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165 Publications
2024 | Conference Paper | LibreCat-ID: 52744
@inproceedings{Jafarzadeh_Klemme_Amrouch_Hellebrand_Wunderlich, title={Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations}, booktitle={European Test Symposium, The Hague, Netherlands, May 20-24, 2024}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, pages={6} }
LibreCat
2024 | Conference Paper | LibreCat-ID: 52742
@inproceedings{Jafarzadeh_Klemme_Amrouch_Hellebrand_Wunderlich, title={Vmin Testing under Variations: Defect vs. Fault Coverage}, booktitle={IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, pages={6} }
LibreCat
2024 | Conference Paper | LibreCat-ID: 52743
@inproceedings{Hellebrand_Sadeghi-Kohan_Wunderlich, title={Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle}, booktitle={International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024}, author={Hellebrand, Sybille and Sadeghi-Kohan, Somayeh and Wunderlich, Hans-Joachim}, pages={1} }
LibreCat
2024 | Conference Paper | LibreCat-ID: 52745
@inproceedings{Wunderlich_Jafarzadeh_Hellebrand, title={Robust Test of Small Delay Faults under PVT-Variations}, booktitle={International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024}, author={Wunderlich, Hans-Joachim and Jafarzadeh, Hanieh and Hellebrand, Sybille}, pages={1} }
LibreCat
2024 | Misc | LibreCat-ID: 50284
@book{Stiballe_Reimer_Sadeghi-Kohan_Hellebrand_2024, place={Darmstadt, Germany}, title={Modeling Crosstalk-induced Interconnect Delay with Polynomial Regression}, publisher={37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’24), Feb. 2024}, author={Stiballe, Alisa and Reimer, Jan Dennis and Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2024} }
LibreCat
2023 | Misc | LibreCat-ID: 35204
@book{Ghazal_Sadeghi-Kohan_Reimer_Hellebrand_2023, place={Erfurt, Germany}, title={On Cryptography Effects on Interconnect Reliability}, publisher={35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023}, author={Ghazal, Abdulkarim and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2023} }
LibreCat
2023 | Dissertation | LibreCat-ID: 46482 | 
@book{Sprenger_2023, place={Paderborn}, title={Testinstrumente und Testdatenanalyse zur Verarbeitung von Unsicherheiten in Logikblöcken hochintegrierter Schaltungen}, DOI={10.17619/UNIPB/1-1787}, publisher={Universität Paderborn}, author={Sprenger, Alexander}, year={2023} }
LibreCat
| DOI
| Download (ext.)
2023 | Conference Paper | LibreCat-ID: 46739
@inproceedings{Sadeghi-Kohan_Hellebrand_Wunderlich_2023, title={Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication}, DOI={10.1109/dsn-w58399.2023.00056}, booktitle={2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023} }
LibreCat
| DOI
2023 | Conference Paper | LibreCat-ID: 46738
@inproceedings{Sadeghi-Kohan_Reimer_Hellebrand_Wunderlich_2023, place={Beijing, China}, title={Optimizing the Streaming of Sensor Data with Approximate Communication}, booktitle={IEEE Asian Test Symposium (ATS’23), October 2023}, author={Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023} }
LibreCat
2023 | Journal Article | LibreCat-ID: 46264
@article{Sadeghi-Kohan_Hellebrand_Wunderlich_2023, title={Workload-Aware Periodic Interconnect BIST}, DOI={10.1109/mdat.2023.3298849}, journal={IEEE Design &Test}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023}, pages={1–1} }
LibreCat
| DOI
| Download (ext.)
