreCat
J.T. Horstmann, U. Hilleringmann, K. Goser, in: 28th European Solid-State Device Research Conference, 1998, pp. 512–515.
1997 | Journal Article | LibreCat-ID: 39896
CMOS-compatible organic light-emitting diodes
L.M.H. Heinrich, J. Muller, U. Hilleringmann, K.F. Goser, A. Holmes, D.-H. Hwang, R. Stern, IEEE Transactions on Electron Devices 44 (1997) 1249–1252.
LibreCat
| DOI
L.M.H. Heinrich, J. Muller, U. Hilleringmann, K.F. Goser, A. Holmes, D.-H. Hwang, R. Stern, IEEE Transactions on Electron Devices 44 (1997) 1249–1252.
1996 | Conference Paper | LibreCat-ID: 39902
Analyses of Sub 1/4-Micron MOS-Transistors by Visible Light Emission
J. Muller, G. Wirth, U. Hilleringmann, K. Goser, in: ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 1996, pp. 947–950.
LibreCat
J. Muller, G. Wirth, U. Hilleringmann, K. Goser, in: ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 1996, pp. 947–950.
1996 | Conference Paper | LibreCat-ID: 39900
Characterization and Matching Analysis of 50 nm-NMOS-Transistors
J.T. Horstmann, U. Hilleringmann, K. Goser, in: ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 1996, pp. 253–256.
LibreCat
J.T. Horstmann, U. Hilleringmann, K. Goser, in: ESSDERC ’96: Proceedings of the 26th European Solid State Device Research Conference, 1996, pp. 253–256.
1996 | Conference Paper | LibreCat-ID: 39903
ESSDERC’96, Bologna, Italy
J. Horstmann, U. Hilleringmann, K. Goser, in: Conf. Dig, 1996.
LibreCat
J. Horstmann, U. Hilleringmann, K. Goser, in: Conf. Dig, 1996.
1995 | Conference Paper | LibreCat-ID: 39905
Conjugated Polymers for CMOS Compatible Applications
J. Muller, V. Mankowski, U. Hilleringmann, K. Goser, A. Holmes, O. Gelsen, R. Stern, in: ESSDERC ’95: Proceedings of the 25th European Solid State Device Research Conference, 1995, pp. 659–662.
LibreCat
J. Muller, V. Mankowski, U. Hilleringmann, K. Goser, A. Holmes, O. Gelsen, R. Stern, in: ESSDERC ’95: Proceedings of the 25th European Solid State Device Research Conference, 1995, pp. 659–662.
1994 | Conference Paper | LibreCat-ID: 39908
Micromechanic Pressure Sensors with Optical Readout and CMOS-Amplifiers on Silicon
U. Hilleringmann, S. Adams, K. Goser, in: ESSDERC ’94: 24th European Solid State Device Research Conference, 1994, pp. 387–390.
LibreCat
U. Hilleringmann, S. Adams, K. Goser, in: ESSDERC ’94: 24th European Solid State Device Research Conference, 1994, pp. 387–390.
1993 | Conference Paper | LibreCat-ID: 39909
Monolithic System Integration of Optical Devices, Photodetectors and Analog Transimpedance CMOS Amplifiers
E. Brab, U. Hilleringmann, K. Schumacher, in: ESSCIRC ’93: Nineteenth European Solid-State Circuits Conference, 1993, pp. 242–245.
LibreCat
E. Brab, U. Hilleringmann, K. Schumacher, in: ESSCIRC ’93: Nineteenth European Solid-State Circuits Conference, 1993, pp. 242–245.
1993 | Conference Paper | LibreCat-ID: 39910
Hot Carrier Monitoring in NMOS Transistors by Visible Light Emission
I. Schonstein, J. Muller, U. Hilleringmann, K. Goser, in: ESSDERC ’93: 23rd European Solid State Device Research Conference, 1993, pp. 421–424.
LibreCat
I. Schonstein, J. Muller, U. Hilleringmann, K. Goser, in: ESSDERC ’93: 23rd European Solid State Device Research Conference, 1993, pp. 421–424.
1993 | Conference Paper | LibreCat-ID: 39913
Micromechanic pressure sensors with optical readout and CMOS-preamplifiers on one silicon chip: Processing and first results
U. Hilleringmann, S. Adam, K. Goser, in: ESSDtRC’93, 1993.
LibreCat
U. Hilleringmann, S. Adam, K. Goser, in: ESSDtRC’93, 1993.
1992 | Conference Paper | LibreCat-ID: 39917
A Silicon Technology for Monolithic Integration of Optical Waveguides, Photodetectors and VLSI CMOS Circuits
U. Hilleringmann, S. Adams, K. Goser, in: Proceedings ISSSE’92, 1992, pp. 304–307.
LibreCat
U. Hilleringmann, S. Adams, K. Goser, in: Proceedings ISSSE’92, 1992, pp. 304–307.
1992 | Conference Paper | LibreCat-ID: 39918
Electrooptical coupling of waveguides and VLSI circuits integrated on one silicon chip
S. Adams, U. Hilleringmann, K. Goser, in: EFOC LAN, 1992, pp. 92–92.
LibreCat
S. Adams, U. Hilleringmann, K. Goser, in: EFOC LAN, 1992, pp. 92–92.
1991 | Conference Paper | LibreCat-ID: 39922
Application and implementation of neural networks in microelectronics
K. Goser, U. Hilleringmann, U. Rückert, in: A. Prieto (Ed.), Artificial Neural Networks, Springer Berlin Heidelberg, Berlin, Heidelberg, 1991, pp. 243–259.
LibreCat
K. Goser, U. Hilleringmann, U. Rückert, in: A. Prieto (Ed.), Artificial Neural Networks, Springer Berlin Heidelberg, Berlin, Heidelberg, 1991, pp. 243–259.