2023 | Conference Paper | LibreCat-ID: 45830
@inproceedings{Jafarzadeh_Klemme_Reimer_Najafi Haghi_ Amrouch_Hellebrand_ Wunderlich_2023, place={Anaheim, CA, USA}, title={Robust Pattern Generation for Small Delay Faults under Process Variations}, booktitle={IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and Najafi Haghi, Zahra Paria and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023} }
LibreCat
2022 | Journal Article | LibreCat-ID: 29351
@article{Sadeghi-Kohan_Hellebrand_Wunderlich_2022, title={Stress-Aware Periodic Test of Interconnects}, DOI={10.1007/s10836-021-05979-5}, journal={Journal of Electronic Testing}, publisher={Springer Science and Business Media LLC}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2022} }
LibreCat
| DOI
2022 | Misc | LibreCat-ID: 29890
@book{Sadeghi-Kohan_Hellebrand_Wunderlich_2022, place={Online}, title={EM-Aware Interconnect BIST}, publisher={European Workshop on Silicon Lifecycle Management, March 18, 2022}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2022} }
LibreCat
2020 | Conference Paper | LibreCat-ID: 19422
@inproceedings{Sprenger_Sadeghi-Kohan_Reimer_Hellebrand_2020, place={Virtual Conference - Originally Frascati (Rome), Italy}, title={Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study}, booktitle={IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020}, author={Sprenger, Alexander and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2020} }
LibreCat
2020 | Misc | LibreCat-ID: 15419
@book{Sadeghi-Kohan_Hellebrand_2020, place={Ludwigsburg}, title={Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects}, publisher={32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2020} }
LibreCat
2020 | Conference Paper | LibreCat-ID: 29200
@inproceedings{Sadeghi-Kohan_Hellebrand_2020, place={Virtual Conference - Originally San Diego, CA, USA}, title={Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects}, DOI={10.1109/vts48691.2020.9107591}, booktitle={38th IEEE VLSI Test Symposium (VTS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2020} }
LibreCat
| DOI
2020 | Conference Paper | LibreCat-ID: 19421
@inproceedings{Holst_Kampmann_Sprenger_Reimer_Hellebrand_Wunderlich_Weng_2020, place={Virtual Conference - Originally Washington, DC, USA}, title={Logic Fault Diagnosis of Hidden Delay Defects}, booktitle={IEEE International Test Conference (ITC’20), November 2020}, author={Holst, Stefan and Kampmann, Matthias and Sprenger, Alexander and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Weng, Xiaoqing}, year={2020} }
LibreCat
2019 | Misc | LibreCat-ID: 8112
@book{Maaz_Sprenger_Hellebrand_2019, place={Prien am Chiemsee}, title={A Hybrid Space Compactor for Varying X-Rates}, publisher={31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19)}, author={Maaz, Mohammad Urf and Sprenger, Alexander and Hellebrand, Sybille}, year={2019} }
LibreCat
2019 | Journal Article | LibreCat-ID: 8667
@article{Sprenger_Hellebrand_2019, title={Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test}, volume={28}, DOI={10.1142/s0218126619400012}, number={1}, journal={Journal of Circuits, Systems and Computers}, publisher={World Scientific Publishing Company}, author={Sprenger, Alexander and Hellebrand, Sybille}, year={2019}, pages={1–23} }
LibreCat
| DOI
2019 | Journal Article | LibreCat-ID: 13048
@article{Kampmann_A. Kochte_Liu_Schneider_Hellebrand_Wunderlich_2019, title={Built-in Test for Hidden Delay Faults}, volume={38}, number={10}, journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)}, publisher={IEEE}, author={Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Schneider, Eric and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2019}, pages={1956–1968} }
LibreCat
2019 | Conference Paper | LibreCat-ID: 12918
@inproceedings{Maaz_Sprenger_Hellebrand_2019, place={Washington, DC, USA}, title={A Hybrid Space Compactor for Adaptive X-Handling}, booktitle={50th IEEE International Test Conference (ITC)}, publisher={IEEE}, author={Maaz, Mohammad Urf and Sprenger, Alexander and Hellebrand, Sybille}, year={2019}, pages={1–8} }
LibreCat
2018 | Misc | LibreCat-ID: 4576
@book{Sprenger_Hellebrand_2018, place={Freiburg, Germany}, title={Stochastische Kompaktierung für den Hochgeschwindigkeitstest}, publisher={30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18)}, author={Sprenger, Alexander and Hellebrand, Sybille}, year={2018} }
LibreCat
2018 | Journal Article | LibreCat-ID: 12974
@article{Hellebrand_Henkel_Raghunathan_Wunderlich_2018, title={Guest Editors’ Introduction - Special Issue on Approximate Computing}, volume={10}, DOI={10.1109/les.2018.2789942}, number={1}, journal={IEEE Embedded Systems Letters}, publisher={IEEE}, author={Hellebrand, Sybille and Henkel, Joerg and Raghunathan, Anand and Wunderlich, Hans-Joachim}, year={2018}, pages={1–1} }
LibreCat
| DOI
2018 | Journal Article | LibreCat-ID: 13057
@article{Kampmann_Hellebrand_2018, title={Design For Small Delay Test - A Simulation Study}, volume={80}, journal={Microelectronics Reliability}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2018}, pages={124–133} }
LibreCat
2018 | Misc | LibreCat-ID: 13072
@book{Kampmann_Hellebrand_2018, place={19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China}, title={Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2018} }
LibreCat
2018 | Conference Paper | LibreCat-ID: 29460
@inproceedings{Rezaeizadeh Rookerd_Sadeghi-Kohan_Navabi_2018, title={Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture}, DOI={10.1145/3194554.3194599}, booktitle={Proceedings of the 2018 on Great Lakes Symposium on VLSI}, publisher={ACM}, author={Rezaeizadeh Rookerd, Ramin and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin}, year={2018} }
LibreCat
| DOI
2018 | Conference Paper | LibreCat-ID: 4575
@inproceedings{Sprenger_Hellebrand_2018, place={Budapest, Hungary}, title={Tuning Stochastic Space Compaction to Faster-than-at-Speed Test}, DOI={10.1109/ddecs.2018.00020}, booktitle={2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)}, publisher={IEEE}, author={Sprenger, Alexander and Hellebrand, Sybille}, year={2018} }
LibreCat
| DOI
2018 | Conference Paper | LibreCat-ID: 10575
@inproceedings{Liu_Schneider_Kampmann_Hellebrand_Wunderlich_2018, title={Extending Aging Monitors for Early Life and Wear-Out Failure Prevention}, DOI={10.1109/ats.2018.00028}, booktitle={27th IEEE Asian Test Symposium (ATS’18)}, author={Liu, Chang and Schneider, Eric and Kampmann, Matthias and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2018} }
LibreCat
| DOI
2018 | Conference Paper | LibreCat-ID: 29459
@inproceedings{Sadeghi-Kohan_Vafaei_Navabi_2018, title={Near-Optimal Node Selection Procedure for Aging Monitor Placement}, DOI={10.1109/iolts.2018.8474120}, booktitle={2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Vafaei, Arash and Navabi, Zainalabedin}, year={2018} }
LibreCat
| DOI
2017 | Conference Paper | LibreCat-ID: 12973
@inproceedings{Deshmukh_Kunz_Wunderlich_Hellebrand_2017, place={Caesars Palace, Las Vegas, Nevada, USA}, title={Special Session on Early Life Failures}, DOI={10.1109/vts.2017.7928933}, booktitle={35th IEEE VLSI Test Symposium (VTS’17)}, publisher={IEEE}, author={Deshmukh, Jyotirmoy and Kunz, Wolfgang and Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={2017} }
LibreCat
| DOI
2017 | Misc | LibreCat-ID: 13078
@book{Kampmann_Hellebrand_2017, place={29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany}, title={X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2017} }
LibreCat
2017 | Conference Paper | LibreCat-ID: 10576
@inproceedings{Kampmann_Hellebrand_2017, title={Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test}, DOI={10.1109/ddecs.2017.7934564}, booktitle={20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17)}, publisher={IEEE}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2017} }
LibreCat
| DOI
2017 | Journal Article | LibreCat-ID: 29462
@article{Sadeghi-Kohan_Kamal_Navabi_2017, title={Self-Adjusting Monitor for Measuring Aging Rate and Advancement}, volume={8}, DOI={10.1109/tetc.2017.2771441}, number={3}, journal={IEEE Transactions on Emerging Topics in Computing}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Sadeghi-Kohan, Somayeh and Kamal, Mehdi and Navabi, Zainalabedin}, year={2017}, pages={627–641} }
LibreCat
| DOI
2017 | Conference Paper | LibreCat-ID: 29463
@inproceedings{Jenihhin_Kamkin_Navabi_Sadeghi-Kohan_2017, title={Universal mitigation of NBTI-induced aging by design randomization}, DOI={10.1109/ewdts.2016.7807635}, booktitle={2016 IEEE East-West Design & Test Symposium (EWDTS)}, publisher={IEEE}, author={Jenihhin, Maksim and Kamkin, Alexander and Navabi, Zainalabedin and Sadeghi-Kohan, Somayeh}, year={2017} }
LibreCat
| DOI
2016 | Conference Paper | LibreCat-ID: 12975
@inproceedings{Kampmann_Hellebrand_2016, place={Hiroshima, Japan}, title={X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test}, DOI={10.1109/ats.2016.20}, booktitle={25th IEEE Asian Test Symposium (ATS’16)}, publisher={IEEE}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2016}, pages={1–6} }
LibreCat
| DOI
2015 | Conference Paper | LibreCat-ID: 12976
@inproceedings{Kampmann_A. Kochte_Schneider_Indlekofer_Hellebrand_Wunderlich_2015, place={Mumbai, India}, title={Optimized Selection of Frequencies for Faster-Than-at-Speed Test}, DOI={10.1109/ats.2015.26}, booktitle={24th IEEE Asian Test Symposium (ATS’15)}, publisher={IEEE}, author={Kampmann, Matthias and A. Kochte, Michael and Schneider, Eric and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2015}, pages={109–114} }
LibreCat
| DOI
2015 | Journal Article | LibreCat-ID: 13056
@article{Huang_Liang_Hellebrand_2015, title={A High Performance SEU Tolerant Latch}, volume={31}, number={4}, journal={Journal of Electronic Testing - Theory and Applications (JETTA)}, publisher={Springer}, author={Huang, Zhengfeng and Liang, Huaguo and Hellebrand, Sybille}, year={2015}, pages={349–359} }
LibreCat
2015 | Misc | LibreCat-ID: 13077
@book{Hellebrand_Indlekofer_Kampmann_Kochte_Liu_Wunderlich_2015, place={27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany}, title={Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler}, author={Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim}, year={2015} }
LibreCat
2015 | Conference Paper | LibreCat-ID: 29465
@inproceedings{Sadeghi-Kohan_Kamran_Forooghifar_Navabi_2015, title={Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation}, DOI={10.1109/dtis.2015.7127373}, booktitle={2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Kamran, Arezoo and Forooghifar, Farnaz and Navabi, Zainalabedin}, year={2015} }
LibreCat
| DOI
2015 | Conference Paper | LibreCat-ID: 29466
@inproceedings{Sadeghi-Kohan_Kamal_McNeil_Prinetto_Navabi_2015, title={Online self adjusting progressive age monitoring of timing variations}, DOI={10.1109/dtis.2015.7127368}, booktitle={2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Kamal, Mehdi and McNeil, John and Prinetto, Paolo and Navabi, Zain}, year={2015} }
LibreCat
| DOI
2014 | Conference Paper | LibreCat-ID: 12977
@inproceedings{Hellebrand_Indlekofer_Kampmann_A. Kochte_Liu_Wunderlich_2014, place={Seattle, Washington, USA}, title={FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects}, DOI={10.1109/test.2014.7035360}, booktitle={IEEE International Test Conference (ITC’14)}, publisher={IEEE}, author={Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim}, year={2014} }
LibreCat
| DOI
2014 | Journal Article | LibreCat-ID: 13054
@article{Hellebrand_Wunderlich_2014, title={SAT-Based ATPG beyond Stuck-at Fault Testing}, volume={56}, number={4}, journal={DeGruyter Journal on Information Technology (it)}, publisher={DeGruyter}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2014}, pages={165–172} }
LibreCat
2014 | Journal Article | LibreCat-ID: 13055
@article{Rodriguez Gomez_Cook_Indlekofer_Hellebrand_Wunderlich_2014, title={Adaptive Bayesian Diagnosis of Intermittent Faults}, volume={30}, number={5}, journal={Journal of Electronic Testing - Theory and Applications (JETTA)}, publisher={Springer}, author={Rodriguez Gomez, Laura and Cook, Alejandro and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2014}, pages={527–540} }
LibreCat
2014 | Journal Article | LibreCat-ID: 46266
@article{Alizadeh_Behnam_Sadeghi-Kohan_2014, title={A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs}, DOI={10.1109/tc.2014.2329687}, journal={IEEE Transactions on Computers}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Alizadeh, Bijan and Behnam, Payman and Sadeghi-Kohan, Somayeh}, year={2014}, pages={1–1} }
LibreCat
| DOI
2014 | Conference Paper | LibreCat-ID: 46268
@inproceedings{Mohammadi_Sadeghi-Kohan_Masoumi_Navabi_2014, title={An off-line MDSI interconnect BIST incorporated in BS 1149.1}, DOI={10.1109/ets.2014.6847847}, booktitle={2014 19th IEEE European Test Symposium (ETS)}, publisher={IEEE}, author={Mohammadi, Marzieh and Sadeghi-Kohan, Somayeh and Masoumi, Nasser and Navabi, Zainalabedin}, year={2014} }
LibreCat
| DOI
2014 | Conference Paper | LibreCat-ID: 46267
@inproceedings{Sadeghi-Kohan_Behnam_Alizadeh_Fujita_Navabi_2014, title={Improving polynomial datapath debugging with HEDs}, DOI={10.1109/ets.2014.6847797}, booktitle={2014 19th IEEE European Test Symposium (ETS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Behnam, Payman and Alizadeh, Bijan and Fujita, Masahiro and Navabi, Zainalabedin}, year={2014} }
LibreCat
| DOI
2013 | Conference Paper | LibreCat-ID: 12979
@inproceedings{Hellebrand_2013, place={Cordoba, Argentina}, title={Analyzing and Quantifying Fault Tolerance Properties}, DOI={10.1109/latw.2013.6562662}, booktitle={14th IEEE Latin American Test Workshop - (LATW’13)}, publisher={IEEE}, author={Hellebrand, Sybille}, year={2013} }
LibreCat
| DOI
2013 | Misc | LibreCat-ID: 13075
@book{Cook_Rodriguez Gomez_Hellebrand_Indlekofer_Wunderlich_2013, place={14th Latin American Test Workshop, Cordoba, Argentina}, title={Adaptive Test and Diagnosis of Intermittent Faults}, author={Cook, Alejandro and Rodriguez Gomez, Laura and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2013} }
LibreCat
2013 | Conference Paper | LibreCat-ID: 46271
@inproceedings{Sadeghi-Kohan_Namaki-Shoushtari_Javaheri_Navabi_2013, title={BS 1149.1 extensions for an online interconnect fault detection and recovery}, DOI={10.1109/test.2012.6401583}, booktitle={2012 IEEE International Test Conference}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Namaki-Shoushtari, Majid and Javaheri, Fatemeh and Navabi, Zainalabedin}, year={2013} }
LibreCat
| DOI
2013 | Conference Paper | LibreCat-ID: 46270
@inproceedings{Sadeghi-Kohan_Keshavarz_Zokaee_Farahmandi_Navabi_2013, title={A new structure for interconnect offline testing}, DOI={10.1109/ewdts.2013.6673207}, booktitle={East-West Design & Test Symposium (EWDTS 2013)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Keshavarz, Shahrzad and Zokaee, Farzaneh and Farahmandi, Farimah and Navabi, Zainalabedin}, year={2013} }
LibreCat
| DOI
2012 | Conference Paper | LibreCat-ID: 12980
@inproceedings{Cook_Hellebrand_E. Imhof_Mumtaz_Wunderlich_2012, place={Quito, Ecuador}, title={Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test}, DOI={10.1109/latw.2012.6261229}, booktitle={13th IEEE Latin American Test Workshop (LATW’12)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and E. Imhof, Michael and Mumtaz, Abdullah and Wunderlich, Hans-Joachim}, year={2012}, pages={1–4} }
LibreCat
| DOI
2012 | Conference Paper | LibreCat-ID: 12981
@inproceedings{Cook_Hellebrand_Wunderlich_2012, place={Annecy, France}, title={Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test}, DOI={10.1109/ets.2012.6233025}, booktitle={17th IEEE European Test Symposium (ETS’12)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2012}, pages={1–6} }
LibreCat
| DOI
2012 | Misc | LibreCat-ID: 13074
@book{Cook_Hellebrand_Wunderlich_2012, place={24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany}, title={Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern}, author={Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2012} }
LibreCat
2011 | Conference Paper | LibreCat-ID: 12982
@inproceedings{Cook_Hellebrand_Indlekofer_Wunderlich_2011, place={New Delhi, India}, title={Diagnostic Test of Robust Circuits}, DOI={10.1109/ats.2011.55}, booktitle={20th IEEE Asian Test Symposium (ATS’11)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2011}, pages={285–290} }
LibreCat
| DOI
2011 | Conference Paper | LibreCat-ID: 12984
@inproceedings{Polian_Becker_Hellebrand_Wunderlich_Maxwell_2011, place={Trondheim, Norway}, title={Towards Variation-Aware Test Methods}, DOI={10.1109/ets.2011.51}, booktitle={16th IEEE European Test Symposium Trondheim (ETS’11)}, publisher={IEEE}, author={Polian, Ilia and Becker, Bernd and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Maxwell, Peter}, year={2011} }
LibreCat
| DOI
2011 | Conference Paper | LibreCat-ID: 13053
@inproceedings{Cook_Hellebrand_Indlekofer_Wunderlich_2011, place={Hamburg, Germany}, title={Robuster Selbsttest mit Diagnose}, booktitle={5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf”}, author={Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2011}, pages={48–53} }
LibreCat
2011 | Journal Article | LibreCat-ID: 13052
@article{Hopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2011, title={Variation-Aware Fault Modeling}, volume={54}, number={4}, journal={SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer}, author={Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2011}, pages={1813–1826} }
LibreCat
2011 | Conference Paper | LibreCat-ID: 46272
@inproceedings{Kamran_Nemati_Sadeghi-Kohan_Navabi_2011, title={Virtual tester development using HDL/PLI}, DOI={10.1109/ewdts.2010.5742156}, booktitle={2010 East-West Design & Test Symposium (EWDTS)}, publisher={IEEE}, author={Kamran, Arezoo and Nemati, Nastaran and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin}, year={2011} }
LibreCat
| DOI
2010 | Misc | LibreCat-ID: 10670
@book{Fröse_Ibers_Hellebrand_2010, place={22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany}, title={Testdatenkompression mit Hilfe der Netzwerkinfrastruktur}, author={Fröse, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}, year={2010} }
LibreCat
2010 | Conference Paper | LibreCat-ID: 12987
@inproceedings{Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Chicago, IL, USA}, title={Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}, DOI={10.1109/dsnw.2010.5542612}, booktitle={40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)}, publisher={IEEE}, author={Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010} }
LibreCat
| DOI
2010 | Conference Paper | LibreCat-ID: 13051
@inproceedings{Hunger_Hellebrand_2010, place={Wildbad Kreuth, Germany}, title={Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz}, booktitle={4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Hunger, Marc and Hellebrand, Sybille}, year={2010}, pages={81–88} }
LibreCat
2010 | Misc | LibreCat-ID: 13073
@book{Hellebrand_2010, place={Editorial, it 4/2010, pp. 179-180}, title={Nano-Electronic Systems}, author={Hellebrand, Sybille}, year={2010} }
LibreCat
2010 | Conference Paper | LibreCat-ID: 12983
@inproceedings{Hopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Shanghai, China}, title={Variation-Aware Fault Modeling}, DOI={10.1109/ats.2010.24}, booktitle={19th IEEE Asian Test Symposium (ATS’10)}, publisher={IEEE}, author={Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010}, pages={87–93} }
LibreCat
| DOI
2010 | Conference Paper | LibreCat-ID: 12985
@inproceedings{Indlekofer_Schnittger_Hellebrand_2010, place={Amsterdam, The Netherlands}, title={Efficient Test Response Compaction for Robust BIST Using Parity Sequences}, DOI={10.1109/iccd.2010.5647648}, booktitle={28th IEEE International Conference on Computer Design (ICCD’10)}, publisher={IEEE}, author={Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille}, year={2010}, pages={480–485} }
LibreCat
| DOI
2010 | Conference Paper | LibreCat-ID: 12986
@inproceedings{Hunger_Hellebrand_2010, place={Kyoto, Japan}, title={The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems}, DOI={10.1109/dft.2010.19}, booktitle={25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)}, publisher={IEEE}, author={Hunger, Marc and Hellebrand, Sybille}, year={2010}, pages={101–108} }
LibreCat
| DOI
2010 | Conference Paper | LibreCat-ID: 12988
@inproceedings{Froese_Ibers_Hellebrand_2010, place={Santa Cruz, CA, USA}, title={Reusing NoC-Infrastructure for Test Data Compression}, DOI={10.1109/vts.2010.5469570}, booktitle={28th IEEE VLSI Test Symposium (VTS’10)}, publisher={IEEE}, author={Froese, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}, year={2010}, pages={227–231} }
LibreCat
| DOI
2010 | Conference Paper | LibreCat-ID: 13049
@inproceedings{Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Chicago, IL, USA}, title={Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}, booktitle={4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}, author={Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010} }
LibreCat
2010 | Conference Paper | LibreCat-ID: 13050
@inproceedings{Indlekofer_Schnittger_Hellebrand_2010, place={Wildbad Kreuth, Germany}, title={Robuster Selbsttest mit extremer Kompaktierung}, booktitle={4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille}, year={2010}, pages={17–24} }
LibreCat
2009 | Conference Paper | LibreCat-ID: 12991
@inproceedings{Hunger_Hellebrand_Czutro_Polian_Becker_2009, place={Sesimbra-Lisbon, Portugal}, title={ATPG-Based Grading of Strong Fault-Secureness}, DOI={10.1109/iolts.2009.5196027}, booktitle={15th IEEE International On-Line Testing Symposium (IOLTS’09}, publisher={IEEE}, author={Hunger, Marc and Hellebrand, Sybille and Czutro, Alejandro and Polian, Ilia and Becker, Bernd}, year={2009} }
LibreCat
| DOI
2009 | Conference Paper | LibreCat-ID: 12990
@inproceedings{Hellebrand_Hunger_2009, place={Chicago, IL, USA}, title={Are Robust Circuits Really Robust?}, DOI={10.1109/dft.2009.28}, booktitle={24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk)}, publisher={IEEE}, author={Hellebrand, Sybille and Hunger, Marc}, year={2009}, pages={77} }
LibreCat
| DOI
2009 | Conference Paper | LibreCat-ID: 13030
@inproceedings{Hunger_Hellebrand_Czutro_Polian_Becker_2009, place={Stuttgart, Germany}, title={Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung}, booktitle={3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Hunger, Marc and Hellebrand, Sybille and Czutro, Alexander and Polian, Ilia and Becker, Bernd}, year={2009} }
LibreCat
2008 | Misc | LibreCat-ID: 13033
@book{Coym_Hellebrand_Ludwig_Straube_Wunderlich_G. Zoellin_2008, place={20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich}, title={Ein verfeinertes elektrisches Modell für Teilchentreffer und dessen Auswirkung auf die Bewertung der Schaltungsempfindlichkeit}, author={Coym, Torsten and Hellebrand, Sybille and Ludwig, Stefan and Straube, Bernd and Wunderlich, Hans-Joachim and G. Zoellin, Christian}, year={2008} }
LibreCat
2008 | Misc | LibreCat-ID: 13035
@book{Amgalan_Hachmann_Hellebrand_Wunderlich_2008, place={20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich}, title={Testen mit Rücksetzpunkten - ein Ansatz zur Verbesserung der Ausbeute bei robusten Schaltungen}, author={Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2008} }
LibreCat
2008 | Conference Paper | LibreCat-ID: 12992
@inproceedings{Oehler_Bosio_di Natale_Hellebrand_2008, place={Rhodos, Greece}, title={A Modular Memory BIST for Optimized Memory Repair}, DOI={10.1109/iolts.2008.30}, booktitle={14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)}, publisher={IEEE}, author={Oehler, Philipp and Bosio, Alberto and di Natale, Giorgio and Hellebrand, Sybille}, year={2008} }
LibreCat
| DOI
2008 | Conference Paper | LibreCat-ID: 12994
@inproceedings{Amgalan_Hachmann_Hellebrand_Wunderlich_2008, place={San Diego, CA, USA}, title={Signature Rollback - A Technique for Testing Robust Circuits}, DOI={10.1109/vts.2008.34}, booktitle={26th IEEE VLSI Test Symposium (VTS’08)}, publisher={IEEE}, author={Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2008}, pages={125–130} }
LibreCat
| DOI
2008 | Conference Paper | LibreCat-ID: 12993
@inproceedings{Hunger_Hellebrand_2008, place={Rhodos, Greece}, title={Verification and Analysis of Self-Checking Properties through ATPG}, DOI={10.1109/iolts.2008.32}, booktitle={14th IEEE International On-Line Testing Symposium (IOLTS’08)}, publisher={IEEE}, author={Hunger, Marc and Hellebrand, Sybille}, year={2008} }
LibreCat
| DOI
2008 | Conference Paper | LibreCat-ID: 13031
@inproceedings{Hunger_Hellebrand_2008, place={Ingolstadt, Germany}, title={Analyse selbstprüfender Schaltungen – Nachweis von Fehlersicherheit und Selbsttestbarkeit mit ATPG}, booktitle={2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Hunger, Marc and Hellebrand, Sybille}, year={2008} }
LibreCat
2008 | Conference Paper | LibreCat-ID: 13032
@inproceedings{Oehler_Bosio_Di Natale_Hellebrand_2008, place={Ingolstadt, Germany}, title={Modularer Selbsttest und optimierte Reparaturanalyse}, booktitle={2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Oehler, Philipp and Bosio, Alberto and Di Natale, Giorgio and Hellebrand, Sybille}, year={2008} }
LibreCat
2007 | Misc | LibreCat-ID: 13038
@book{Hellebrand_2007, place={5th IEEE East-West Design \& Test Symposium, Yerevan, Armenia (Invited Talk)}, title={Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing}, author={Hellebrand, Sybille}, year={2007} }
LibreCat
2007 | Misc | LibreCat-ID: 13039
@book{Ali_Welzl_Hessler_Hellebrand_2007, place={DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster)}, title={An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips}, author={Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille}, year={2007} }
LibreCat
2007 | Misc | LibreCat-ID: 13042
@book{Oehler_Hellebrand_Wunderlich_2007, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany}, title={An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007} }
LibreCat
2007 | Misc | LibreCat-ID: 13043
@book{Hellebrand_2007, place={ForschungsForum Paderborn, 10. Ausgabe, Paderborn, Germany}, title={Qualitätssicherung für Nanochips - Wie IT-Produkte zuverlässig werden}, author={Hellebrand, Sybille}, year={2007} }
LibreCat
2007 | Conference Paper | LibreCat-ID: 12995
@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place={Rome, Italy}, title={A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction}, DOI={10.1109/dft.2007.43}, booktitle={22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)}, publisher={IEEE}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007}, pages={50–58} }
LibreCat
| DOI
2007 | Conference Paper | LibreCat-ID: 12996
@inproceedings{Oehler_Hellebrand_Wunderlich_2007, place={Krakow, Poland}, title={Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair}, DOI={10.1109/ddecs.2007.4295278}, booktitle={10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007}, pages={185–190} }
LibreCat
| DOI
2007 | Conference Paper | LibreCat-ID: 12997
@inproceedings{Oehler_Hellebrand_Wunderlich_2007, place={Freiburg, Germany}, title={An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy}, DOI={10.1109/ets.2007.10}, booktitle={12th IEEE European Test Symposium (ETS’07)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007}, pages={91–96} }
LibreCat
| DOI
2007 | Conference Paper | LibreCat-ID: 13037
@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place={Bled, Slovenia}, title={Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}, booktitle={43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007} }
LibreCat
2007 | Journal Article | LibreCat-ID: 13036
@article{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, title={Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}, volume={37}, number={4 (124)}, journal={Informacije MIDEM, Ljubljana (Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007}, pages={212–219} }
LibreCat
2007 | Journal Article | LibreCat-ID: 13044
@article{Ali_Hessler_Welzl_Hellebrand_2007, title={An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip}, volume={1}, number={2}, journal={International Journal on High Performance Systems Architecture}, author={Ali, Muhammad and Hessler, Sven and Welzl, Michael and Hellebrand, Sybille}, year={2007}, pages={113–123} }
LibreCat
2007 | Conference Paper | LibreCat-ID: 13040
@inproceedings{Ali_Welzl_Hessler_Hellebrand_2007, place={Las Vegas, Nevada, USA}, title={A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip}, booktitle={4th International Conference on Information Technology: New Generations (ITNG’07)}, author={Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille}, year={2007}, pages={1027–1032} }
LibreCat
2007 | Conference Paper | LibreCat-ID: 13041
@inproceedings{Becker_Polian_Hellebrand_Straube_Wunderlich_2007, place={Munich, Germany}, title={Test und Zuverlässigkeit nanoelektronischer Systeme}, booktitle={1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim}, year={2007} }
LibreCat
2006 | Journal Article | LibreCat-ID: 13045
@article{Becker_Polian_Hellebrand_Straube_Wunderlich_2006, title={DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme}, volume={48}, number={5}, journal={it - Information Technology}, author={Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim}, year={2006}, pages={305–311} }
LibreCat
2005 | Misc | LibreCat-ID: 13046
@book{Oehler_Hellebrand_2005, place={Kleinheubachertagung 2005, Miltenberg, Germany}, title={A Low Power Design for Embedded DRAMs with Online Consistency Checking}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005} }
LibreCat
2005 | Misc | LibreCat-ID: 13101
@book{Ali_Welzl_Hellebrand_2005, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria}, title={Dynamic Routing: A Prerequisite for Reliable NoCs}, author={Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille}, year={2005} }
LibreCat
2005 | Misc | LibreCat-ID: 13102
@book{Oehler_Hellebrand_2005, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria}, title={Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005} }
LibreCat
2005 | Conference Paper | LibreCat-ID: 12999
@inproceedings{Ali_Welzl_Zwicknagl_Hellebrand_2005, place={Islamabad, Pakistan}, title={Considerations for Fault-Tolerant Networks on Chips}, DOI={10.1109/icm.2005.1590063}, booktitle={IEEE International Conference on Microelectronics (ICM’05)}, publisher={IEEE}, author={Ali, Muhammad and Welzl, Michael and Zwicknagl, Martin and Hellebrand, Sybille}, year={2005} }
LibreCat
| DOI
2005 | Conference Paper | LibreCat-ID: 13000
@inproceedings{Oehler_Hellebrand_2005, place={Tallinn, Estonia}, title={Low Power Embedded DRAMs with High Quality Error Correcting Capabilities}, DOI={10.1109/ets.2005.28}, booktitle={10th IEEE European Test Symposium (ETS’05)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005}, pages={148–153} }
LibreCat
| DOI
2005 | Conference Paper | LibreCat-ID: 12998
@inproceedings{Ali_Welzl_Hellebrand_2005, place={Oulu, Finland}, title={A Dynamic Routing Mechanism for Network on Chip}, DOI={10.1109/norchp.2005.1596991}, booktitle={23rd IEEE NORCHIP Conference}, publisher={IEEE}, author={Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille}, year={2005}, pages={70–73} }
LibreCat
| DOI
2004 | Conference Paper | LibreCat-ID: 13071
@inproceedings{Liu Jing_Ruehrup_Schindelhauer_Volbert_Dierkes_Bellgardt_Ibers_Hilleringmann_2004, place={Tilburg, Netherlands}, title={Sensor Networks with More Features Using Less Hardware}, booktitle={{GOR/NGB Conference Tilburg 2004}}, author={Liu Jing, Michelle and Ruehrup, Stefan and Schindelhauer, Christian and Volbert, Klaus and Dierkes, Martin and Bellgardt, Andreas and Ibers, Rüdiger and Hilleringmann, Ulrich}, year={2004} }
LibreCat
2004 | Misc | LibreCat-ID: 13099
@book{Breu_Fahringer_Fensel_Hellebrand_Middeldorp_Scherzer_2004, place={OCG Journal, pp. 28-29}, title={Im Westen viel Neues - Informatik an der Universität Innsbruck}, author={Breu, Ruth and Fahringer, Thomas and Fensel, Dieter and Hellebrand, Sybille and Middeldorp, Aart and Scherzer, Otmar}, year={2004} }
LibreCat
2004 | Misc | LibreCat-ID: 13100
@book{Hellebrand_Wuertenberger_S. Tautermann_2004, place={9th IEEE European Test Symposium, Ajaccio, Corsica, France}, title={Data Compression for Multiple Scan Chains Using Dictionaries with Corrections}, author={Hellebrand, Sybille and Wuertenberger, Armin and S. Tautermann, Christofer}, year={2004} }
LibreCat